| The degradation mechanism and stability enhancement of GaSe lateral memristors J Tang, R Zhan, E Chen, Q Zhu, W Li, D Li, Z Lu, X Wan, K Chen Applied Physics Letters 124 (12), 2024 | 1 | 2024 |
| Janus Electronic Devices with Ultrathin High-κ Gate Dielectric Directly Integrated on 1T′-MoTe2 E Chen, Q Zhu, Y Duan, J Tang, R Zhan, J Huang, X Wan, K Chen, ... ACS Applied Materials & Interfaces, 2024 | | 2024 |
