| Secondary ion mass spectrometry: a practical handbook for depth profiling and bulk impurity analysis RG Wilson, FA Stevie, CW Magee (No Title), 1989 | 1176 | 1989 |
| Introduction to x-ray photoelectron spectroscopy FA Stevie, CL Donley Journal of Vacuum Science & Technology A 38 (6), 2020 | 476 | 2020 |
| Focused ion beam milling and micromanipulation lift-out for site specific cross-section TEM specimen preparation LA Giannuzzi, JL Drown, SR Brown, RB Irwin, FA Stevie MRS Online Proceedings Library 480 (1), 19-27, 1997 | 255 | 1997 |
| Secondary ion yield changes in Si and GaAs due to topography changes during O+2 or Cs+ ion bombardment FA Stevie, PM Kahora, DS Simons, P Chi Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films 6 (1 …, 1988 | 196 | 1988 |
| Effect of high temperature heat treatments on the quality factor of a large-grain<? format?> superconducting radio-frequency niobium cavity P Dhakal, G Ciovati, GR Myneni, KE Gray, N Groll, P Maheshwari, ... Physical Review Special Topics—Accelerators and Beams 16 (4), 042001, 2013 | 162 | 2013 |
| The correlation between ion beam/material interactions and practical FIB specimen preparation BI Prenitzer, CA Urbanik-Shannon, LA Giannuzzi, SR Brown, RB Irwin, ... Microscopy and Microanalysis 9 (3), 216-236, 2003 | 143 | 2003 |
| Application of focused ion beam lift‐out specimen preparation to TEM, SEM, STEM, AES and SIMS analysis FA Stevie, CB Vartuli, LA Giannuzzi, TL Shofner, SR Brown, B Rossie, ... Surface and Interface Analysis: An International Journal devoted to the …, 2001 | 139 | 2001 |
| Ion channeling effects on the focused ion beam milling of Cu BW Kempshall, SM Schwarz, BI Prenitzer, LA Giannuzzi, RB Irwin, ... Journal of Vacuum Science & Technology B: Microelectronics and Nanometer …, 2001 | 136 | 2001 |
| FIB lift-out specimen preparation techniques: ex-situ and in-situ methods LA Giannuzzi, BW Kempshall, SM Schwarz, JK Lomness, BI Prenitzer, ... Introduction to focused ion beams: instrumentation, theory, techniques and …, 2005 | 135 | 2005 |
| High field slope and the baking effect: Review of recent experimental results and new data <?format ?>on Nb heat treatments G Ciovati, G Myneni, F Stevie, P Maheshwari, D Griffis Physical Review Special Topics—Accelerators and Beams 13 (2), 022002, 2010 | 126 | 2010 |
| Bioremediation of chromium(VI) contaminated soil by Streptomyces sp. MC1 MA Polti, RO García, MJ Amoroso, CM Abate Journal of Basic Microbiology 49 (3), 285-292, 2009 | 121 | 2009 |
| Secondary ion mass spectrometry: applications for depth profiling and surface characterization F Stevie Momentum Press, 2015 | 116 | 2015 |
| Transmission electron microscope specimen preparation of Zn powders using the focused ion beam lift-out technique BI Prenitzer, LA Giannuzzi, K Newman, SR Brown, RB Irwin, FA Stevie, ... Metallurgical and Materials Transactions A 29, 2399-2406, 1998 | 107 | 1998 |
| Applications of focused ion beams in microelectronics production, design and development FA Stevie, TC Shane, PM Kahora, R Hull, D Bahnck, VC Kannan, E David Surface and interface analysis 23 (2), 61-68, 1995 | 102 | 1995 |
| Introduction to focused ion beams LA Gianuzzi, FA Stevie Instrumentation, Theory, Techniques and Practice: Springer, 2005 | 91 | 2005 |
| Chemically and geometrically enhanced focused ion beam micromachining PE Russell, TJ Stark, DP Griffis, JR Phillips, KF Jarausch Journal of Vacuum Science & Technology B: Microelectronics and Nanometer …, 1998 | 91 | 1998 |
| Comparative evaluation of protective coatings and focused ion beam chemical vapor deposition processes BW Kempshall, LA Giannuzzi, BI Prenitzer, FA Stevie, SX Da Journal of Vacuum Science & Technology B: Microelectronics and Nanometer …, 2002 | 88 | 2002 |
| H2O enhanced focused ion beam micromachining TJ Stark, GM Shedd, J Vitarelli, DP Griffis, PE Russell Journal of Vacuum Science & Technology B: Microelectronics and Nanometer …, 1995 | 85 | 1995 |
| Chemical and spatial differentiation of syringyl and guaiacyl lignins in poplar wood via time-of-flight secondary ion mass spectrometry C Zhou, Q Li, VL Chiang, LA Lucia, DP Griffis Analytical Chemistry 83 (18), 7020-7026, 2011 | 80 | 2011 |
| 13C isotopic labeling studies of growth mechanisms in the metalorganic vapor phase epitaxy of GaAs RM Lum, JK Klingert, DW Kisker, SM Abys, FA Stevie Journal of Crystal Growth 93 (1-4), 120-126, 1988 | 72 | 1988 |
