| Review of SI traceable force metrology for instrumented indentation and atomic force microscopy JR Pratt, JA Kramar, DB Newell, DT Smith Measurement science and technology 16 (11), 2129, 2005 | 155 | 2005 |
| Nanometre resolution metrology with the molecular measuring machine JA Kramar Measurement Science and Technology 16 (11), 2121, 2005 | 139 | 2005 |
| Progress toward Systeme International d'Unites traceable force metrology for nanomechanics JR Pratt, DT Smith, DB Newell, JA Kramar, E Whitenton Journal of materials research 19 (1), 366-379, 2004 | 105 | 2004 |
| Band bending and the apparent barrier height in scanning tunneling microscopy M Weimer, J Kramar, JD Baldeschwieler Physical Review B 39 (8), 5572, 1989 | 99 | 1989 |
| Spring constant calibration of atomic force microscopy cantilevers with a piezosensor transfer standard ED Langlois, GA Shaw, JA Kramar, JR Pratt, DC Hurley Review of Scientific Instruments 78 (9), 2007 | 93 | 2007 |
| Electronic limitations in phase meters for heterodyne interferometry NM Oldham, JA Kramar, PS Hetrick, EC Teague Precision engineering 15 (3), 173-179, 1993 | 92 | 1993 |
| The NIST microforce realization and measurement project DB Newell, JA Kramar, JR Pratt, DT Smith, ER Williams IEEE Transactions on instrumentation and measurement 52 (2), 508-511, 2003 | 88 | 2003 |
| Milligram mass metrology using an electrostatic force balance GA Shaw, J Stirling, JA Kramar, A Moses, P Abbott, R Steiner, A Koffman, ... Metrologia 53 (5), A86, 2016 | 80 | 2016 |
| Scanning probe microscope dimensional metrology at NIST JA Kramar, R Dixson, NG Orji Measurement science and technology 22 (2), 024001, 2010 | 77 | 2010 |
| Tunneling microscopy of 2H-MoS 2: A compound semiconductor surface M Weimer, J Kramar, C Bai, JD Baldeschwieler Physical Review B 37 (8), 4292, 1988 | 73 | 1988 |
| Dynamic light scattering distributions by any means N Farkas, JA Kramar Journal of Nanoparticle Research 23 (5), 120, 2021 | 60 | 2021 |
| Kinematic modeling and calibration of a flexure based hexapod nanopositioner H Shi, HJ Su, N Dagalakis, JA Kramar Precision Engineering 37 (1), 117-128, 2013 | 57 | 2013 |
| TSOM method for semiconductor metrology R Attota, RG Dixson, JA Kramar, JE Potzick, AE Vladár, B Bunday, ... Metrology, Inspection, and Process Control for Microlithography XXV 7971 …, 2011 | 47 | 2011 |
| Positioning stage EG Amatucci, NG Dagalakis, J Marcinkoski, FE Scire, JA Kramar US Patent 6,467,761, 2002 | 44 | 2002 |
| Atomic force microscope cantilever flexural stiffness calibration: Toward a standard traceable method RS Gates, MG Reitsma, JA Kramar, JR Pratt Journal of Research of the National Institute of Standards and Technology …, 2011 | 38 | 2011 |
| SI realization of small forces using an electrostatic force balance JR Pratt, JA Kramar Proc. XVIII IMEKO World Congress on Metrology for a Sustainable Development …, 2006 | 38 | 2006 |
| Comparison of electrostatic and photon pressure force references at the nanonewton level GA Shaw, J Stirling, J Kramar, P Williams, M Spidell, R Mirin Metrologia 56 (2), 025002, 2019 | 31 | 2019 |
| Active vibration isolation of a large stroke scanning probe microscope by using discrete sliding mode control JY Yen, KJ Lan, JA Kramar Sensors and Actuators A: Physical 121 (1), 243-250, 2005 | 31 | 2005 |
| SI-traceable spring constant calibration of microfabricated cantilevers for small force measurement GA Shaw, J Kramar, J Pratt Experimental mechanics 47 (1), 143-151, 2007 | 29 | 2007 |
| Toward nanometer accuracy measurements J Kramar, E Amatucci, DE Gilsinn, JSJ Jun, WB Penzes, F Scire, ... Metrology, Inspection, and Process Control for Microlithography XIII 3677 …, 1999 | 29 | 1999 |
