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In-Gyu Baek
In-Gyu Baek
在 samsung.com 的电子邮件经过验证
标题
引用次数
引用次数
年份
Highly scalable nonvolatile resistive memory using simple binary oxide driven by asymmetric unipolar voltage pulses
IG Baek, MS Lee, S Seo, MJ Lee, DH Seo, DS Suh, JC Park, SO Park, ...
IEDM Technical Digest. IEEE International Electron Devices Meeting, 2004 …, 2004
7752004
Electrical observations of filamentary conductions for the resistive memory switching in NiO films
DC Kim, S Seo, SE Ahn, DS Suh, MJ Lee, BH Park, IK Yoo, IG Baek, ...
Applied physics letters 88 (20), 2006
6812006
A novel cell technology using N-doped GeSbTe films for phase change RAM
H Horii, JH Yi, JH Park, YH Ha, IG Baek, SO Park, YN Hwang, SH Lee, ...
2003 Symposium on VLSI Technology. Digest of Technical Papers (IEEE Cat. No …, 2003
4422003
Multi-layer cross-point binary oxide resistive memory (OxRRAM) for post-NAND storage application
IG Baek, DC Kim, MJ Lee, HJ Kim, EK Yim, MS Lee, JE Lee, SE Ahn, ...
IEEE InternationalElectron Devices Meeting, 2005. IEDM Technical Digest …, 2005
3332005
Magnetic random access memory devices having titanium-rich lower electrodes with oxide layer and oriented tunneling barrier
JS Bae, J Lee, HJ Kim, IG Baek, Y Ha
US Patent 7,352,021, 2008
3222008
2-stack 1D-1R cross-point structure with oxide diodes as switch elements for high density resistance RAM applications
MJ Lee, Y Park, BS Kang, SE Ahn, C Lee, K Kim, W Xianyu, G Stefanovich, ...
2007 IEEE International Electron Devices Meeting, 771-774, 2007
2782007
A low‐temperature‐grown oxide diode as a new switch element for high‐density, nonvolatile memories
MJ Lee, S Seo, DC Kim, SE Ahn, DH Seo, IK Yoo, IG Baek, DS Kim, ...
Advanced Materials 19 (1), 73-76, 2007
2762007
Improvement of resistive memory switching in NiO using IrO2
DC Kim, MJ Lee, SE Ahn, S Seo, JC Park, IK Yoo, IG Baek, HJ Kim, ...
Applied physics letters 88 (23), 2006
2472006
Write current reduction in transition metal oxide based resistance-change memory
SE Ahn, MJ Lee, Y Park, BS Kang, CB Lee, KH Kim, S Seo, DS Suh, ...
Advanced materials 20 (5), 924-928, 2008
1942008
Realization of vertical resistive memory (VRRAM) using cost effective 3D process
IG Baek, CJ Park, H Ju, DJ Seong, HS Ahn, JH Kim, MK Yang, SH Song, ...
2011 International Electron Devices Meeting, 31.8. 1-31.8. 4, 2011
1872011
Semiconductor devices and methods of driving the same
JH Oh, KC Ryoo, B Park, K Oh, IG Baek
US Patent 8,472,237, 2013
1702013
Semiconductor memory devices
H Yu, HS Hwang, K Oh, IG Baek, K Jin-Hyoung
US Patent 8,619,490, 2013
1582013
High-current-density CuOx/InZnOx thin-film diodes for cross-point memory applications
BS Kang, SE Ahn, MJ Lee, G Stefanovich, KH Kim, WX Xianyu, CB Lee, ...
Adv. Mater 20 (16), 3066-3069, 2008
1472008
Non-volatile memory cells employing a transition metal oxide layer as a data storage material layer and methods of manufacturing the same
IG Baek, MS Lee
US Patent 7,420,198, 2008
1302008
23.6 Highly Scalable Non-volatile Resistive Memory Using Simple Binary Oxide Driven by Asymmetric Unipolar Voltage Pulses
IG Baek, MS Lee, S Seo, MJ Lee, DH Seo, DS Suh, JC Park, SO Park, ...
INTERNATIONAL ELECTRON DEVICES MEETING 1 (2004), 587-590, 2004
1292004
Stack friendly all-oxide 3D RRAM using GaInZnO peripheral TFT realized over glass substrates
MJ Lee, CB Lee, S Kim, H Yin, J Park, SE Ahn, BS Kang, KH Kim, ...
2008 IEEE International Electron Devices Meeting, 1-4, 2008
1232008
Semiconductor memory device having stacked structure including resistor-switched based logic circuit and method of manufacturing the same
IG Baek, HS Hwang, H Yu, CW Park
US Patent 8,553,445, 2013
1062013
Resistance-type random access memory device having three-dimensional bit line and word line patterning
HS Yoon, I Baek, H Sim, JS Zhao, M Park
US Patent 8,338,224, 2012
1062012
A non-linear ReRAM cell with sub-1μA ultralow operating current for high density vertical resistive memory (VRRAM)
SG Park, MK Yang, H Ju, DJ Seong, JM Lee, E Kim, S Jung, L Zhang, ...
2012 International Electron Devices Meeting, 20.8. 1-20.8. 4, 2012
1012012
Methods of forming magnetic random access memory devices having titanium-rich lower electrodes with oxide layer and oriented tunneling barrier
JS Bae, J Lee, HJ Kim, IG Baek, Y Ha
US Patent 7,351,594, 2008
1012008
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