| Conduction mechanisms at distinct resistive levels of Pt/TiO2-x/Pt memristors L Michalas, S Stathopoulos, A Khiat, T Prodromakis Applied Physics Letters 113 (14), 2018 | 36 | 2018 |
| A study of field emission process in electrostatically actuated MEMS switches L Michalas, A Garg, A Venkattraman, M Koutsoureli, A Alexeenko, ... Microelectronics Reliability 52 (9-10), 2267-2271, 2012 | 33 | 2012 |
| Electrical characteristics of interfacial barriers at metal—TiO2 contacts L Michalas, A Khiat, S Stathopoulos, T Prodromakis Journal of Physics D: Applied Physics 51 (42), 425101, 2018 | 27 | 2018 |
| An electrical characterisation methodology for benchmarking memristive device technologies S Stathopoulos, L Michalas, A Khiat, A Serb, T Prodromakis Scientific reports 9 (1), 19412, 2019 | 26 | 2019 |
| Investigation of silicon nitride charging M Koutsoureli, E Papandreou, L Michalas, G Papaioannou Microelectronic Engineering 90, 145-148, 2012 | 26 | 2012 |
| Probing contactless injection dielectric charging in RF MEMS capacitive switches L Michalas, M Koutsoureli, G Papaioannou Electronics letters 50 (10), 766-768, 2014 | 23 | 2014 |
| A study of deposition conditions on charging properties of PECVD silicon nitride films for MEMS capacitive switches M Koutsoureli, L Michalas, A Gantis, G Papaioannou Microelectronics Reliability 54 (9-10), 2159-2163, 2014 | 21 | 2014 |
| Charge collection mechanism in MEMS capacitive switches M Koutsoureli, L Michalas, G Papaioannou 2012 IEEE international reliability physics symposium (IRPS), ME. 2.1-ME. 2.5, 2012 | 18 | 2012 |
| The effect of temperature on dielectric charging of capacitive MEMS M Koutsoureli, L Michalas, G Papaioannou 2011 International Reliability Physics Symposium, 3D. 4.1-3D. 4.7, 2011 | 18 | 2011 |
| Effect of silicon thickness on the degradation mechanisms of sequential laterally solidified polycrystalline silicon TFTs during hot-carrier stress AT Voutsas, DN Kouvatsos, L Michalas, GJ Papaioannou IEEE electron device letters 26 (3), 181-184, 2005 | 18 | 2005 |
| Interface Asymmetry Induced by Symmetric Electrodes on Metal–Al:TiO–Metal Structures L Michalas, M Trapatseli, S Stathopoulos, S Cortese, A Khiat, ... IEEE Transactions on Nanotechnology 17 (5), 867-872, 2017 | 16 | 2017 |
| An in depth analysis of pull-up capacitance-voltage characteristic for dielectric charging assessment of MEMS capacitive switches M Koutsoureli, D Birmpiliotis, L Michalas, G Papaioannou Microelectronics Reliability 64, 688-692, 2016 | 16 | 2016 |
| Properties of contactless and contacted charging in MEMS capacitive switches M Koutsoureli, L Michalas, P Martins, E Papandreou, A Leuliet, ... Microelectronics Reliability 53 (9-11), 1655-1658, 2013 | 14 | 2013 |
| Temperature effects on the bulk discharge current of dielectric films of MEMS capacitive switches M Koutsoureli, L Michalas, G Papaioannou Microelectronics Reliability 52 (9-10), 2240-2244, 2012 | 14 | 2012 |
| Bidirectional volatile signatures of metal–oxide memristors—Part I: Characterization C Giotis, A Serb, S Stathopoulos, L Michalas, A Khiat, T Prodromakis IEEE Transactions on Electron Devices 67 (11), 5158-5165, 2020 | 11 | 2020 |
| Metal oxide-enabled reconfigurable memristive threshold logic gates G Papandroulidakis, A Khiat, A Serb, S Stathopoulos, L Michalas, ... 2018 IEEE International Symposium on Circuits and Systems (ISCAS), 1-5, 2018 | 11 | 2018 |
| Dielectric charging effects in floating electrode MEMS capacitive switches L Michalas, M Koutsoureli, E Papandreou, F Giacomozzi, G Papaioannou Microelectronics Reliability 55 (9-10), 1891-1895, 2015 | 11 | 2015 |
| Electrical assessment of diamond MIM capacitors and modeling of MEMS capacitive switch discharging L Michalas, M Koutsoureli, S Saada, C Mer–Calfati, A Leuliet, P Martins, ... Journal of Micromechanics and Microengineering 24 (11), 115017, 2014 | 11 | 2014 |
| Temperature dependence of the conduction mechanisms through a Pb (Zr, Ti) O3 thin film C Jégou, L Michalas, T Maroutian, G Agnus, M Koutsoureli, ... Thin Solid Films 563, 32-35, 2014 | 11 | 2014 |
| Electrical properties of nanostructured SiN films for MEMS capacitive switches M Koutsoureli, S Xavier, L Michalas, C Lioutas, S Bansropun, ... Journal of Micromechanics and Microengineering 27 (1), 014001, 2016 | 10 | 2016 |
