| Code generation using machine learning: A systematic review E Dehaerne, B Dey, S Halder, S De Gendt, W Meert Ieee Access 10, 82434-82455, 2022 | 50 | 2022 |
| EELWORM: A bioinspired multimodal amphibious soft robot E Milana, B Van Raemdonck, K Cornelis, E Dehaerne, J De Clerck, ... 2020 3rd IEEE International Conference on Soft Robotics (RoboSoft), 766-771, 2020 | 21 | 2020 |
| Optimizing YOLOv7 for semiconductor defect detection E Dehaerne, B Dey, S Halder, S De Gendt Metrology, Inspection, and Process Control XXXVII 12496, 635-642, 2023 | 15 | 2023 |
| Towards improving challenging stochastic defect detection in SEM images based on improved YOLOv5 B Dey, E Dehaerne, S Halder Photomask Technology 2022 12293, 28-37, 2022 | 10 | 2022 |
| A comparative study of deep-learning object detectors for semiconductor defect detection E Dehaerne, B Dey, S Halder 2022 29th IEEE International Conference on Electronics, Circuits and Systems …, 2022 | 7 | 2022 |
| Yolov8 for defect inspection of hexagonal directed self-assembly patterns: a data-centric approach E Dehaerne, B Dey, H Esfandiar, L Verstraete, HS Suh, S Halder, ... 38th European Mask and Lithography Conference (EMLC 2023) 12802, 286-299, 2023 | 6 | 2023 |
| A deep learning framework for verilog autocompletion towards design and verification automation E Dehaerne, B Dey, S Halder, S De Gendt arXiv preprint arXiv:2304.13840, 2023 | 6 | 2023 |
| Automated semiconductor defect inspection in scanning electron microscope images: A systematic review T Lechien, E Dehaerne, B Dey, V Blanco, S Halder, S De Gendt, W Meert arXiv preprint arXiv:2308.08376, 2023 | 5 | 2023 |
| SEMI-PointRend: improved semiconductor wafer defect classification and segmentation as rendering MJ Hwang, B Dey, E Dehaerne, S Halder, Y Shin Metrology, Inspection, and Process Control XXXVII 12496, 25-31, 2023 | 4 | 2023 |
| Deep Learning based SEM image Denoising Approaches for Improving Metrology and Inspection of Thin Resists B Dey Authorea Preprints, 2023 | 2 | 2023 |
| SEMI-CenterNet: a machine learning facilitated approach for semiconductor defect inspection V De Ridder, B Dey, E Dehaerne, S Halder, S De Gendt, ... 38th European Mask and Lithography Conference (EMLC 2023) 12802, 220-228, 2023 | 1 | 2023 |
| Ensemble deep learning-based defect classification and detection in sem images E Dehaerne, B Dey, S Halder Jan, 2022 | 1 | 2022 |
| A machine learning approach towards SKILL code autocompletion E Dehaerne, B Dey, W Meert, V De Ridder DTCO and Computational Patterning III 12954, 194-215, 2024 | | 2024 |
| Automated defect classification and detection B Dey, E Dehaerne, S Halder US Patent App. 18/304,508, 2023 | | 2023 |
| Benchmarking Feature Extractors for Reinforcement Learning-Based Semiconductor Defect Localization E Dehaerne, B Dey, S Halder, S De Gendt 2023 International Symposium ELMAR, 49-53, 2023 | | 2023 |
