| Review on grazing incidence X-ray spectrometry and reflectometry KN Stoev, K Sakurai Spectrochimica Acta Part B: Atomic Spectroscopy 54 (1), 41-82, 1999 | 237 | 1999 |
| Recent theoretical models in grazing incidence X-ray reflectometry K Stoev, K Sakurai The Rigaku Journal 14 (2), 22-37, 1997 | 140 | 1997 |
| Phase-stepping holographic moiré: simultaneous in-plane and out-of-plane displacement measurement ES Simova, KN Stoev Applied optics 31 (14), 2405-2408, 1992 | 14 | 1992 |
| Theoretical calculation of secondary X-ray fluorescence due to Compton electrons KN Stoev Journal of Physics D: Applied Physics 25 (2), 131, 1992 | 12 | 1992 |
| Recent progresses in nanometer scale analysis of buried layers and interfaces in thin films by X-rays and Neutrons K Stoev, K Sakurai Analytical Sciences 36 (8), 901-922, 2020 | 11 | 2020 |
| Quick X-ray reflectivity of spherical samples K Stoev, K Sakurai Advances in X-ray Analysis 56, 10, 2013 | 11 | 2013 |
| Aberration effects in quick X-Ray reflectivity of curved samples K Stoev, K Sakurai IOP Conference Series: Materials Science and Engineering 24 (1), 012014, 2011 | 11 | 2011 |
| Phase-stepping automatic fringe analysis in holographic moiré ES Simova, KN Stoev Applied optics 31 (28), 5965-5974, 1992 | 11 | 1992 |
| Density gradient of a mirror-polished rutile (110) surface: X-ray reflectivity evaluation M Mizusawa, KN Stoev, K Sakurai Japanese journal of applied physics 42 (6R), 3709, 2003 | 9 | 2003 |
| Optimization of Curved X-Ray Multilayer Mirrors for Total Reflection X-Ray Fluorescence Spectrometry K Stoev, J Knoth, H Schwenke X-ray spectrometry 27, 166-172, 1998 | 9 | 1998 |
| X-ray reflectivity simulation software K Stoev, J Knoth, H Schwenke 7th German-Japanese Workshop on Chemical Information, 10-12, 1997 | 7 | 1997 |
| EXFIT—a computer code for processing energy‐dispersive X‐ray fluorescence spectra of environmental thin samples KN Stoev, JF Dlouhy X‐Ray Spectrometry 23 (3), 112-119, 1994 | 7 | 1994 |
| Automated Fourier transform fringe-pattern analysis in holographic moire ES Simova, KN Stoev Optical Engineering 32 (9), 2286-2294, 1993 | 7 | 1993 |
| Comparison of radiographic image processing algorithms K Stoev Atomic Energy of Canada Limited, 2012 | 6 | 2012 |
| Measurement of relative X-ray intensity ratios for elements with z= 14 to 92 using EDXRF spectrometer KN Stoev, JF Dlouhy Advances in X-Ray Analysis 37, 697-709, 1993 | 6 | 1993 |
| Study on journal distribution of publications in the field of X‐ray fluorescence analysis KN Stoev X‐Ray Spectrometry 23 (5), 229-235, 1994 | 5 | 1994 |
| Calculation of diffuse scattering in quick X-ray reflectometry K Stoev, V Samson, M Mizusawa, K Sakurai 45 Annual Conference on X-ray Chemical Analysis, 2009 | 4 | 2009 |
| Analysis of surface X-ray scattering from synthetic quartz mirror M MIZUSAWA, K STOEV, K SAKURAI 2002 Photon Factory Activity Report Part B 20, 64, 2003 | 4 | 2003 |
| Semiempirical model for correction of matrix effects in on‐stream x‐ray fluorescence analysis KN Stoev X‐Ray Spectrometry 20 (2), 81-87, 1991 | 4 | 1991 |
| An algorithm for artificial resolution enhancement of X-ray fluorescence spectra KN Stoev, MK Vutchkov Nuclear Instruments and Methods in Physics Research Section B: Beam …, 1991 | 3 | 1991 |
