Field-effect transistors based on wafer-scale, highly uniform few-layer p-type WSe 2 PM Campbell, A Tarasov, CA Joiner, MY Tsai, G Pavlidis, S Graham, ... Nanoscale 8 (4), 2268-2276, 2016 | 73 | 2016 |
Spontaneous current constriction in threshold switching devices JM Goodwill, G Ramer, D Li, BD Hoskins, G Pavlidis, JJ McClelland, ... Nature communications 10 (1), 1628, 2019 | 69 | 2019 |
High resolution thermal characterization and simulation of power AlGaN/GaN HEMTs using micro-Raman thermography and 800 picosecond transient thermoreflectance imaging K Maize, G Pavlidis, E Heller, L Yates, D Kendig, S Graham, A Shakouri 2014 IEEE Compound Semiconductor Integrated Circuit Symposium (CSICS), 1-8, 2014 | 61 | 2014 |
Thermal characterization of gallium nitride pin diodes J Dallas, G Pavlidis, B Chatterjee, JS Lundh, M Ji, J Kim, T Kao, ... Applied Physics Letters 112 (7), 2018 | 60 | 2018 |
Characterization of AlGaN/GaN HEMTs using gate resistance thermometry G Pavlidis, S Pavlidis, ER Heller, EA Moore, R Vetury, S Graham IEEE Transactions on Electron Devices 64 (1), 78-83, 2016 | 56 | 2016 |
Transient Thermal Characterization of AlGaN/GaN HEMTs Under Pulsed Biasing G Pavlidis, D Kendig, ER Heller, S Graham IEEE Transactions on Electron Devices 65 (5), 1753-1758, 2018 | 50 | 2018 |
Revealing the Distribution of Metal Carboxylates in Oil Paint from the Micro‐to Nanoscale X Ma, V Beltran, G Ramer, G Pavlidis, DY Parkinson, M Thoury, ... Angewandte Chemie 131 (34), 11778-11782, 2019 | 38 | 2019 |
The Effects of AlN and Copper Back Side Deposition on the Performance of Etched Back GaN/Si HEMTs G Pavlidis, SH Kim, I Abid, M Zegaoui, F Medjdoub, S Graham IEEE Electron Device Letters 40 (7), 1060-1063, 2019 | 32 | 2019 |
Thermal Performance of GaN/Si HEMTs Using Near-Bandgap Thermoreflectance Imaging G Pavlidis, L Yates, D Kendig, CF Lo, H Marchand, B Barabadi, S Graham IEEE Transactions on Electron Devices 67 (3), 822-827, 2020 | 29 | 2020 |
A comparative study on the junction temperature measurements of LEDs with raman spectroscopy, microinfrared (IR) imaging, and Forward voltage methods E Tamdogan, G Pavlidis, S Graham, M Arik IEEE Transactions on Components, Packaging and Manufacturing Technology 8 …, 2018 | 27 | 2018 |
Micro to nano: multiscale IR analyses reveal zinc soap heterogeneity in a 19th-century painting by Corot X Ma, G Pavlidis, E Dillon, V Beltran, JJ Schwartz, M Thoury, F Borondics, ... Analytical Chemistry 94 (7), 3103-3110, 2022 | 24 | 2022 |
Experimental confirmation of long hyperbolic polariton lifetimes in monoisotopic (10B) hexagonal boron nitride at room temperature G Pavlidis, JJ Schwartz, J Matson, T Folland, S Liu, JH Edgar, ... APL materials 9 (9), 2021 | 23 | 2021 |
High throughput nanoimaging of thermal conductivity and interfacial thermal conductance M Wang, G Ramer, DJ Perez-Morelo, G Pavlidis, JJ Schwartz, L Yu, R Ilic, ... Nano Letters 22 (11), 4325-4332, 2022 | 20 | 2022 |
Improving the Transient Thermal Characterization of GaN HEMTs G Pavlidis, D Kendig, L Yates, S Graham 2018 17th IEEE Intersociety Conference on Thermal and Thermomechanical …, 2018 | 18 | 2018 |
The thermal effects of substrate removal on GaN HEMTs using Raman thermometry G Pavlidis, D Mele, T Cheng, F Medjdoub, S Graham 2016 15th IEEE Intersociety Conference on Thermal and Thermomechanical …, 2016 | 17 | 2016 |
Scalable Modeling of Transient Self-Heating of GaN High-Electron-Mobility Transistors Based on Experimental Measurements A Cutivet, G Pavlidis, B Hassan, M Bouchilaoun, C Rodriguez, A Soltani, ... IEEE Transactions on Electron Devices 66 (5), 2139-2145, 2019 | 15 | 2019 |
Understanding Cantilever Transduction Efficiency and Spatial Resolution in Nanoscale Infrared Microscopy JJ Schwartz, G Pavlidis, A Centrone Analytical Chemistry 94 (38), 13126-13135, 2022 | 14 | 2022 |
Monitoring the Joule heating profile of GaN/SiC high electron mobility transistors via cross-sectional thermal imaging G Pavlidis, AM Hilton, JL Brown, ER Heller, S Graham Journal of Applied Physics 128 (7), 2020 | 13 | 2020 |
Thermal simulation of heterogeneous GaN/InP/silicon 3DIC stacks TR Harris, EJ Wyers, L Wang, S Graham, G Pavlidis, PD Franzon, ... 2015 International 3D Systems Integration Conference (3DIC), TS10. 2.1-TS10. 2.4, 2015 | 12 | 2015 |
Thermal raman and IR measurement of heterogeneous integration stacks TR Harris, G Pavlidis, EJ Wyers, DM Newberry, S Graham, P Franzon, ... 2016 15th IEEE Intersociety Conference on Thermal and Thermomechanical …, 2016 | 10 | 2016 |