New multi-stage similarity measure for calculation of pairwise patent similarity in a patent citation network A Rodriguez, B Kim, M Turkoz, JM Lee, BY Coh, MK Jeong Scientometrics 103, 565-581, 2015 | 61 | 2015 |
Integrating machine learning, radio frequency identification, and consignment policy for reducing unreliability in smart supply chain management SK Sardar, B Sarkar, B Kim Processes 9 (2), 247, 2021 | 57 | 2021 |
Patent clustering and outlier ranking methodologies for attributed patent citation networks for technology opportunity discovery A Rodriguez, A Tosyali, B Kim, J Choi, JM Lee, BY Coh, MK Jeong IEEE Transactions on Engineering Management 63 (4), 426-437, 2016 | 50 | 2016 |
A regularized singular value decomposition-based approach for failure pattern classification on fail bit map in a DRAM wafer B Kim, YS Jeong, SH Tong, IK Chang, MK Jeongyoung IEEE Transactions on Semiconductor Manufacturing 28 (1), 41-49, 2015 | 41 | 2015 |
Inter-cluster connectivity analysis for technology opportunity discovery B Kim, G Gazzola, JM Lee, D Kim, K Kim, MK Jeong Scientometrics 98, 1811-1825, 2014 | 40 | 2014 |
Graph kernel based measure for evaluating the influence of patents in a patent citation network A Rodriguez, B Kim, JM Lee, BY Coh, MK Jeong Expert systems with applications 42 (3), 1479-1486, 2015 | 27 | 2015 |
Step-down spatial randomness test for detecting abnormalities in DRAM wafers with multiple spatial maps B Kim, YS Jeong, SH Tong, IK Chang, MK Jeong IEEE Transactions on Semiconductor Manufacturing 29 (1), 57-65, 2015 | 22 | 2015 |
A generalised uncertain decision tree for defect classification of multiple wafer maps B Kim, YS Jeong, SH Tong, MK Jeong International Journal of Production Research 58 (9), 2805-2821, 2020 | 21 | 2020 |
Two-phase edge outlier detection method for technology opportunity discovery B Kim, G Gazzola, J Yang, JM Lee, BY Coh, MK Jeong, YS Jeong Scientometrics 113, 1-16, 2017 | 17 | 2017 |
Methodology for assessing the contribution of knowledge services during the new product development process to business performance J Choi, B Kim, CH Han, H Hahn, H Park, J Yoo, MK Jeong Expert Systems with Applications 167, 113860, 2021 | 13 | 2021 |
A novel method for identifying competitors using a financial transaction network J Choi, A Tosyali, B Kim, H Lee, MK Jeong IEEE Transactions on Engineering Management 69 (4), 845-860, 2022 | 12 | 2022 |
Maintenance optimization for repairable deteriorating systems under imperfect preventive maintenance J Lee, B Kim, S Ahn Mathematics 7 (716), 1-17, 2019 | 12 | 2019 |
System informatics: from methodology to applications K Zhao, Y Xie, KL Tsui, Q Wei, W Huang, W Jiang, Y Li, S Cho, SB Kim, ... IEEE Intelligent Systems 30 (6), 12-29, 2015 | 12 | 2015 |
Data mining-based variable assessment methodology for evaluating the contribution of knowledge services of a public research institute to business performance of firms J Choi, B Kim, H Hahn, H Park, Y Jeong, J Yoo, MK Jeong Expert Systems with Applications 84, 37-48, 2017 | 10 | 2017 |
Regularizing activations in neural networks via distribution matching with the wasserstein metric T Joo, D Kang, B Kim arXiv preprint arXiv:2002.05366, 2020 | 8 | 2020 |
A Group Feature Ranking and Selection Method based on Dimension Reduction Technique in High-Dimensional Data IM Zubair, B Kim IEEE Access 10, 125136-125147, 2022 | 7 | 2022 |
New multivariate kernel density estimator for uncertain data classification B Kim, YS Jeong, MK Jeong Annals of Operations Research 303 (1), 413-431, 2021 | 6 | 2021 |
Modelling of technology lifetime based on patent citation data and segmentation SH Yoo, B Kim, MK Jeong Journal of the Operational Research Society 66 (3), 450-462, 2015 | 5 | 2015 |
A dynamic graph-based approach to ranking firms for identifying key players using inter-firm transactions A Tosyali, J Choi, B Kim, H Lee, MK Jeong Annals of Operations Research 303 (1), 5-27, 2021 | 3 | 2021 |
실물옵션 기반 기술가치 평가모델 정교화와 변동성 유효구간에 관한 연구 성태응, 이종택, 김병훈, 전승표, 박현우 기술혁신학회지 20 (3), 732-753, 2017 | 2 | 2017 |