关注
Piotr Firek
Piotr Firek
在 elka.pw.edu.pl 的电子邮件经过验证
标题
引用次数
引用次数
年份
Application of a composite plasmonic substrate for the suppression of an electromagnetic mode leakage in InGaN laser diodes
P Perlin, K Holc, M Sarzyński, W Scheibenzuber, Ł Marona, R Czernecki, ...
Applied Physics Letters 95 (26), 2009
422009
Measuring thermal conductivity of thin films by Scanning Thermal Microscopy combined with thermal spreading resistance analysis
J Juszczyk, A Kaźmierczak-Bałata, P Firek, J Bodzenta
Ultramicroscopy 175, 81-86, 2017
302017
Quantitative thermal microscopy measurement with thermal probe driven by dc+ ac current
J Bodzenta, J Juszczyk, A Kaźmierczak-Bałata, P Firek, A Fleming, ...
International Journal of Thermophysics 37, 1-17, 2016
302016
Application of scanning microscopy to study correlation between thermal properties and morphology of BaTiO3 thin films
A Kaźmierczak-Bałata, J Bodzenta, M Krzywiecki, J Juszczyk, J Szmidt, ...
Thin Solid Films 545, 217-221, 2013
252013
Barium titanate thin films plasma etch rate as a function of the applied RF power and Ar/CF4 mixture gas mixing ratio
A Werbowy, P Firek, J Chojnowski, A Olszyna, J Szmidt, N Kwietniewski
physica status solidi c 4 (4), 1578-1580, 2007
172007
Stack of nano-films on optical fiber end face for label-free bio-recognition
R Różycki-Bakon, M Koba, P Firek, E Roźniecka, J Niedziółka-Jönsson, ...
Journal of Lightwave Technology 34 (23), 5357-5362, 2016
162016
ISFET structures with chemically modified membrane for bovine serum albumin detection
P Firek, M Cichomski, M Waskiewicz, I Piwoński, A Kisielewska
Circuit World 44 (1), 45-50, 2018
152018
Electric characterization and selective etching of aluminum oxide
P Firek, J Szmidt, K Nowakowska‐Langier, K Zdunek
Plasma Processes and Polymers 6 (S1), S840-S843, 2009
152009
Silver micropowders as SiC die attach material for high temperature applications
R Kisiel, Z Szczepański, P Firek, J Grochowski, M Myśliwiec, M Guziewicz
2012 35th International Spring Seminar on Electronics Technology, 144-148, 2012
122012
MISFET structures with barium titanate as a dielectric layer for application in memory cells
P Firek, J Szmidt
Microelectronics Reliability 51 (7), 1187-1191, 2011
122011
Properties of AlN thin films deposited by means of magnetron sputtering for ISFET applications
P Firek, M Wáskiewicz, B Stonio, J Szmidt
Materials Science-Poland 33 (4), 669-676, 2015
92015
Electronic properties of BaTiO3/4H-SiC interface
M Sochacki, P Firek, N Kwietniewski, J Szmidt, W Rzodkiewicz
Materials Science and Engineering: B 176 (4), 301-304, 2011
92011
MIS field effect transistor with barium titanate thin film as a gate insulator
P Firek, A Werbowy, J Szmidt
Materials Science and Engineering: B 165 (1-2), 126-128, 2009
92009
Comparison of the structural and corrosion properties of the graphene/SiN (200) coating system deposited on titanium alloy surfaces covered with SiN transition layers
M Kalisz, M Grobelny, M Świniarskib, P Firek
Surface and Coatings Technology 299, 65-70, 2016
72016
Reactive impulse plasma ablation deposited barium titanate thin films on silicon
A Werbowy, P Firek, N Kwietniewski, A Olszyna
Electron technology conference 2013 8902, 675-683, 2013
62013
Electric characterization and plasma etching of nanocrystalline c-BN layers
A Werbowy, P Firek, J Szmidt, M Gałązka, A Olszyna
Journal of Wide Bandgap Materials 9 (3), 2002
62002
Comparison of Al2O3 nano-overlays deposited with magnetron sputtering and atomic layer deposition on optical fibers for sensing purposes
M Śmietana, T Drążewski, P Firek, P Mikulic, WJ Bock
Micro/Nano Materials, Devices, and Systems 8923, 231-238, 2013
52013
Characterization of thin Gd2O3 magnetron sputtered layers
J Gryglewicz, P Firek, J Jaśiński, R Mroczyński, J Szmidt
Electron Technology Conference 2013 8902, 660-666, 2013
52013
Influence of substrate type on structure of C-Pd thin films
E Kowalska, E Czerwosz, M Kozłowski, P Firek, J Rymarczyk, ...
Elektronika: konstrukcje, technologie, zastosowania 52 (7), 61-64, 2011
52011
Hydrogen sensor based on field effect transistor with C–Pd layer
P Firek, S Krawczyk, H Wronka, E Czerwosz, J Szmidt
Metrology and Measurement Systems, 313-321-313-321, 2020
42020
系统目前无法执行此操作,请稍后再试。
文章 1–20