Design and optimization of high-failure-current dual-direction SCR for industrial-level ESD protection Y Wang, X Jin, Y Peng, J Luo, J Yang IEEE Transactions on Power Electronics 35 (5), 4669-4677, 2019 | 25 | 2019 |
A high failure-current gate-controlled dual-direction SCR for high-voltage ESD protection in 0.18-μm BCD technology Y Wang, X Jin, Y Peng, J Luo, J Yang, Z Zheng, L Jiang, Z Zhong IEEE Journal of Emerging and Selected Topics in Power Electronics 9 (1), 994 …, 2019 | 22 | 2019 |
Design and measurement of ring-gate single photon avalanche diode with low dark count rate Y Wang, X Jin, S Cao, Y Peng, J Luo IEEE Photonics Journal 12 (3), 1-11, 2020 | 11 | 2020 |
Dual direction SCR with deep well structure for high voltage ESD in communication bus Y Wang, X Jin, Z Zheng, Y Peng, J Luo, J Yang Semiconductor Science and Technology 34 (7), 075031, 2019 | 10 | 2019 |
A novel gate-controlled dual direction SCR with enhanced failure current for on-chip ESD protection of industry-level controller area network bus Y Wang, Z Zhong, X Jin, Y Peng, J Luo, J Yang IEEE Journal of Emerging and Selected Topics in Power Electronics 10 (6 …, 2022 | 9 | 2022 |
Optimization of deep well gate-controlled dual direction SCR device for ESD protection in 0.5 μm CMOS process Y Wang, X Jin, S Cao, Y Peng, J Luo, J Yang Solid-state Electronics 161, 107634, 2019 | 7 | 2019 |
A novel robust SCR with high holding voltage for on-chip ESD protection of industry-level bus Y Liu, Y Wang, X Jin, J Yang, Y Peng, J Luo Solid-State Electronics 208, 108762, 2023 | 4 | 2023 |
Energy collection generator based on electrostatic conversion mechanism Y Wang, Z Zhong, Y Liu, X Jin, Y Peng, J Luo, J Yang Journal of Science: Advanced Materials and Devices 7 (4), 100505, 2022 | 4 | 2022 |
A novel high precision weighted integral ratio algorithm for fluorescent optical fiber temperature sensor J Yang, Y Wang, X Jin, Y Peng, J Luo Optical and Quantum Electronics 54, 1-14, 2022 | 4 | 2022 |
双波峰响应 CMOS 单光子探测器的设计与优化 张维宇, 汪洋, 金湘亮 Acta Optica Sinica 41 (17), 1704001, 2021 | 4 | 2021 |
Analysis of gate-controlled single photon avalanche diode with high photon-detection-probability Y Wang, X Jin, S Cao, Y Peng, J Luo Optics Communications 482, 126588, 2021 | 4 | 2021 |
Optimization of LDMOS-SCR device for ESD protection based on 0.5 μm CMOS process X Jin, Y Wang, Z Zhong 2019 12th International Workshop on the Electromagnetic Compatibility of …, 2019 | 4 | 2019 |
Design and Fabrication of Near Ultraviolet Enhanced Composite Single Photon Avalanche Diode for Fluorescence Lifetime Imaging J Yang, Y Wang, XL Jin, Y Peng, J Luo Journal of Nanoelectronics and Optoelectronics 17 (2), 267-274, 2022 | 3 | 2022 |
Design and optimization of a gate-controlled dual direction electro-static discharge device for an industry-level fluorescent optical fiber temperature sensor Y Wang, X Jin, J Yang, F Yan, Y Liu, Y Peng, J Luo, J Yang Frontiers of Information Technology & Electronic Engineering 23 (1), 158-170, 2022 | 3 | 2022 |
Electric-field-drive single photon avalanche diode with barrier enhancement for fluorescence detection Y Wang, X Jin, M Zeng, Y Peng, J Luo Microelectronics Journal 115, 105161, 2021 | 3 | 2021 |
An Integrated Fluorescence Optical Fiber Temperature Sensor Front-End Based on a Ring-Gate-Isolated Photodiode B Xiong, J Yang, Y Wang, J Guan, F Yan, Q Zhang, B Choubey, J Liu IEEE Sensors Journal, 2024 | 2 | 2024 |
Dual-directional SCR device with dual-gate controlled mechanism for ESD protection in photoelectric chip Y Liu, Y Wang, J Yang, X Jin Semiconductor Science and Technology 39 (2), 025004, 2024 | 2 | 2024 |
Gate-controlled silicon controlled rectifier with adjustable clamping voltage using a photoelectric mechanism Y Wang, Y Liu, Z Zhong, X Jin, Y Peng, J Luo, J Yang Optics Express 31 (1), 651-658, 2022 | 2 | 2022 |
Photoelectric-motivated memristor to realize single nerve synapse S Cao, X Jin, Y Wang, B Jiang, Y Peng, J Luo Japanese Journal of Applied Physics 58 (11), 112004, 2019 | 2 | 2019 |
Low-Trigger LDMOS-SCR For ESD Protection Of Single Photon Detector Y Wang, X Jin 2019 IEEE 26th International Symposium on Physical and Failure Analysis of …, 2019 | 2 | 2019 |