Coin flipping PUF: A novel PUF with improved resistance against machine learning attacks Y Tanaka, S Bian, M Hiromoto, T Sato IEEE transactions on circuits and systems II: express briefs 65 (5), 602-606, 2018 | 40 | 2018 |
Autoprivacy: Automated layer-wise parameter selection for secure neural network inference Q Lou, S Bian, L Jiang Advances in Neural Information Processing Systems 33, 8638-8647, 2020 | 34 | 2020 |
ENSEI: Efficient secure inference via frequency-domain homomorphic convolution for privacy-preserving visual recognition S Bian, T Wang, M Hiromoto, Y Shi, T Sato Proceedings of the IEEE/CVF Conference on Computer Vision and Pattern …, 2020 | 34 | 2020 |
Virtual secure platform: A {Five-Stage} pipeline processor over {TFHE} K Matsuoka, R Banno, N Matsumoto, T Sato, S Bian 30th USENIX security symposium (USENIX Security 21), 4007-4024, 2021 | 32 | 2021 |
Nass: Optimizing secure inference via neural architecture search S Bian, W Jiang, Q Lu, Y Shi, T Sato ECAI 2020, 1746-1753, 2020 | 28 | 2020 |
LSTA: Learning-based static timing analysis for high-dimensional correlated on-chip variations S Bian, M Shintani, M Hiromoto, T Sato Proceedings of the 54th Annual Design Automation Conference 2017, 1-6, 2017 | 27 | 2017 |
HEDA: multi-attribute unbounded aggregation over homomorphically encrypted database X Ren, L Su, Z Gu, S Wang, F Li, Y Xie, S Bian, C Li, F Zhang Proceedings of the VLDB Endowment 16 (4), 601-614, 2022 | 23 | 2022 |
Clustering approach for solving traveling salesman problems via Ising model based solver A Dan, R Shimizu, T Nishikawa, S Bian, T Sato 2020 57th ACM/IEEE Design Automation Conference (DAC), 1-6, 2020 | 19 | 2020 |
Workload-aware worst path analysis of processor-scale NBTI degradation S Bian, M Shintani, S Morita, H Awano, M Hiromoto, T Sato Proceedings of the 26th edition on Great Lakes Symposium on VLSI, 203-208, 2016 | 16 | 2016 |
Filianore: Better multiplier architectures for LWE-based post-quantum key exchange S Bian, M Hiromoto, T Sato Proceedings of the 56th Annual Design Automation Conference 2019, 1-6, 2019 | 15 | 2019 |
AxRLWE: A multilevel approximate ring-LWE co-processor for lightweight IoT applications A Khalid, S Bian, C Wang, M O’Neill, W Liu IEEE Internet of Things Journal 9 (13), 10492-10501, 2021 | 14 | 2021 |
AxMM: Area and power efficient approximate modular multiplier for R-LWE cryptosystem DES Kundi, S Bian, A Khalid, C Wang, M O'Neill, W Liu 2020 IEEE International Symposium on Circuits and Systems (ISCAS), 1-5, 2020 | 14 | 2020 |
Nonlinear delay-table approach for full-chip NBTI degradation prediction S Bian, M Shintani, S Morita, M Hiromoto, T Sato 2016 17th International Symposium on Quality Electronic Design (ISQED), 307-312, 2016 | 14 | 2016 |
APAS: Application-specific accelerators for RLWE-based homomorphic linear transformations S Bian, DES Kundi, K Hirozawa, W Liu, T Sato IEEE Transactions on Information Forensics and Security 16, 4663-4678, 2021 | 13 | 2021 |
DWE: Decrypting learning with errors with errors S Bian, M Hiromoto, T Sato Proceedings of the 55th Annual Design Automation Conference, 1-6, 2018 | 11 | 2018 |
DArL: Dynamic parameter adjustment for LWE-based secure inference S Bian, M Hiromoto, T Sato 2019 Design, Automation & Test in Europe Conference & Exhibition (DATE …, 2019 | 10 | 2019 |
SCAM: Secured content addressable memory based on homomorphic encryption S Bian, M Hiromoto, T Sato Design, Automation & Test in Europe Conference & Exhibition (DATE), 2017 …, 2017 | 10 | 2017 |
A tuning-free hardware reservoir based on MOSFET crossbar array for practical echo state network implementation Y Kume, S Bian, T Sato 2020 25th Asia and South Pacific Design Automation Conference (ASP-DAC), 458-463, 2020 | 9 | 2020 |
He3db: An efficient and elastic encrypted database via arithmetic-and-logic fully homomorphic encryption S Bian, Z Zhang, H Pan, R Mao, Z Zhao, Y Jin, Z Guan Proceedings of the 2023 ACM SIGSAC Conference on Computer and Communications …, 2023 | 8 | 2023 |
Runtime NBTI mitigation for processor lifespan extension via selective node control S Bian, M Shintani, Z Wang, M Hiromoto, A Chattopadhyay, T Sato 2016 IEEE 25th Asian Test Symposium (ATS), 234-239, 2016 | 7 | 2016 |