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Olaf C. Haenssler
Olaf C. Haenssler
IU International University of Applied Sciences
在 ieee.org 的电子邮件经过验证 - 首页
标题
引用次数
引用次数
年份
Design and experimental evaluation of a compliant mechanism-based stepping-motion actuator with multi-mode
J Wei, S Fatikow, X Zhang, OC Haenssler
Smart Materials and Structures 27 (10), 105014, 2018
242018
Driving principles of mobile microrobots for micro-and nanohandling
A Kortschack, OC Hänßler, C Rass, S Fatikow
Proceedings 2003 IEEE/RSJ International Conference on Intelligent Robots and …, 2003
222003
Publications in journals
OC Haenssler, MF Wieghaus, A Kostopoulos, G Doundoulakis, ...
JOURNAL OF APPLIED PHYSICS 119, 224305, 2016
202016
Automated calibration of RF on-wafer probing and evaluation of probe misalignment effects using a desktop micro-factory
FT von Kleist-Retzow, T Tiemerding, P Elfert, OC Haenssler
Journal of Computer and Communications 4 (3), 61-67, 2016
172016
Automated robotic manipulation of individual sub-micro particles using a dual probe setup inside the scanning electron microscope
S Zimmermann, T Tiemerding, OC Haenssler, S Fatikow
2015 IEEE International Conference on Robotics and Automation (ICRA), 950-955, 2015
152015
Multi-target tracking for automated RF on-wafer probing based on template matching
H Li, FT von Kleist-Retzow, OC Haenssler, S Fatikow, X Zhang
2019 International Conference on Manipulation, Automation and Robotics at …, 2019
122019
Manipulation of Liquid Metal Inside an SEM by Taking Advantage of Electromigration
FT von Kleist-Retzow, OC Haenssler, S Fatikow
Journal of Microelectromechanical Systems, 2018
102018
Development of an automatic nanorobot cell for handling of carbon nanotubes
S Fatikow, V Eichhorn, T Wich, H Hülsen, OC Haenssler, T Sievers
Proc. IARP-IEEE/RAS-EURON Joint Workshop on Micron and Nano Robotics, 2006
102006
Depth-detection methods for CNT manipulation and characterization in a scanning electron microscope
S Fatikow, V Eichhorn, T Wich, T Sievers, O Hänßler, KN Andersen
2007 International Conference on Mechatronics and Automation, 45-50, 2007
82007
Memristor device characterization by scanning microwave microscopy
G Sassine, N Najjari, N Defrance, OC Haenssler, D Theron, F Alibart, ...
2017 International Conference on Manipulation, Automation and Robotics at …, 2017
72017
Integration of a Scanning Microwave Microscope and a Scanning Electron Microscope: Towards a new instrument to imaging, characterizing and manipulating at the nanoscale
OC Haenssler
2014 international conference on manipulation, manufacturing and measurement …, 2014
72014
Amplitude-phase variation in a graphene-based microstrip line
M Yasir, S Fatikow, OC Haenssler
Micromachines 13 (7), 1039, 2022
62022
Multimodal imaging technology by integrated scanning electron, force, and microwave microscopy and its application to study microscaled capacitors
OC Haenssler, S Fatikow, D Theron
Journal of Vacuum Science & Technology B 36 (2), 2018
62018
Combined scanning microwave and electron microscopy: A novel toolbox for hybrid nanoscale material analysis
K Haddadi, OC Haenssler, K Daffe, S Eliet, C Boyaval, D Theron, ...
2017 IEEE MTT-S International Microwave Workshop Series on Advanced …, 2017
62017
Near-field scanning millimeter-wave microscope combined with a scanning electron microscope
K Haddadi, OC Haenssler, C Boyaval, D Theron, G Dambrine
2017 IEEE MTT-S International Microwave Symposium (IMS), 1656-1659, 2017
52017
Reduction of graphene oxide and graphene quantum dots using nascent hydrogen: The investigation of morphological and structural changes
S Jovanovic, OC Haenssler, M Budimir, D Kleut, J Prekodravac, ...
Resolution and Discovery 5 (1), 1-4, 2020
32020
Towards robot-based manipulation, characterization and automation at the nanoscale
S Fatikow, M Bartenwerfer, OC Haenssler
2019 International Conference on Industrial Engineering, Applications and …, 2019
32019
Multimodal microscopy test standard for scanning microwave, electron, force and optical microscopy
OC Haenssler, MF Wieghaus, A Kostopoulos, G Doundoulakis, ...
Journal of Micro-Bio Robotics 14, 51-57, 2018
32018
Simulation of probe misalignment effects during rf on-wafer probing
FT von Kleist-Retzow, OC Haenssler, S Fatikow
2016 41st International Conference on Infrared, Millimeter, and Terahertz …, 2016
32016
Manipulating and characterizing with nanorobotics: In-situ SEM technique for centimeter and millimeter waves
OC Haenssler, S Fatikow
2015 40th International Conference on Infrared, Millimeter, and Terahertz …, 2015
32015
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