| Degradation assessment and precursor identification for SiC MOSFETs under high temp cycling E Ugur, F Yang, S Pu, S Zhao, B Akin IEEE Transactions on Industry Applications 55 (3), 2858-2867, 2019 | 120 | 2019 |
| Electrical performance advancement in SiC power module package design with kelvin drain connection and low parasitic inductance F Yang, Z Wang, Z Liang, F Wang IEEE Journal of Emerging and Selected Topics in Power Electronics 7 (1), 84-98, 2018 | 95 | 2018 |
| Evaluation of Aging's Effect on Temperature-Sensitive Electrical Parameters in SiC mosfets F Yang, E Ugur, B Akin IEEE Transactions on Power Electronics 35 (6), 6315-6331, 2019 | 84 | 2019 |
| A new complete condition monitoring method for SiC power MOSFETs E Ugur, C Xu, F Yang, S Pu, B Akin IEEE Transactions on Industrial Electronics 68 (2), 1654-1664, 2020 | 76 | 2020 |
| Design of a low parasitic inductance SiC power module with double-sided cooling F Yang, Z Liang, ZJ Wang, F Wang 2017 IEEE Applied Power Electronics Conference and Exposition (APEC), 3057-3062, 2017 | 67 | 2017 |
| Turn-on Delay Based Real-Time Junction Temperature Measurement for SiC MOSFETs With Aging Compensation F Yang, S Pu, C Xu, B Akin IEEE Transactions on Power Electronics 36 (2), 1280-1294, 2020 | 66 | 2020 |
| In situ Degradation Monitoring of SiC MOSFET Based on Switching Transient Measurement S Pu, E Ugur, F Yang, B Akin IEEE Transactions on Industrial Electronics 67 (6), 5092-5100, 2019 | 63 | 2019 |
| Aging mechanisms and accelerated lifetime tests for SiC MOSFETs: An overview S Pu, F Yang, BT Vankayalapati, B Akin IEEE Journal of Emerging and Selected Topics in Power Electronics 10 (1 …, 2021 | 61 | 2021 |
| A composite failure precursor for condition monitoring and remaining useful life prediction of discrete power devices S Zhao, S Chen, F Yang, E Ugur, B Akin, H Wang IEEE Transactions on Industrial Informatics 17 (1), 688-698, 2020 | 56 | 2020 |
| Experimental Evaluation and Analysis of Switching Transient's Effect on Dynamic on-Resistance in GaN HEMTs F Yang, C Xu, B Akin IEEE Transactions on Power Electronics 34 (10), 10121-10135, 2019 | 55 | 2019 |
| Design methodology of DC power cycling test setup for SiC MOSFETs F Yang, E Ugur, B Akin IEEE Journal of Emerging and Selected Topics in Power Electronics 8 (4 …, 2019 | 52 | 2019 |
| Using d–q Transformation to Vary the Switching Frequency for Interior Permanent Magnet Synchronous Motor Drive Systems F Yang, AR Taylor, H Bai, B Cheng, AA Khan IEEE Transactions on Transportation Electrification 1 (3), 277-286, 2015 | 52 | 2015 |
| A practical on-board SiC MOSFET condition monitoring technique for aging detection S Pu, F Yang, BT Vankayalapati, E Ugur, C Xu, B Akin IEEE Transactions on Industry Applications 56 (3), 2828-2839, 2020 | 47 | 2020 |
| Temperature-independent gate-oxide degradation monitoring of SiC MOSFETs based on junction capacitances M Farhadi, F Yang, S Pu, BT Vankayalapati, B Akin IEEE Transactions on Power Electronics 36 (7), 8308-8324, 2021 | 45 | 2021 |
| Health state estimation and remaining useful life prediction of power devices subject to noisy and aperiodic condition monitoring S Zhao, Y Peng, F Yang, E Ugur, B Akin, H Wang IEEE Transactions on Instrumentation and Measurement 70, 1-16, 2021 | 36 | 2021 |
| Design of a fast dynamic on-resistance measurement circuit for GaN power HEMTs F Yang, C Xu, E Ugur, S Pu, B Akin 2018 IEEE Transportation Electrification Conference and Expo (ITEC), 359-365, 2018 | 36 | 2018 |
| Performance degradation of GaN HEMTs under accelerated power cycling tests C Xu, F Yang, E Ugur, S Pu, B Akin CPSS Transactions on power electronics and applications 3 (4), 269-277, 2018 | 35 | 2018 |
| Characterization of threshold voltage instability under off-state drain stress and its impact on p-GaN HEMT performance F Yang, C Xu, B Akin IEEE Journal of Emerging and Selected Topics in Power Electronics 9 (4 …, 2020 | 34 | 2020 |
| Design of a high-efficiency minimum-torque-ripple 12-V/1-kW three-phase BLDC motor drive system for diesel engine emission reductions F Yang, C Jiang, A Taylor, H Bai, A Kotrba, A Yetkin, A Gundogan IEEE transactions on vehicular technology 63 (7), 3107-3115, 2014 | 33 | 2014 |
| SiC MOSFET aging detection based on Miller plateau voltage sensing S Pu, F Yang, E Ugur, C Xu, B Akin 2019 IEEE Transportation Electrification Conference and Expo (ITEC), 1-6, 2019 | 32 | 2019 |
Bilal AkinProfessor, University of Texas at Dallas在 utdallas.edu 的电子邮件经过验证
