| Determination of core structure periodicity and point defect density along dislocations CT Koch Arizona State University, 2002 | 509 | 2002 |
| Band-gap measurements of direct and indirect semiconductors using monochromated electrons L Gu, V Srot, W Sigle, C Koch, P van Aken, F Scholz, SB Thapa, ... Physical Review B—Condensed Matter and Materials Physics 75 (19), 195214, 2007 | 151 | 2007 |
| FAIR data enabling new horizons for materials research M Scheffler, M Aeschlimann, M Albrecht, T Bereau, HJ Bungartz, C Felser, ... Nature 604 (7907), 635-642, 2022 | 126 | 2022 |
| A flux-preserving non-linear inline holography reconstruction algorithm for partially coherent electrons CT Koch Ultramicroscopy 108 (2), 141-150, 2008 | 117 | 2008 |
| Confined and chemically flexible grain boundaries in polycrystalline compound semiconductors D Abou‐Ras, SS Schmidt, R Caballero, T Unold, HW Schock, CT Koch, ... Advanced Energy Materials 2 (8), 992-998, 2012 | 110 | 2012 |
| Resonant wedge-plasmon modes in single-crystalline gold nanoplatelets L Gu, W Sigle, CT Koch, B Ögüt, PA Van Aken, N Talebi, R Vogelgesang, ... Physical Review B—Condensed Matter and Materials Physics 83 (19), 195433, 2011 | 108 | 2011 |
| Direct imaging of surface plasmon resonances on single triangular silver nanoprisms at optical wavelength using low-loss EFTEM imaging J Nelayah, L Gu, W Sigle, CT Koch, I Pastoriza-Santos, LM Liz-Marzán, ... Optics letters 34 (7), 1003-1005, 2009 | 102 | 2009 |
| An efficient, simple, and precise way to map strain with nanometer resolution in semiconductor devices CT Koch, VB Özdöl, PA van Aken Applied Physics Letters 96 (9), 2010 | 100 | 2010 |
| Intergranular glassy films: An overview A Subramaniam, CT Koch, RM Cannon, M Rühle Materials Science and Engineering: A 422 (1-2), 3-18, 2006 | 95 | 2006 |
| SESAM: exploring the frontiers of electron microscopy CT Koch, W Sigle, R Höschen, M Rühle, E Essers, G Benner, M Matijevic Microscopy and Microanalysis 12 (6), 506-514, 2006 | 94 | 2006 |
| Off-axis and inline electron holography: A quantitative comparison CT Koch, A Lubk Ultramicroscopy 110 (5), 460-471, 2010 | 80 | 2010 |
| Off-axis and inline electron holography: Experimental comparison T Latychevskaia, P Formanek, CT Koch, A Lubk Ultramicroscopy 110 (5), 472-482, 2010 | 76 | 2010 |
| Towards full-resolution inline electron holography CT Koch Micron 63, 69-75, 2014 | 75 | 2014 |
| Quantitative analysis of layering and in-plane structural ordering at an alumina–aluminum solid–liquid interface Y Kauffmann, SH Oh, CT Koch, A Hashibon, C Scheu, M Rühle, ... Acta materialia 59 (11), 4378-4386, 2011 | 75 | 2011 |
| Method for Retrieval of the Three-Dimensional Object Potential by Inversion<? format?> of Dynamical Electron Scattering W Van den Broek, CT Koch Physical review letters 109 (24), 245502, 2012 | 70 | 2012 |
| Grain-boundary types in chalcopyrite-type thin films and their correlations with film texture and electrical properties D Abou-Ras, CT Koch, V Küstner, PA Van Aken, U Jahn, MA Contreras, ... Thin Solid Films 517 (7), 2545-2549, 2009 | 67 | 2009 |
| Hybridized metal slit eigenmodes as an illustration of Babinet’s principle B Ogut, R Vogelgesang, W Sigle, N Talebi, CT Koch, PA van Aken Acs Nano 5 (8), 6701-6706, 2011 | 66 | 2011 |
| The structure of grain boundaries in strontium titanate: theory, simulation, and electron microscopy S von Alfthan, NA Benedek, L Chen, A Chua, D Cockayne, KJ Dudeck, ... Annual review of materials research 40 (1), 557-599, 2010 | 60 | 2010 |
| Aberration-compensated large-angle rocking-beam electron diffraction CT Koch Ultramicroscopy 111 (7), 828-840, 2011 | 59 | 2011 |
| Electron energy losses in Ag nanoholes—from localized surface plasmon resonances to rings of fire W Sigle, J Nelayah, CT Koch, PA van Aken Optics letters 34 (14), 2150-2152, 2009 | 58 | 2009 |
Peter A. van AkenProf. Dr.在 fkf.mpg.de 的电子邮件经过验证
