Photodegradation of P3HT− a systematic study of environmental factors H Hintz, HJ Egelhaaf, L Lüer, J Hauch, H Peisert, T Chassé Chemistry of Materials 23 (2), 145-154, 2011 | 308 | 2011 |
Peak shape analysis of core level photoelectron spectra using UNIFIT for WINDOWS R Hesse, T Chassé, R Szargan Fresenius' journal of analytical chemistry 365, 48-54, 1999 | 211 | 1999 |
Auger parameters and relaxation energies of phosphorus in solid compounds R Franke, T Chassé, P Streubel, A Meisel Journal of electron spectroscopy and related phenomena 56 (4), 381-388, 1991 | 179 | 1991 |
Photo-oxidation and ozonization of poly (3-hexylthiophene) thin films as studied by UV/VIS and photoelectron spectroscopy H Hintz, HJ Egelhaaf, H Peisert, T Chassé Polymer Degradation and Stability 95 (5), 818-825, 2010 | 177 | 2010 |
Relaxation energies in XPS and XAES of solid sulfur compounds H Peisert, T Chassé, P Streubel, A Meisel, R Szargan Journal of electron spectroscopy and related phenomena 68, 321-328, 1994 | 171 | 1994 |
Straightforward generation of pillared, microporous graphene frameworks for use in supercapacitors K Yuan, Y Xu, J Uihlein, G Brunklaus, L Shi, R Heiderhoff, M Que, ... Advanced Materials 27 (42), 6714-6721, 2015 | 152 | 2015 |
Band alignment at organic-inorganic semiconductor interfaces: α-NPD and CuPc on InP (110) T Chasse, CI Wu, IG Hill, A Kahn Journal of applied physics 85 (9), 6589-6592, 1999 | 141 | 1999 |
Experimental and theoretical investigation of vibrational spectra of copper phthalocyanine: polarized single‐crystal Raman spectra, isotope effect and DFT calculations TV Basova, VG Kiselev, BE Schuster, H Peisert, T Chasse Journal of Raman Spectroscopy: An International Journal for Original Work in …, 2009 | 139 | 2009 |
Solution-processed two-dimensional ultrathin InSe nanosheets J Lauth, FES Gorris, M Samadi Khoshkhoo, T Chassé, W Friedrich, ... Chemistry of Materials 28 (6), 1728-1736, 2016 | 130 | 2016 |
Reversible and irreversible light-induced p-doping of P3HT by oxygen studied by photoelectron spectroscopy (XPS/UPS) H Hintz, H Peisert, HJ Egelhaaf, T Chassé The Journal of Physical Chemistry C 115 (27), 13373-13376, 2011 | 110 | 2011 |
Error estimation in peak‐shape analysis of XPS core‐level spectra using UNIFIT 2003: how significant are the results of peak fits? R Hesse, T Chassé, P Streubel, R Szargan Surface and Interface Analysis: An International Journal devoted to the …, 2004 | 110 | 2004 |
Heptacene: characterization in solution, in the solid state, and in films R Einholz, T Fang, R Berger, P Grüninger, A Fruh, T Chasse, RF Fink, ... Journal of the American Chemical Society 139 (12), 4435-4442, 2017 | 108 | 2017 |
X-ray induced damage of self-assembled alkanethiols on gold and indium phosphide D Zerulla, T Chasse Langmuir 15 (16), 5285-5294, 1999 | 108 | 1999 |
Electronic structure of FePc and interface properties on Ag (111) and Au (100) F Petraki, H Peisert, U Aygul, F Latteyer, J Uihlein, A Vollmer, T Chassé The Journal of Physical Chemistry C 116 (20), 11110-11116, 2012 | 95 | 2012 |
Electronic structure of Co-phthalocyanine on gold investigated by photoexcited electron spectroscopies: indication of Co ion− metal interaction F Petraki, H Peisert, I Biswas, T Chassé The Journal of Physical Chemistry C 114 (41), 17638-17643, 2010 | 91 | 2010 |
Influence of temperature on HSQ electron-beam lithography M Häffner, A Haug, A Heeren, M Fleischer, H Peisert, T Chassé, DP Kern Journal of Vacuum Science & Technology B: Microelectronics and Nanometer …, 2007 | 90 | 2007 |
Orientation and electronic properties of phthalocyanines on polycrystalline substrates H Peisert, I Biswas, M Knupfer, T Chassé physica status solidi (b) 246 (7), 1529-1545, 2009 | 89 | 2009 |
Recent developments in low-energy ion scattering spectroscopy (ISS) for surface structural analysis M Aono, M Katayama, E Nomura, T Chasse, D Choi, M Kato Nuclear Instruments and Methods in Physics Research Section B: Beam …, 1989 | 88 | 1989 |
A derivative of the Blatter radical as a potential metal-free magnet for stable thin films and interfaces F Ciccullo, NM Gallagher, O Geladari, T Chassé, A Rajca, MB Casu ACS Applied Materials & Interfaces 8 (3), 1805-1812, 2016 | 85 | 2016 |
Raman spectroscopy as a tool to study cubic Ti–C–N CVD coatings I Dreiling, A Haug, H Holzschuh, T Chassé Surface and Coatings Technology 204 (6-7), 1008-1012, 2009 | 81 | 2009 |