| Exploring the impact of parametric variability on eye diagram of on-chip multi-walled carbon nanotube interconnects using fast machine learning techniques K Dimple, S Guglani, R Kumar, S Roy, BK Kaushik, S Kushwaha, ... 2022 IEEE 72nd Electronic Components and Technology Conference (ECTC), 981-986, 2022 | 7 | 2022 |
| Modified knowledge-based neural networks using control variates for the fast uncertainty quantification of on-chip MWCNT interconnects K Dimple, S Guglani, A Dasgupta, R Sharma, S Roy, BK Kaushik IEEE Transactions on Electromagnetic Compatibility 65 (4), 1232-1246, 2023 | 5 | 2023 |
| A transfer learning approach to expedite training of artificial neural networks for variability-aware signal integrity analysis of MWCNT interconnects S Guglani, K Dimple, A Dasgupta, R Sharma, BK Kaushik, S Roy 2022 IEEE 31st Conference on Electrical Performance of Electronic Packaging …, 2022 | 5 | 2022 |
| A bilevel multi-fidelity polynomial chaos approach for the uncertainty quantification of MWCNT interconnect networks with variable imperfect contact resistances S Guglani, KM Dimple, S Roy, R Sharma, BK Kaushik IEEE Access 10, 109925-109936, 2022 | 4 | 2022 |
| Diffusion least mean square algorithm for identification of iir system present in each node of a wireless sensor networks K Dimple, DK Kotary, SJ Nanda Computational Intelligence in Data Mining: Proceedings of the International …, 2019 | 4 | 2019 |
| An incremental RLS for distributed parameter estimation of IIR systems present in computing nodes of a wireless sensor network K Dimple, DK Kotary, SJ Nanda Procedia computer science 115, 699-706, 2017 | 3 | 2017 |
| Artificial Neural Networks With Fast Transfer Learning for Statistical Signal Integrity Analysis of MWCNT and MLGNR Interconnect Networks S Guglani, AK Jakhar, K Dimple, A Sukhija, A Dasgupta, R Sharma, ... IEEE Transactions on Electromagnetic Compatibility, 2024 | 2 | 2024 |
| A multi-fidelity polynomial chaos approach for uncertainty quantification of MWCNT interconnect networks in the presence of imperfect contacts S Guglani, KM Dimple, BK Kaushik, S Roy, R Sharma 2021 IEEE 25th Workshop on Signal and Power Integrity (SPI), 1-4, 2021 | 2 | 2021 |
| Optimization of Eye Diagram Characteristics of MLGNR Interconnect Networks Using Fast ML Assisted Evolutionary Algorithm K Dimple, M Ehteshamuddin, S Guglani, A Dasgupta, S Roy, BK Kaushik 2023 IEEE Electrical Design of Advanced Packaging and Systems (EDAPS), 1-3, 2023 | | 2023 |
| A bilevel multi-fidelity polynomial chaos approach for the uncertainty quantification of MWCNT interconnect networks with variable imperfect contact resistances BK Kaushik, R Sharma, S Guglani, KM Dimple, S Roy | | 2022 |
Surila GuglaniIndian Institute of Technology Roorkee在 ec.iitr.ac.in 的电子邮件经过验证
