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Dr. Swagat Nanda
Dr. Swagat Nanda
Parul Institute of Technology, Parul University, Vadodara, Gujarat, India
在 paruluniversity.ac.in 的电子邮件经过验证
标题
引用次数
引用次数
年份
Exploration and development of tri-gate quantum well barrier FinFET with strained nanosystem channel for enhanced performance
S Nanda, RS Dhar
Computers & Electrical Engineering 98, 107687, 2022
82022
Implementation and Characterization of 14 nm Trigate HOI n-FinFET using Strained Silicon channel with reduced area on chip
S Nanda, RS Dhar
2021 6th International Conference for Convergence in Technology (I2CT), 1-4, 2021
72021
Effects of dimensional variations on short channel parameters in 14 nm channel length TG–SOI FinFETs
P Saha, S Nanda, P Yugender, RS Dhar
Advances in Communication, Devices and Networking: Proceedings of ICCDN 2021 …, 2022
52022
Development and analysis of a three-fin trigate Q-FinFET for a 3 nm technology node with a strained-silicon channel system
S Nanda, RS Dhar, F Awwad, MI Hussein
Nanomaterials 13 (10), 1662, 2023
42023
Comparative performance analysis based short channel effects for TG Nano FinFETs
Z Renthlei, RS Dhar, S Nanda
Journal of Physics: Conference Series 1921 (1), 012014, 2021
42021
The optimization and analysis of a triple-fin heterostructure-on-insulator fin field-effect transistor with a stacked high-K configuration and 10 nm channel length
P Saha, R Sankar Dhar, S Nanda, K Kumar, M Alathbah
Nanomaterials 13 (23), 3008, 2023
32023
Impact of High-k Dielectric Materials on Short Channel Effects in Tri-gate SOI FinFETs
Z Renthlei, S Nanda, RS Dhar
Journal of Nano-and Electronic Physics 13 (5), 2021
32021
Modelling and Implementation of Double Gate n-channel FET with Strain Engineered Tri-Layered Channel System for Enriched Drain Current
K Kumar, R Sankar Dhar, S Nanda
Journal of Nano- and Electronic Physics 14 (2), 02028-1 - 02028-5, 2022
22022
Parametric analysis for varied gate work function in trigate n-channel FinFET
A Srivastava, S Nanda, SE Aimol, RS Dhar
2021 Devices for Integrated Circuit (DevIC), 359-362, 2021
22021
Low Power Nine-bit Sigma-Delta ADC Design using TSMC 0.18 micron Technology
SS Biswal, S Nanda, P Kabisatpathy
International Journal of Technology Exploration and Learning (IJTEL) 2 (5 …, 2013
22013
Evolution and performance analysis of quantum well FinFET for 3 nm technology node with type-II strained tri-layered hetero-channel system
S Nanda, RS Dhar
Physica Scripta 99 (4), 045932, 2024
12024
Performance parameter analysis and estimation of high-K induced three-fin SOI n-FinFET at 14 nm gate length
RS Dhar, SK Sinha, A Verma, T Chowdhury, HS Tomar, S Nanda, ...
International Journal of Nanoparticles 14 (2-4), 226-237, 2022
12022
Effect of High-k Dielectric Materials on Short Channel Effects of a 14 nm Tri-Gate SOI FinFET for Reduced Area on Chip
S Nanda, RS Dhar
Journal of Nano- and Electronic Physics 13 (03), 03015-1 - 03015-4, 2021
12021
Exploration and analysis of n-FinFET implementing stacked high-K at 08 nm gate length
S Nanda, S Kumari, RS Dhar
Sādhanā 49 (1), 11, 2023
2023
Design and Performance Analysis of 3-Fin 08 nm Physical Gate Length SOI FinFETs Employing Gate Stacked High-K Dielectrics
S Nanda, S Kumari, RS Dhar
2023 IEEE 3rd International Conference on Applied Electromagnetics, Signal …, 2023
2023
Exploration of effects of gate underlap in HOI FinFETs at 10 nm gate length
P Datta, S Nanda, RS Dhar
Physica Scripta 98 (7), 074003, 2023
2023
Development and Analysis of a Three-Fin Trigate Q-FinFET for a 3 nm Technology Node with a Strained-Silicon Channel System. Nanomaterials 2023, 13, 1662
S Nanda, RS Dhar, F Awwad, MI Hussein
2023
Improvement Analysis of Leakage Currents with Stacked High-k/Metal Gate in 10 nm Strained Channel HOI FinFET
P Kumari, S Nanda, P Saha, RS Dhar
Journal of Nano-and Electronic Physics 14 (2), 02004-1 - 02004-4, 2022
2022
Geometrical Optimization of 10 nm Channeled TG–HOI FinFET using tri-layered Strained Silicon Channel
S Nanda, RS Dhar
2021 International Conference on Intelligent Technologies (CONIT), 1-4, 2021
2021
Performance Estimation and Analysis of 3D Trigate HOI FinFET Using Strained Channel for Reduced Area
S Nanda, RS Dhar
Innovations in Electrical and Electronic Engineering: Proceedings of ICEEE …, 2021
2021
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