| Applying Vstress and defect activation coverage to produce zero-defect mixed-signal automotive ICs W Dobbelaere, F Colle, A Coyette, R Vanhooren, N Xama, J Gomez, ... 2019 IEEE International Test Conference (ITC), 1-4, 2019 | 15 | 2019 |
| Review of methodologies for pre-and post-silicon analog verification in mixed-signal SOCs G Gielen, N Xama, K Ganesan, S Mitra 2019 Design, Automation & Test in Europe Conference & Exhibition (DATE …, 2019 | 15 | 2019 |
| Automatic testing of analog ICs for latent defects using topology modification N Xama, A Coyette, B Esen, W Dobbelaere, R Vanhooren, G Gielen 2017 22nd IEEE European Test Symposium (ETS), 1-6, 2017 | 12 | 2017 |
| Recent trends and perspectives on defect-oriented testing P Bernardi, R Cantoro, A Coyette, W Dobbeleare, M Fieback, A Floridia, ... 2022 IEEE 28th International Symposium on On-Line Testing and Robust System …, 2022 | 9 | 2022 |
| Pinhole latent defect modeling and simulation for defect-oriented analog/mixed-signal testing J Gomez, N Xama, A Coyette, R Vanhooren, W Dobbelaere, G Gielen 2020 IEEE 38th VLSI Test Symposium (VTS), 1-6, 2020 | 7 | 2020 |
| A very low cost and highly parallel DfT method for analog and mixed-signal circuits B Esen, A Coyette, N Xama, W Dobbelaere, R Vanhooren, G Gielen 2017 22nd IEEE European Test Symposium (ETS), 1-2, 2017 | 7 | 2017 |
| Machine learning-based defect coverage boosting of analog circuits under measurement variations N Xama, M Andraud, J Gomez, B Esen, W Dobbelaere, R Vanhooren, ... ACM Transactions on Design Automation of Electronic Systems (TODAES) 25 (5 …, 2020 | 5 | 2020 |
| Avoiding mixed-signal field returns by outlier detection of hard-to-detect defects based on multivariate statistics N Xama, J Raymaekers, M Andraud, J Gomez, W Dobbelaere, ... 2020 IEEE European Test Symposium (ETS), 1-6, 2020 | 5 | 2020 |
| Latent defect screening with visually-enhanced dynamic part average testing A Coyette, W Dobbelaere, R Vanhooren, N Xama, J Gomez, G Gielen 2020 IEEE European Test Symposium (ETS), 1-6, 2020 | 5 | 2020 |
| ADAGE: Automatic DfT-assisted generation of test stimuli for mixed-signal integrated circuits A Coyette, B Esen, N Xama, G Gielen, W Dobbelaere, R Vanhooren IEEE Design & Test 35 (3), 24-30, 2018 | 5 | 2018 |
| Quick Analyses for Improving Reliability and Functional Safety of Mixed-Signal ICs S Sunter, M Wolinski, A Coyette, R Vanhooren, W Dobbelaere, N Xama, ... 2020 IEEE International Test Conference (ITC), 1-10, 2020 | 4 | 2020 |
| DDtM: Increasing latent defect detection in analog/mixed-signal ICs using the difference in distance to mean value J Gomez, N Xama, A Coyette, R Vanhooren, W Dobbelaere, G Gielen IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2021 | 2 | 2021 |
| Methodology towards sub-ppm testing of analog and mixed-signal ICs for cyber-physical systems G Gielen, B Esen, W Dobbelaer, R Vanhooren, A Coyette, N Xama 2018 IEEE International Symposium on Circuits and Systems (ISCAS), 1-4, 2018 | 2 | 2018 |
| Boosting Latent Defect Coverage in Automotive Mixed-Signal ICs using SVM Classifiers N Xama, J Gomez, W Dobbelaere, R Vanhooren, A Coyette, G Gielen IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2023 | 1 | 2023 |
| Experimental validation of a compact pinhole latent defect model for MOS transistors J Gomez, N Xama, D Lootens, A Coyette, R Vanhooren, W Dobbelaere, ... IEEE Transactions on Electron Devices 69 (9), 4796-4802, 2022 | 1 | 2022 |
| An Automated Low-Cost Analog and Mixed-Signal DfT Method Using Testing Diodes B Esen, A Coyette, N Xama, G Gielen, W Dobbelaere, R Vanhooren IEEE Design & Test 35 (3), 15-23, 2018 | 1 | 2018 |
| Non-intrusive detection of defects in mixed-signal integrated circuits using light activation B Esen, A Coyette, N Xama, W Dobbelaere, R Vanhooren, G Gielen 2017 IEEE International Test Conference (ITC), 1-7, 2017 | 1 | 2017 |
| Automated Design-for-Test and Data-Learning-based Methods for Testing of Analog and Mixed-Signal Integrated Circuits N Xama | | 2023 |
| High-coverage analog IP block test generation methodology using low-cost signal generation and output response analysis J Gomez, N Xama, A Coyette, R Vanhooren, W Dobbelaere, G Gielen 2023 IEEE European Test Symposium (ETS), 1-4, 2023 | | 2023 |
| ETS 2020 Best Paper A COYETTE, W DOBBELAERE, R VANHOOREN, N XAMA, J GOMEZ, ... | | |
Georges GielenKU Leuven (University of Leuven)在 kuleuven.be 的电子邮件经过验证
