A low-power and area-efficient radiation-hard redundant flip-flop, DICE ACFF, in a 65 nm thin-BOX FD-SOI K Kobayashi, K Kubota, M Masuda, Y Manzawa, J Furuta, S Kanda, ... IEEE Transactions on Nuclear Science 61 (4), 1881-1888, 2014 | 86 | 2014 |
An area-efficient 65 nm radiation-hard dual-modular flip-flop to avoid multiple cell upsets R Yamamoto, C Hamanaka, J Furuta, K Kobayashi, H Onodera IEEE Transactions on Nuclear Science 58 (6), 3053-3059, 2011 | 82 | 2011 |
Localization of radioiodinated antibody to α-fetoprotein in hepatoma transplanted in rats and a case report of α-fetoprotein antibody treatment of a hepatoma patient T Koji, N Ishii, T Munehisa, Y Kusumoto, S Nakamura, A Tamenishi, ... Cancer Research 40 (8_Part_2), 3013-3015, 1980 | 76 | 1980 |
Method of and apparatus for producing video signal associated with photographic image T Ohta, M Inuiya, K Kobayashi, T Murakami US Patent 4,642,700, 1987 | 74 | 1987 |
Isomer Decay Spectroscopy of and : Midshell Collectivity Around Z Patel, PA Söderström, Z Podolyák, PH Regan, PM Walker, H Watanabe, ... Physical review letters 113 (26), 262502, 2014 | 64 | 2014 |
A 65nm Bistable Cross-coupled Dual Modular Redundancy Flip-Flop capable of protecting soft errors on the C-element J Furuta, C Hamanaka, K Kobayashi, H Onodera 2010 Symposium on VLSI Circuits, 123-124, 2010 | 60 | 2010 |
Variation-sensitive monitor circuits for estimation of global process parameter variation IAKM Mahfuzul, A Tsuchiya, K Kobayashi, H Onodera IEEE Transactions on Semiconductor Manufacturing 25 (4), 571-580, 2012 | 58 | 2012 |
Finite Temperature Effects in a One-Dimensional Mott-Hubbard Insulator: Angle-Resolved Photoemission Study of K Kobayashi, T Mizokawa, A Fujimori, M Isobe, Y Ueda, T Tohyama, ... Physical review letters 82 (4), 803, 1999 | 58 | 1999 |
Pulmonaru vascular pathology: human and experimental studies R Jones, LM Reid, WM Zapol, J TOMASHEFSKI JR, OC Kirton, ... Lung biology in health and disease 24, 23-160, 1985 | 54 | 1985 |
The impact of RTN on performance fluctuation in CMOS logic circuits K Ito, T Matsumoto, S Nishizawa, H Sunagawa, K Kobayashi, H Onodera 2011 International Reliability Physics Symposium, CR. 5.1-CR. 5.4, 2011 | 51 | 2011 |
Isolation of phytotoxic substances produced by cephalosposium gregatum allington & chamberlain K Kotayashi, T Ui Tetrahedron letters 16 (47), 4119-4122, 1975 | 47 | 1975 |
Final results of DESTINY-CRC01 investigating trastuzumab deruxtecan in patients with HER2-expressing metastatic colorectal cancer T Yoshino, M Di Bartolomeo, K Raghav, T Masuishi, F Loupakis, ... Nature communications 14 (1), 3332, 2023 | 46 | 2023 |
A New Interactive Analog Layout Methodology based on Rubber-Band Routing K Kobayashi, WW Dai University of California at Santa Cruz, 1996 | 43 | 1996 |
Structural changes in the thermochromic solid-state phase transition of poly (3-alkylthiophene K Tashiro, K Ono, Y Minagawa, K Kobayashi, T Kawai, K Yoshino Synthetic metals 41 (1-2), 571-574, 1991 | 43 | 1991 |
Impact of cell distance and well-contact density on neutron-induced multiple cell upsets J Furuta, K Kobayashi, H Onodera IEICE Transactions on Electronics 98 (4), 298-303, 2015 | 42 | 2015 |
A yield and speed enhancement scheme under within-die variations on 90nm LUT array K Katsuki, M Kotani, K Kobayashi, H Onodera Proceedings of the IEEE 2005 Custom Integrated Circuits Conference, 2005 …, 2005 | 42 | 2005 |
Trend of semiconductor packaging, high density and low cost Y Tsukada, K Kobayashi, H Nishimura Proceedings of the 4th International Symposium on Electronic Materials and …, 2002 | 40 | 2002 |
BANDO, Y. & NAKAMICHI, Y.(1974) T Sakurai, H Iwasaki, Y Watanabe, K Kobayashi Rikagaku Kenkyusho Hokoku 50, 75-91, 0 | 40 | |
Improvement of moving-picture quality on a 42-in.-diagonal PDP for HDTV K KOBAYASHI '97 SID Internat. Symp. Digest Tech. Papers, 217-220, 1997 | 39 | 1997 |
Modeling of random telegraph noise under circuit operation—Simulation and measurement of RTN-induced delay fluctuation K Ito, T Matsumoto, S Nishizawa, H Sunagawa, K Kobayashi, H Onodera 2011 12th International Symposium on Quality Electronic Design, 1-6, 2011 | 37 | 2011 |