| Wafer-scale hybrid integration of InP DFB lasers on Si photonics by flip-chip bonding with sub-300 nm alignment precision A Marinins, S Hänsch, H Sar, F Chancerel, N Golshani, HL Wang, ... IEEE Journal of Selected Topics in Quantum Electronics 29 (3: Photon. Elec …, 2022 | 33 | 2022 |
| Imec silicon photonics platforms: performance overview and roadmap FJ Ferraro, P De Heyn, M Kim, N Rajasekaran, M Berciano, G Muliuk, ... Next-Generation Optical Communication: Components, Sub-Systems, and Systems …, 2023 | 20 | 2023 |
| Performance and reliability of a fully integrated 3D sequential technology A Tsiara, X Garros, L Brunet, P Batude, C Fenouillet-Béranger, ... 2018 IEEE Symposium on VLSI Technology, 75-76, 2018 | 17 | 2018 |
| Key process steps for high performance and reliable 3D Sequential Integration CMV Lu, F Deprat, C Fenouillet-Beranger, P Batude, X Garros, A Tsiara, ... 2017 Symposium on VLSI Technology, T226-T227, 2017 | 15 | 2017 |
| Electromigration performance improvement of metal heaters for Si photonic ring modulators D Coenen, K Croes, A Tsiara, H Oprins, V Simons, OV Pedreira, Y Ban, ... IEEE Transactions on Device and Materials Reliability 22 (3), 417-423, 2022 | 7 | 2022 |
| Electrical and optical reliability analysis of GeSi electro-absorption modulators A Tsiara, SA Srinivasan, S Balakrishnan, M Pantouvaki, P Absil, ... Optical Fiber Communication Conference, M2A. 5, 2020 | 5 | 2020 |
| Wafer-level aging of InGaAs/GaAs nano-ridge pin diodes monolithically integrated on silicon PY Hsieh, A Tsiara, B O’Sullivan, D Yudistira, M Baryshnikova, ... 2022 IEEE International Reliability Physics Symposium (IRPS), 9A. 3-1-9A. 3-9, 2022 | 4 | 2022 |
| Degradation mechanisms in germanium electro-absorption modulators A Tsiara, A Leśniewska, P Roussel, SA Srinivasan, M Berciano, M Simicic, ... 2022 IEEE International Reliability Physics Symposium (IRPS), 9A. 2-1-9A. 2-7, 2022 | 4 | 2022 |
| Degradation mechanisms and lifetime assessment of Ge Vertical PIN photodetectors K Croes, V Simons, B Truijen, P Roussel, K Van Sever, A Tsiara, J Franco, ... 2022 Optical Fiber Communications Conference and Exhibition (OFC), 1-3, 2022 | 3 | 2022 |
| Reliability analysis on low temperature gate stack process steps for 3D sequential integration A Tsiara, X Garros, CMV Lu, C Fenouillet-Béranger, P Batude, ... 2017 IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference …, 2017 | 3 | 2017 |
| Impact of low thermal processes on reliability of high-k/metal gate stacks A Tsiara, X Garros, CMV Lu, C Fenouillet-Beranger, G Ghibaudo Journal of Vacuum Science & Technology B 35 (1), 2017 | 3 | 2017 |
| Degradation and Recovery Kinetics Study of Vertical and Lateral Ge-on-Si Photodetectors S Musibau, N Poumpouridis, A Tsiara, J Franco, M Berciano, ... 2024 IEEE International Reliability Physics Symposium (IRPS), 1-10, 2024 | 2 | 2024 |
| Hot-carrier induced degradation of Ge/STI interfaces in Ge-on-Si junction devices S Musibau, J Franco, A Tsiara, I De Wolf, K Croes Solid-State Electronics 214, 108867, 2024 | 2 | 2024 |
| HBM and CDM ESD Performance of Advanced Silicon Photonic Components SH Chen, J Karp, M Simicic, A Tsiara, D Tsaggaris, K Croes, Y Ban, P Tan, ... 2021 43rd Annual EOS/ESD Symposium (EOS/ESD) 43, 1-7, 2021 | 2 | 2021 |
| Accelerated dark current degradation study of monolithically integrated In0.2Ga0.8As/GaAs-on-Si nano-ridge photodetectors PY Hsieh, DP Panda, A Tsiara, B O'Sullivan, H Sar, C Caer, D Yudistira, ... 49th European Conference on Optical Communications (ECOC 2023) 2023, 613-616, 2023 | 1 | 2023 |
| Advanced Current–Voltage Model of Electrical Contacts to GaAs-and Ge-Based Active Silicon Photonic Devices PY Hsieh, B O'Sullivan, A Tsiara, B Truijen, P Lagrain, L Wouters, ... IEEE Transactions on Electron Devices 70 (8), 4274-4279, 2023 | 1 | 2023 |
| Electrical characterization & modeling of the trapping phenomena impacting the reliability of nanowire transistors for sub 10nm nodes| Theses. fr A Tsiara Université Grenoble Alpes (ComUE), 2019 | 1 | 2019 |
| Impact of low thermal processes on reliability of HK/MG stacks A Tsiara, X Garros, CMV Lu, C Fenouillet-Beranger, G Ghibaudo 19th Workshop on Dielectrics in Microelectronics (WoDIM), 2016 | 1 | 2016 |
| ESD Robustness of Germanium Photodetectors in Advanced Silicon Photonics Technology SH Chen, PY Fu, A Tsiara, M Van De Peer, M Simicic, S Musibau, Y Ban, ... 2024 46th Annual EOS/ESD Symposium (EOS/ESD) 46, 1-7, 2024 | | 2024 |
| Modeling Dark Current Degradation of Monolithic InGaAs/GaAs-On-Si Nano-Ridge Photodetectors PY Hsieh, AB Driss, A Tsiara, B O'Sullivan, D Yudistira, B Kunert, ... 2024 IEEE International Reliability Physics Symposium (IRPS), 2B. 1-1-2B. 1-9, 2024 | | 2024 |
