| Position and momentum mapping of vibrations in graphene nanostructures R Senga, K Suenaga, P Barone, S Morishita, F Mauri, T Pichler Nature 573 (7773), 247-250, 2019 | 146 | 2019 |
| Attainment of 40.5 pm spatial resolution using 300 kV scanning transmission electron microscope equipped with fifth-order aberration corrector S Morishita, R Ishikawa, Y Kohno, H Sawada, N Shibata, Y Ikuhara Microscopy 67 (1), 46-50, 2017 | 90 | 2017 |
| Diffractive imaging of the dumbbell structure in silicon by spherical-aberration-corrected electron diffraction S Morishita, J Yamasaki, K Nakamura, T Kato, N Tanaka Applied Physics Letters 93 (18), 183103, 2008 | 73 | 2008 |
| Atomic resolution electron microscopy in a magnetic field free environment N Shibata, Y Kohno, A Nakamura, S Morishita, T Seki, A Kumamoto, ... Nature communications 10 (1), 2308, 2019 | 68 | 2019 |
| High spatiotemporal-resolution imaging in the scanning transmission electron microscope R Ishikawa, Y Jimbo, M Terao, M Nishikawa, Y Ueno, S Morishita, ... Microscopy 69 (4), 240-247, 2020 | 38 | 2020 |
| Unexpected huge dimerization ratio in one-dimensional carbon atomic chains YC Lin, S Morishita, M Koshino, CH Yeh, PY Teng, PW Chiu, H Sawada, ... Nano Letters 17 (1), 494-500, 2017 | 38 | 2017 |
| Resolution enhancement in transmission electron microscopy with 60-kV monochromated electron source S Morishita, M Mukai, K Suenaga, H Sawada Applied Physics Letters 108 (1), 013107, 2016 | 34 | 2016 |
| Atomic resolution imaging at an ultralow accelerating voltage by a monochromatic transmission electron microscope S Morishita, M Mukai, K Suenaga, H Sawada Physical Review Letters 117 (15), 153004, 2016 | 31 | 2016 |
| Imaging of isotope diffusion using atomic-scale vibrational spectroscopy R Senga, YC Lin, S Morishita, R Kato, T Yamada, M Hasegawa, ... Nature 603 (7899), 68-72, 2022 | 28 | 2022 |
| Quantitative phase imaging of electron waves using selected-area diffraction J Yamasaki, K Ohta, S Morishita, N Tanaka Applied Physics Letters 101 (23), 2012 | 24 | 2012 |
| Development of tilt-scan system for differential phase contrast scanning transmission electron microscopy Y Kohno, A Nakamura, S Morishita, N Shibata Microscopy 71 (2), 111-116, 2022 | 18 | 2022 |
| Super high resolution imaging with atomic resolution electron microscope of JEM-ARM300F H SAWADA, N Shimura, K Satoh, E Okunishi, S Morishita, T Sasaki, ... JEOL News 49 (1), 51-58, 2014 | 16 | 2014 |
| Measurement of spatial coherence of electron beams by using a small selected-area aperture S Morishita, J Yamasaki, N Tanaka Ultramicroscopy 129, 10-17, 2013 | 16 | 2013 |
| Spatial and phase resolution in electron microscopy R Ishikawa, S Morishita, T Tanigaki, N Shibata, Y Ikuhara Microscopy 72 (2), 78-96, 2023 | 14 | 2023 |
| Resolution achievement of 40.5 pm in scanning transmission electron microscopy using 300 kV microscope with delta corrector S Morishita, R Ishikawa, Y Kohno, H Sawada, N Shibata, Y Ikuhara Microscopy and Microanalysis 24 (S1), 120-121, 2018 | 13 | 2018 |
| Evaluation of residual aberration in fifth-order geometrical aberration correctors S Morishita, Y Kohno, F Hosokawa, K Suenaga, H Sawada Microscopy 67 (3), 156-163, 2018 | 9 | 2018 |
| Estimation of wave fields of incident beams in a transmission electron microscope by using a small selected-area aperture S Morishita, J Yamasaki, N Tanaka Journal of electron microscopy 60 (2), 101-108, 2011 | 9 | 2011 |
| Phase imaging and atomic-resolution imaging by electron diffractive imaging J Yamasaki, S Morishita, Y Shimaoka, K Ohta, H Sasaki Japanese Journal of Applied Physics 58 (12), 120502, 2019 | 7 | 2019 |
| Automated geometric aberration correction for large-angle illumination STEM R Ishikawa, R Tanaka, S Morishita, Y Kohno, H Sawada, T Sasaki, ... Ultramicroscopy 222, 113215, 2021 | 6 | 2021 |
| Device and method for computing angular range for measurement of aberrations and electron microscope S Morishita US Patent 10,332,719, 2019 | 5 | 2019 |
