Algorithm and hardware implementation for visual perception system in autonomous vehicle: A survey W Shi, MB Alawieh, X Li, H Yu Integration 59, 148-156, 2017 | 187 | 2017 |
LithoGAN: End-to-end lithography modeling with generative adversarial networks W Ye, MB Alawieh, Y Lin, DZ Pan Proceedings of the 56th Annual Design Automation Conference 2019, 1-6, 2019 | 94 | 2019 |
High-definition routing congestion prediction for large-scale FPGAs MB Alawieh, W Li, Y Lin, L Singhal, MA Iyer, DZ Pan 2020 25th Asia and South Pacific Design Automation Conference (ASP-DAC), 26-31, 2020 | 65 | 2020 |
Wafer map defect patterns classification using deep selective learning MB Alawieh, D Boning, DZ Pan 2020 57th ACM/IEEE Design Automation Conference (DAC), 1-6, 2020 | 52 | 2020 |
Powernet: SOI lateral power device breakdown prediction with deep neural networks J Chen, MB Alawieh, Y Lin, M Zhang, J Zhang, Y Guo, DZ Pan IEEE Access 8, 25372-25382, 2020 | 47 | 2020 |
GAN-SRAF: Sub-resolution assist feature generation using conditional generative adversarial networks MB Alawieh, Y Lin, Z Zhang, M Li, Q Huang, DZ Pan Proceedings of the 56th Annual Design Automation Conference 2019, 1-6, 2019 | 37 | 2019 |
Using machine learning to optimize selection of elderly patients for endovascular thrombectomy A Alawieh, F Zaraket, MB Alawieh, AR Chatterjee, A Spiotta Journal of NeuroInterventional Surgery 11 (8), 847-851, 2019 | 36 | 2019 |
TEMPO: Fast Mask Topography Effect Modeling with Deep Learning W Ye, MB Alawieh, Y Watanabe, S Nojima, Y Lin, DZ Pan Proceedings of the 2020 International Symposium on Physical Design, 2020 | 30 | 2020 |
Machine Learning for Yield Learning and Optimization Y Lin, MB Alawieh, W Ye, DZ Pan International Test Conference, 2018 | 26 | 2018 |
Identifying Wafer-Level Systematic Failure Patterns via Unsupervised Learning MB Alawieh, F Wang, X Li IEEE Transactions on Computer Aided Design, 2017 | 26 | 2017 |
Litho-GPA: Gaussian process assurance for lithography hotspot detection W Ye, MB Alawieh, M Li, Y Lin, DZ Pan 2019 Design, Automation & Test in Europe Conference & Exhibition (DATE), 54-59, 2019 | 22 | 2019 |
Automatic selection of structure parameters of silicon on insulator lateral power device using Bayesian optimization J Chen, MB Alawieh, Y Lin, M Zhang, J Zhang, Y Guo, DZ Pan IEEE Electron Device Letters 41 (9), 1288-1291, 2020 | 20 | 2020 |
GAN-SRAF: subresolution assist feature generation using generative adversarial networks MB Alawieh, Y Lin, Z Zhang, M Li, Q Huang, DZ Pan IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2020 | 17 | 2020 |
DREAMPlaceFPGA: An open-source analytical placer for large scale heterogeneous FPGAs using deep-learning toolkit RS Rajarathnam, MB Alawieh, Z Jiang, M Iyer, DZ Pan 2022 27th Asia and South Pacific Design Automation Conference (ASP-DAC), 300-306, 2022 | 16 | 2022 |
Efficient Hierarchical Performance Modeling for Integrated Circuits via Bayesian Co-Learning MB Alawieh, F Wang, X Li Proceedings of the 54th Annual Design Automation Conference 2017, 9, 2017 | 16 | 2017 |
Efficient statistical validation of machine learning systems for autonomous driving W Shi, MB Alawieh, X Li, H Yu, N Arechiga, N Tomatsu 2016 IEEE/ACM International Conference on Computer-Aided Design (ICCAD), 1-8, 2016 | 16 | 2016 |
Lithography hotspot detection using a double inception module architecture J Chen, Y Lin, Y Guo, M Zhang, MB Alawieh, DZ Pan Journal of Micro/Nanolithography, MEMS, and MOEMS 18 (1), 013507-013507, 2019 | 15 | 2019 |
Efficient hierarchical performance modeling for analog and mixed-signal circuits via bayesian co-learning MB Alawieh, F Wang, X Li IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2018 | 14 | 2018 |
Generative Learning in VLSI Design for Manufacturability: Current Status and Future Directions MB Alawieh, Y Lin, W Ye, DZ Pan Journal of Microelectronic Manufacturing, 2019 | 12 | 2019 |
Efficient analog circuit optimization using sparse regression and error margining MB Alawieh, F Wang, R Kanj, X Li, R Joshi 2016 17th International Symposium on Quality Electronic Design (ISQED), 410-415, 2016 | 11 | 2016 |