| Algorithms for the selection of applied tests when a stored test produces many applied tests H Addepalli, I Pomeranz Proceedings of the Great Lakes Symposium on VLSI 2022, 345-349, 2022 | 4 | 2022 |
| Using fault detection tests to produce diagnostic tests targeting large sets of candidate faults H Addepalli, I Pomeranz, E Amyeen, S Natarajan, A Sinha, ... 2022 IEEE 31st Asian Test Symposium (ATS), 120-125, 2022 | 1 | 2022 |
| Delay Monitoring Under Different PVT Corners for Test and Functional Operation H Addepalli, J Wu, N Mukherjee, I Pomeranz, J Rajski 2024 IEEE International Test Conference (ITC), 157-166, 2024 | | 2024 |
| Generating Storage-Aware Test Sets Targeting Several Fault Models H Addepalli, I Pomeranz, E Amyeen, S Natarajan, A Sinha, ... 2024 IEEE Computer Society Annual Symposium on VLSI (ISVLSI), 15-20, 2024 | | 2024 |
| Storage-Aware Test Sets for Defect Detection and Diagnosis HN Addepalli Purdue University Graduate School, 2024 | | 2024 |
| A New Cipher Process With Double Encryption AH Narayana, AVN Krishna Journal of Engineering & Management 2 (3), 1-7, 2018 | | 2018 |
| Infrared image processing for IoT module using NIR spectroscopy AH Narayana, RB Pachori Discipline of Electrical Engineering, IIT Indore, 2017 | | 2017 |
Irith PomeranzPurdue University在 ecn.purdue.edu 的电子邮件经过验证
