| Understanding and variability of lateral charge migration in 3D CT-NAND flash with and without band-gap engineered barriers A Padovani, M Pesic, MA Kumar, P Blomme, A Subirats, ... 2019 IEEE International Reliability Physics Symposium (IRPS), 1-8, 2019 | 13 | 2019 |
| Reliability of Non-Volatile Memory Devices for Neuromorphic Applications: A Modeling Perspective A Padovani, M Pesic, F Nardi, V Milo, L Larcher, MA Kumar, MZ Baten 2022 IEEE International Reliability Physics Symposium (IRPS), 3C. 4-1-3C. 4-10, 2022 | 7 | 2022 |
| Analysis and Simulation of Interface Quality and Defect Induced Variability in MgO Spin-Transfer Torque Magnetic RAMs B Sikder, JH Lim, MA Kumar, A Padovani, M Haverty, U Kamal, ... IEEE Electron Device Letters 42 (1), 34-37, 2020 | 7 | 2020 |
| Total-Ionizing-Dose Effects on Threshold Voltage Distribution of 64-Layer 3D NAND Memories MA Kumar, M Raquibuzzaman, M Buddhanoy, M Wasiolek, K Hattar, ... 2022 IEEE Radiation Effects Data Workshop (REDW)(in conjunction with 2022 …, 2022 | 5 | 2022 |
| Pulse optimization and device engineering of 3D charge-trap flash for synaptic operation M Anik Kumar, A Padovani, L Larcher, SM Raiyan Chowdhury, ... Journal of Applied Physics 132 (11), 114501, 2022 | 2 | 2022 |
| Origin of post-irradiation Vth-shift variability in 3D-NAND memory array MA Kumar, M Raquibuzzaman, M Buddhanoy, T Boykin, B Ray IEEE Transactions on Nuclear Science, 2023 | 1 | 2023 |
| Towards Improving Ionizing Radiation Tolerance of 3-D NAND Flash Memory B Ray, M Buddhanoy, MA Kumar 2023 IEEE International Memory Workshop (IMW), 1-4, 2023 | 1 | 2023 |
| Cross-Temperature Reliability of 3D NAND: Cell-to-Cell Variability Analysis and Countermeasure MA Kumar, B Ray 2024 IEEE International Reliability Physics Symposium (IRPS), P25. MR-1-P25 …, 2024 | | 2024 |
| Total-Ionizing-Dose Effects on Commercial 3-D NAND Flash Memory Chips MA Kumar The University of Alabama in Huntsville, 2023 | | 2023 |
| Statistical Simulation to Predict Variability of TANOS Program/Erase Characteristics for Non-Volatile Memory Applications MZ Baten, MA Kumar, A Padovani, L Larcher, D Pramanik 2019 Electron Devices Technology and Manufacturing Conference (EDTM), 203-205, 2019 | | 2019 |
