| Demonstration of a high average power tabletop soft X-ray laser BR Benware, CD Macchietto, CH Moreno, JJ Rocca Physical Review Letters 81 (26), 5804, 1998 | 434 | 1998 |
| Generation of millijoule-level soft-x-ray laser pulses at a 4-Hz repetition rate in a highly saturated tabletop capillary discharge amplifier CD Macchietto, BR Benware, JJ Rocca Optics letters 24 (16), 1115-1117, 1999 | 349 | 1999 |
| Impact of multiple-detect test patterns on product quality B Benware, C Schuermyer, S Ranganathan, R Madge, P Krishnamurthy, ... International Test Conference, 2003. Proceedings. ITC 2003., 1031-1031, 2003 | 211 | 2003 |
| Focusing of a tabletop soft-x-ray laser beam and laser ablation BR Benware, A Ozols, JJ Rocca, IA Artioukov, VV Kondratenko, ... Optics letters 24 (23), 1714-1716, 1999 | 110 | 1999 |
| Analyzing volume diagnosis results with statistical learning for yield improvement H Tang, S Manish, J Rajski, M Keim, B Benware 12th IEEE European Test Symposium (ETS'07), 145-150, 2007 | 108 | 2007 |
| Operation and output pulse characteristics of an extremely compact capillary-discharge tabletop soft-x-ray laser BR Benware, CH Moreno, DJ Burd, JJ Rocca Optics letters 22 (11), 796-798, 1997 | 101 | 1997 |
| Two-dimensional near-field and far-field imaging of a Ne-like Ar capillary discharge table-top soft-x-ray laser CH Moreno, MC Marconi, VN Shlyaptsev, BR Benware, CD Macchietto, ... Physical Review A 58 (2), 1509, 1998 | 98 | 1998 |
| Measurement of the spatial coherence buildup in a discharge pumped table-top soft x-ray laser MC Marconi, JLA Chilla, CH Moreno, BR Benware, JJ Rocca Physical review letters 79 (15), 2799, 1997 | 97 | 1997 |
| A rapid yield learning flow based on production integrated layout-aware diagnosis M Keim, N Tamarapalli, H Tang, M Sharma, J Rajski, C Schuermyer, ... 2006 IEEE International Test Conference, 1-10, 2006 | 96 | 2006 |
| In search of the optimum test set-adaptive test methods for maximum defect coverage and lowest test cost R Madge, B Benware, R Turakhia, R Daasch, C Schuermyer, J Ruffler 2004 International Conferce on Test, 203-212, 2004 | 72 | 2004 |
| Effectiveness comparisons of outlier screening methods for frequency dependent defects on complex ASICs BR Benware, R Madge, C Lu, R Daasch Proceedings. 21st VLSI Test Symposium, 2003., 39-46, 2003 | 72 | 2003 |
| Determining a Failure Root Cause Distribution From a Population of Layout-Aware Scan Diagnosis Results B Benware, M Sharma, C Schuermyer, T Herrmann Design & Test of Computers, IEEE, 1-1, 2012 | 70 | 2012 |
| Determination of XUV optical constants by reflectometry using a high-repetition rate 46.9-nm laser IA Artioukov, BR Benware, JJ Rocca, M Forsythe, YA Uspenskii, ... IEEE Journal of Selected Topics in Quantum Electronics 5 (6), 1495-1501, 1999 | 58 | 1999 |
| Obtaining high defect coverage for frequency-dependent defects in complex ASICs R Madge, BR Benware, WR Daasch IEEE Design & Test of Computers 20 (5), 46-53, 2003 | 52 | 2003 |
| Efficiently performing yield enhancements by identifying dominant physical root cause from test fail data M Sharma, B Benware, L Ling, D Abercrombie, L Lee, M Keim, H Tang, ... 2008 IEEE International Test Conference, 1-9, 2008 | 51 | 2008 |
| Enhancing transition fault model for delay defect diagnosis WT Cheng, B Benware, R Guo, KH Tsai, T Kobayashi, K Maruo, M Nakao, ... 2008 17th Asian Test Symposium, 179-184, 2008 | 50 | 2008 |
| Experiences with Layout-Aware Diagnosis--A Case Study. YJ Chang, MT Pang, M Brennan, A Man, M Keim, G Eide, B Benware, ... Electronic Device Failure Analysis 12 (2), 2010 | 44 | 2010 |
| Improved volume diagnosis throughput using dynamic design partitioning X Fan, H Tang, Y Huang, WT Cheng, SM Reddy, B Benware 2012 IEEE International Test Conference, 1-10, 2012 | 41 | 2012 |
| Affordable and effective screening of delay defects in ASICs using the inline resistance fault model B Benware, C Lu, J Van Slyke, P Krishnamurthy, R Madge, M Keim, ... 2004 International Conferce on Test, 1285-1294, 2004 | 39 | 2004 |
| Determination of dominant-yield-loss mechanism with volume diagnosis M Sharma, C Schuermyer, B Benware IEEE Design & Test of Computers 27 (3), 54-61, 2009 | 34 | 2009 |
