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ian gilmore
ian gilmore
National Physical Laboratory, Natl Phys lab, Nat Phys lab
在 npl.co.uk 的电子邮件经过验证
标题
引用次数
引用次数
年份
Surface analysis: the principal techniques
JC Vickerman, IS Gilmore
John Wiley & Sons, 2011
14272011
Effect of disorder on Raman scattering of single-layer Mo S 2
S Mignuzzi, AJ Pollard, N Bonini, B Brennan, IS Gilmore, MA Pimenta, ...
Physical Review B 91 (19), 195411, 2015
7322015
The 3D OrbiSIMS—label-free metabolic imaging with subcellular lateral resolution and high mass-resolving power
MK Passarelli, A Pirkl, R Moellers, D Grinfeld, F Kollmer, R Havelund, ...
Nature methods 14 (12), 1175-1183, 2017
3962017
XPS: binding energy calibration of electron spectrometers 5—re‐evaluation of the reference energies
MP Seah, IS Gilmore, G Beamson
Surface and Interface Analysis: An International Journal devoted to the …, 1998
3611998
Quantitative XPS: I. Analysis of X-ray photoelectron intensities from elemental data in a digital photoelectron database
MP Seah, IS Gilmore, SJ Spencer
Journal of Electron Spectroscopy and Related Phenomena 120 (1-3), 93-111, 2001
2132001
Antiviral surfaces and coatings and their mechanisms of action
PD Rakowska, M Tiddia, N Faruqui, C Bankier, Y Pei, AJ Pollard, J Zhang, ...
Communications Materials 2 (1), 53, 2021
1902021
Chemical intervention in plant sugar signalling increases yield and resilience
CA Griffiths, R Sagar, Y Geng, LF Primavesi, MK Patel, MK Passarelli, ...
Nature 540 (7634), 574-578, 2016
1852016
Organic depth profiling of a nanostructured delta layer reference material using large argon cluster ions
JLS Lee, S Ninomiya, J Matsuo, IS Gilmore, MP Seah, AG Shard
Analytical chemistry 82 (1), 98-105, 2010
1842010
Ion detection efficiency in SIMS:: Dependencies on energy, mass and composition for microchannel plates used in mass spectrometry
IS Gilmore, MP Seah
International Journal of Mass Spectrometry 202 (1-3), 217-229, 2000
1702000
Metabolic imaging at the single-cell scale: recent advances in mass spectrometry imaging
IS Gilmore, S Heiles, CL Pieterse
Annual review of analytical chemistry 12, 201-224, 2019
1672019
An accurate semi‐empirical equation for sputtering yields I: for argon ions
MP Seah, CA Clifford, FM Green, IS Gilmore
Surface and Interface Analysis: An International Journal devoted to the …, 2005
1652005
Argon cluster ion beams for organic depth profiling: results from a VAMAS interlaboratory study
AG Shard, R Havelund, MP Seah, SJ Spencer, IS Gilmore, N Winograd, ...
Analytical chemistry 84 (18), 7865-7873, 2012
1602012
Single-cell analysis: visualizing pharmaceutical and metabolite uptake in cells with label-free 3D mass spectrometry imaging
MK Passarelli, CF Newman, PS Marshall, A West, IS Gilmore, J Bunch, ...
Analytical chemistry 87 (13), 6696-6702, 2015
1572015
Measurement of sputtering yields and damage in C60 SIMS depth profiling of model organic materials
AG Shard, PJ Brewer, FM Green, IS Gilmore
Surface and Interface Analysis: An International Journal devoted to the …, 2007
1422007
Quantitative molecular depth profiling of organic delta-layers by C60 ion sputtering and SIMS
AG Shard, FM Green, PJ Brewer, MP Seah, IS Gilmore
The Journal of Physical Chemistry B 112 (9), 2596-2605, 2008
1412008
Ambient mass spectrometry: advances and applications in forensics
FM Green, TL Salter, P Stokes, IS Gilmore, G O'Connor
Surface and Interface Analysis: An International Journal devoted to the …, 2010
1182010
Simplified equations for correction parameters for elastic scattering effects in AES and XPS for Q, β and attenuation lengths
MP Seah, IS Gilmore
Surface and Interface Analysis: An International Journal devoted to the …, 2001
1182001
The effect of electrospray solvent composition on desorption electrospray ionisation (DESI) efficiency and spatial resolution
FM Green, TL Salter, IS Gilmore, P Stokes, G O'connor
Analyst 135 (4), 731-737, 2010
1172010
Static SIMS: towards unfragmented mass spectra—the G-SIMS procedure
IS Gilmore, MP Seah
Applied surface science 161 (3-4), 465-480, 2000
1052000
Quantification and methodology issues in multivariate analysis of ToF‐SIMS data for mixed organic systems
JLS Lee, IS Gilmore, MP Seah
Surface and Interface Analysis: An International Journal devoted to the …, 2008
1042008
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