| Physical chemistry of the TiN/Hf0. 5Zr0. 5O2 interface W Hamouda, A Pancotti, C Lubin, L Tortech, C Richter, T Mikolajick, ... Journal of Applied Physics 127 (6), 2020 | 142 | 2020 |
| Interface chemistry of pristine TiN/La: Hf0. 5Zr0. 5O2 capacitors W Hamouda, C Lubin, S Ueda, Y Yamashita, O Renault, F Mehmood, ... Applied Physics Letters 116 (25), 2020 | 40 | 2020 |
| Oxygen vacancy concentration as a function of cycling and polarization state in TiN/Hf0. 5Zr0. 5O2/TiN ferroelectric capacitors studied by x-ray photoemission electron microscopy W Hamouda, F Mehmood, T Mikolajick, U Schroeder, TO Mentes, ... Applied Physics Letters 120 (20), 2022 | 25 | 2022 |
| The Electrode‐Ferroelectric Interface as the Primary Constraint on Endurance and Retention in HZO‐Based Ferroelectric Capacitors R Alcala, M Materano, PD Lomenzo, P Vishnumurthy, W Hamouda, ... Advanced Functional Materials 33 (43), 2303261, 2023 | 24 | 2023 |
| Electronic Synapses Enabled by an Epitaxial SrTiO3‐δ / Hf0.5Zr0.5O2 Ferroelectric Field‐Effect Memristor Integrated on Silicon N Siannas, C Zacharaki, P Tsipas, DJ Kim, W Hamouda, C Istrate, ... Advanced Functional Materials 34 (8), 2311767, 2024 | 7 | 2024 |
| Surface relaxation and rumpling of Sn-doped A Pancotti, TC Back, W Hamouda, M Lachheb, C Lubin, P Soukiassian, ... Physical Review B 102 (24), 245306, 2020 | 7 | 2020 |
| Laboratory-based hard X-ray photoelectron spectroscopy for fundamental and industrial research T Hashimoto, P Amann, A Regoutz, N Barrett, LF PIPER, W Hamouda, ... Vacuum and Surface Science 64 (11), 2021 | 3 | 2021 |
| Ferroelectric domain stability in la-doped Hf0. 5Zr0. 5O2 thin films N Alyabyeva, W Hamouda, C Lubin, F Mehmood, U Schroeder, N Barrett 12nd International Conference on LEEM/PEEM, 2022 | 1 | 2022 |
| Oxygen vacancy engineering in Si-doped, HfO2 ferroelectric capacitors using Ti oxygen scavenging layers N Barrett, W Hamouda, C Lubin, J Laguerre, C Carabasse, N Vaxelaire, ... Applied Physics Letters 125 (4), 2024 | | 2024 |
| Operando hard X-ray photoemission characterization of oxygen vacancies and correlation with the performance of ferroelectric, hafnia-based, non-volatile memories N Barrett, W Hamouda, C Lubin, F Mehmood, U Schroeder, T Mikolajick, ... APS March Meeting Abstracts 2023, K41. 002, 2023 | | 2023 |
| Characterization of the interface electronic structure of ultra-thin ferroelectric HfxZr1-xO2 films for low power, CMOS-compatible, non-volatile memories W Hamouda Université Paris-Saclay, 2022 | | 2022 |
