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Tobias Reiter
Tobias Reiter
Institute for Microelectronics
在 iue.tuwien.ac.at 的电子邮件经过验证
标题
引用次数
引用次数
年份
Impact of plasma induced damage on the fabrication of 3D NAND flash memory
T Reiter, X Klemenschits, L Filipovic
Solid-State Electronics 192, 108261, 2022
122022
Triggered superradiance and spin inversion storage in a hybrid quantum system
W Kersten, N De Zordo, O Diekmann, T Reiter, M Zens, AN Kanagin, ...
Physical Review Letters 131 (4), 043601, 2023
52023
Effect of mask geometry variation on plasma etching profiles
J Bobinac, T Reiter, J Piso, X Klemenschits, O Baumgartner, Z Stanojevic, ...
Micromachines 14 (3), 665, 2023
52023
Tractor beams with optimal pulling force using structured waves
M Horodynski, T Reiter, M Kühmayer, S Rotter
Physical Review A 108 (2), 023504, 2023
42023
Modeling incomplete conformality during atomic layer deposition in high aspect ratio structures
LF Aguinsky, F Rodrigues, T Reiter, X Klemenschits, L Filipovic, ...
Solid-State Electronics 201, 108584, 2023
32023
Impact of high-aspect-ratio etching damage on selective epitaxial silicon growth in 3D NAND flash memory
T Reiter, X Klemenschits, L Filipovic
2021 Joint International EUROSOI Workshop and International Conference on …, 2021
32021
Impact of mask tapering on SF6/O2 plasma etching
J Bobinac, T Reiter, J Piso, X Klemenschits, O Baumgartner, Z Stanojevic, ...
Microelectronic Devices and Technologies: Proceedings of the 4rd …, 2022
22022
DTCO flow for air spacer generation and its impact on power and performance at N7
L Filipovic, O Baumgartner, X Klemenschits, J Piso, J Bobinac, T Reiter, ...
Solid-State Electronics 199, 108527, 2023
12023
Modeling the impact of incomplete conformality during atomic layer processing
T Reiter, LF Aguinsky, F Rodrigues, J Weinbub, A Hössinger, L Filipovic
Solid-State Electronics 211, 108816, 2024
2024
Physics-Informed Compact Model for SF6/O2 Plasma Etching
L Filipovic, J Bobinac, J Piso, T Reiter
2023 International Conference on Simulation of Semiconductor Processes and …, 2023
2023
Modeling Oxide Regrowth During Selective Etching in Vertical 3D NAND Structures
T Reiter, A Toifl, A Hössinger, L Filipovic
2023 International Conference on Simulation of Semiconductor Processes and …, 2023
2023
Fast 3D Flux Calculation using Monte Carlo Ray Tracing on GPUs
T Reiter, L Filipovic
Microelectronic Devices and Technologies, 67, 2023
2023
Process Simulation in Micro-and Nano-Electronics
L Filipovic, T Reiter, X Klemenschits, S Leroch, R Stella, O Baumgartner, ...
Power 30, 40, 2023
2023
Modeling Plasma-Induced Damage During the Dry Etching of Silicon
T Reiter, X Klemenschits, L Filipovic
2022 IEEE International Integrated Reliability Workshop (IIRW), 1-5, 2022
2022
Stabilization of spin ensembles in hybrid quantum systems
T Reiter
Wien, 2022
2022
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