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Yafei Liu
Yafei Liu
在 stonybrook.edu 的电子邮件经过验证
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年份
X-ray topography characterization of gallium nitride substrates for power device development
B Raghothamachar, Y Liu, H Peng, T Ailihumaer, M Dudley, ...
Journal of Crystal Growth 544, 125709, 2020
282020
Synchrotron X-ray topography characterization of high quality ammonothermal-grown gallium nitride substrates
Y Liu, B Raghothamachar, H Peng, T Ailihumaer, M Dudley, R Collazo, ...
Journal of Crystal Growth 551, 125903, 2020
192020
The improvement of Mo/4H-SiC Schottky diodes via a P2O5 surface passivation treatment
AB Renz, VA Shah, OJ Vavasour, Y Bonyadi, F Li, T Dai, GWC Baker, ...
Journal of Applied Physics 127 (2), 2020
172020
Dislocation contrast on X-ray topographs under weak diffraction conditions
H Peng, T Ailihumaer, Y Liu, B Raghotharmachar, X Huang, L Assoufid, ...
Journal of Applied Crystallography 54 (4), 1225-1233, 2021
142021
Characterization of prismatic slip in PVT-grown AlN crystals
S Hu, H Fang, Y Liu, H Peng, Q Cheng, Z Chen, R Dalmau, J Britt, ...
Journal of Crystal Growth 584, 126548, 2022
82022
Static Performance and Reliability of 4H-SiC Diodes with P+ Regions Formed by Various Profiles and Temperatures
SA Mancini, SY Jang, Z Chen, D Kim, J Lynch, Y Liu, B Raghothamachar, ...
2022 IEEE International Reliability Physics Symposium (IRPS), P62-1-P62-6, 2022
82022
Synchrotron X-ray topography studies of dislocation behavior during early stages of PVT growth of 4H-SiC crystals
T Ailihumaer, H Peng, Y Liu, B Raghothamachar, M Dudley, G Chung, ...
Journal of Electronic Materials 50, 3258-3265, 2021
62021
Strain mapping of GaN substrates and epitaxial layers used for power electronic devices by synchrotron X-ray rocking curve topography
Y Liu, Z Chen, S Hu, H Peng, Q Cheng, B Raghothamachar, M Dudley
Journal of Crystal Growth 583, 126559, 2022
52022
Characterization of 4H-SiC lattice damage after novel high energy ion implantation
Z Chen, Y Liu, H Peng, T Ailihumaer, Q Cheng, S Hu, B Raghothamachar, ...
ECS Transactions 104 (7), 75, 2021
52021
Quantitative analysis of dislocations in 4H-SiC wafers using synchrotron X-ray topography with ultra-high angular resolution
H Peng, Z Chen, Y Liu, B Raghothamachar, X Huang, L Assoufid, ...
Journal of Applied Crystallography 55 (3), 544-550, 2022
42022
Microstructure analysis of GaN epitaxial layers during ion implantation using synchrotron X-ray topography
Y Liu, H Peng, Z Chen, T Ailihumaer, Q Cheng, S Hu, B Raghothamachar, ...
ECS Transactions 104 (7), 113, 2021
42021
Characterization and Reduction of Defects in 4H-SiC Substrate and Homo-Epitaxial Wafer
L Yang, LX Zhao, HW Wu, Y Liu, T Ailihumaer, B Raghothamachar, ...
Materials Science Forum 1004, 387-392, 2020
42020
Analysis of basal plane dislocation motion induced by P+ Ion implantation using synchrotron X-ray topography
ZY Chen, Y Liu, HY Peng, QY Cheng, SS Hu, B Raghothamachar, ...
Defect and Diffusion Forum 426, 71-78, 2023
32023
Analysis of dislocation contrast in synchrotron grazing-incidence x-ray topographs and ray-tracing simulation in off-axis 4h-sic crystals
T Ailihumaer, H Peng, Y Liu, Q Cheng, Z Chen, S Hu, B Raghothamachar, ...
ECS Transactions 104 (7), 157, 2021
32021
Characterization of Dislocations in 6H-SiC Wafer Through X-Ray Topography and Ray-Tracing Simulations
Q Cheng, T Ailihumaer, Y Liu, H Peng, Z Chen, B Raghothamachar, ...
Journal of Electronic Materials 50 (7), 4104-4117, 2021
32021
X-ray topography characterization of GaN substrates used for power electronic devices
Y Liu, H Peng, T Ailihumaer, B Raghothamachar, M Dudley
Journal of Electronic Materials 50, 2981-2989, 2021
32021
Investigation of Lattice Strain in High Energy Implanted 4H-SiC Wafers by Al or N Atoms
ZY Chen, HY Peng, Y Liu, QY Cheng, SS Hu, B Raghothamachar, ...
Materials Science Forum 1062, 361-365, 2022
22022
Ray-Tracing Simulation Analysis of Effective Penetration Depths on Grazing Incidence Synchrotron X-Ray Topographic Images of Basal Plane Dislocations in 4H-SiC Wafers
QY Cheng, HY Peng, SS Hu, ZY Chen, Y Liu, B Raghothamachar, ...
Materials Science Forum 1062, 366-370, 2022
22022
Effect of Annealing Conditions on Recovery of Lattice Damage in a High-Energy-Implanted 4H-SiC Superjunction PIN Diode
Z Chen, Y Liu, H Peng, Q Cheng, S Hu, B Raghothamachar, M Dudley, ...
ECS Journal of Solid State Science and Technology 11 (6), 065003, 2022
22022
Selective area etching and doping of GaN for high-power applications
B Li, S Wang, AS Chang, L Lauhon, Y Liu, B Raghothamachar, M Dudley, ...
ECS Transactions 104 (7), 103, 2021
22021
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