| Extreme environment electronics JD Cressler, HA Mantooth CRC Press, 2017 | 288 | 2017 |
| Comparison of combinational and sequential error rates for a deep submicron process NN Mahatme, S Jagannathan, TD Loveless, LW Massengill, BL Bhuva, ... IEEE Transactions on Nuclear Science 58 (6), 2719-2725, 2011 | 181 | 2011 |
| Neutron-and proton-induced single event upsets for D-and DICE-flip/flop designs at a 40 nm technology node TD Loveless, S Jagannathan, T Reece, J Chetia, BL Bhuva, MW McCurdy, ... IEEE Transactions on Nuclear Science 58 (3), 1008-1014, 2011 | 174 | 2011 |
| A hardened-by-design technique for RF digital phase-locked loops TD Loveless, LW Massengill, BL Bhuva, WT Holman, AF Witulski, ... IEEE transactions on nuclear science 53 (6), 3432-3438, 2006 | 142 | 2006 |
| A single-event-hardened phase-locked loop fabricated in 130 nm CMOS TD Loveless, LW Massengill, BL Bhuva, WT Holman, RA Reed, ... IEEE transactions on nuclear science 54 (6), 2012-2020, 2007 | 135 | 2007 |
| Modeling and mitigating single-event transients in voltage-controlled oscillators TD Loveless, LW Massengill, WT Holman, BL Bhuva IEEE Transactions on Nuclear Science 54 (6), 2561-2567, 2007 | 114 | 2007 |
| Single-event performance and layout optimization of flip-flops in a 28-nm bulk technology K Lilja, M Bounasser, SJ Wen, R Wong, J Holst, N Gaspard, ... IEEE Transactions on Nuclear Science 60 (4), 2782-2788, 2013 | 109 | 2013 |
| Technology scaling and soft error reliability LW Massengill, BL Bhuva, WT Holman, ML Alles, TD Loveless 2012 IEEE International Reliability Physics Symposium (IRPS), 3C. 1.1-3C. 1.7, 2012 | 105 | 2012 |
| Impact of technology scaling on the combinational logic soft error rate NN Mahatme, NJ Gaspard, T Assis, S Jagannathan, I Chatterjee, ... 2014 IEEE international reliability physics symposium, 5F. 2.1-5F. 2.6, 2014 | 70 | 2014 |
| A probabilistic analysis technique applied to a radiation-hardened-by-design voltage-controlled oscillator for mixed-signal phase-locked loops TD Loveless, LW Massengill, BL Bhuva, WT Holman, MC Casey, ... IEEE Transactions on Nuclear Science 55 (6), 3447-3455, 2008 | 66 | 2008 |
| Radio identity verification-based IoT security using RF-DNA fingerprints and SVM D Reising, J Cancelleri, TD Loveless, F Kandah, A Skjellum IEEE Internet of Things Journal 8 (10), 8356-8371, 2020 | 64 | 2020 |
| Frequency dependence of alpha-particle induced soft error rates of flip-flops in 40-nm CMOS technology S Jagannathan, TD Loveless, BL Bhuva, NJ Gaspard, N Mahatme, ... IEEE Transactions on Nuclear Science 59 (6), 2796-2802, 2012 | 63 | 2012 |
| Single-event tolerant flip-flop design in 40-nm bulk CMOS technology S Jagannathan, TD Loveless, BL Bhuva, SJ Wen, R Wong, M Sachdev, ... IEEE Transactions on Nuclear Science 58 (6), 3033-3037, 2011 | 63 | 2011 |
| On-chip measurement of single-event transients in a 45 nm silicon-on-insulator technology TD Loveless, JS Kauppila, S Jagannathan, DR Ball, JD Rowe, ... IEEE Transactions on Nuclear Science 59 (6), 2748-2755, 2012 | 58 | 2012 |
| Impact of supply voltage and frequency on the soft error rate of logic circuits NN Mahatme, NJ Gaspard, S Jagannathan, TD Loveless, BL Bhuva, ... IEEE Transactions on Nuclear Science 60 (6), 4200-4206, 2013 | 56 | 2013 |
| Technology scaling comparison of flip-flop heavy-ion single-event upset cross sections NJ Gaspard, S Jagannathan, ZJ Diggins, MP King, SJ Wen, R Wong, ... IEEE Transactions on Nuclear Science 60 (6), 4368-4373, 2013 | 54 | 2013 |
| A generalized linear model for single event transient propagation in phase-locked loops TD Loveless, LW Massengill, WT Holman, BL Bhuva, D McMorrow, ... IEEE Transactions on Nuclear Science 57 (5), 2933-2947, 2010 | 54 | 2010 |
| Radiation hardness of FDSOI and FinFET technologies ML Alles, RD Schrimpf, RA Reed, LW Massengill, RA Weller, ... IEEE 2011 International SOI Conference, 1-2, 2011 | 53 | 2011 |
| Impact of well structure on single-event well potential modulation in bulk CMOS NJ Gaspard, AF Witulski, NM Atkinson, JR Ahlbin, WT Holman, BL Bhuva, ... IEEE Transactions on Nuclear Science 58 (6), 2614-2620, 2011 | 42 | 2011 |
| Estimation of hardened flip-flop neutron soft error rates using SRAM multiple-cell upset data in bulk CMOS N Gaspard, S Jagannathan, Z Diggins, M McCurdy, TD Loveless, ... 2013 IEEE International Reliability Physics Symposium (IRPS), SE. 6.1-SE. 6.5, 2013 | 40 | 2013 |
