关注
Semiu A Olowogemo
Semiu A Olowogemo
Hardware Design Engineer at Intel Corporation
在 vanderbilt.edu 的电子邮件经过验证
标题
引用次数
引用次数
年份
Effects of voltage and temperature variations on the electrical masking capability of sub-65 nm combinational logic circuits
SA Olowogemo, WH Robinson, DB Limbrick
2018 IEEE International Symposium on Defect and Fault Tolerance in VLSI and …, 2018
52018
Model-Based Analysis of Single-Event Upset (SEU) Vulnerability of 6T SRAM Using FinFET Technologies
SA Olowogemo, H Qiu, BT Lin, WH Robinson, DB Limbrick
2022 IEEE International Symposium on Defect and Fault Tolerance in VLSI and …, 2022
32022
Electrical masking improvement with standard logic cell synthesis using 45 nm technology node
SA Olowogemo, A Yiwere, BT Lin, H Qiu, WH Robinson, DB Limbrick
2020 IEEE 63rd International Midwest Symposium on Circuits and Systems …, 2020
22020
Gem5Panalyzer: a light-weight tool for early-stage architectural reliability evaluation & prediction
H Qiu, X Qiu, SA Olowogemo, BT Lin, WH Robinson, DB Limbrick
2020 IEEE 63rd International Midwest Symposium on Circuits and Systems …, 2020
22020
Pulse broadening in combinational circuits with standard logic cell synthesis
SA Olowogemo, WH Robinson, A Yiwere, E Tachie-Menson, DB Limbrick, ...
2019 IEEE 62nd International Midwest Symposium on Circuits and Systems …, 2019
22019
Design-based variability in simulating single event transients
WH Robinson, DB Limbrick, BT Kiddie, AI Abdul-Rahman, BT Lin, ...
2016 16th European Conference on Radiation and Its Effects on Components and …, 2016
12016
Characterization, Analysis, and Mitigation of Process, Voltage, and Temperature (PVT) Variations on Electrical Masking and Radiation–Induced Transients
SA Olowogemo
Vanderbilt University, 2023
2023
Understanding time-varying vulnerability accross GPU Program Lifetime
H Qiu, SA Olowogemo, BT Lin, WH Robinson, DB Limbrick
2022 IEEE International Symposium on Defect and Fault Tolerance in VLSI and …, 2022
2022
Understanding GPU Application Vulnerability Across Program Lifetime
DLWR Hao Qiu, Semiu Olowogemo, Bor-Tyng Lin
2022 Silicon Errors in Logic – System Effects, 2022
2022
Evaluating Soft Error Mitigation Trade-offs During Early Design Stages
H Qiu, BT Lin, SA Olowogemo, WH Robinson, DB Limbrick
International Conference on Architecture of Computing Systems, 213-228, 2021
2021
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