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Thomas C. Pekin
Thomas C. Pekin
Humboldt Universität zu Berlin
在 berkeley.edu 的电子邮件经过验证 - 首页
标题
引用次数
引用次数
年份
py4DSTEM: A software package for four-dimensional scanning transmission electron microscopy data analysis
BH Savitzky, SE Zeltmann, LA Hughes, HG Brown, S Zhao, PM Pelz, ...
Microscopy and Microanalysis 27 (4), 712-743, 2021
1872021
Optimizing disk registration algorithms for nanobeam electron diffraction strain mapping
TC Pekin, C Gammer, J Ciston, AM Minor, C Ophus
Ultramicroscopy 176, 170-176, 2017
932017
Direct measurement of nanostructural change during in situ deformation of a bulk metallic glass
TC Pekin, J Ding, C Gammer, B Ozdol, C Ophus, M Asta, RO Ritchie, ...
Nature communications 10 (1), 2445, 2019
592019
Local nanoscale strain mapping of a metallic glass during in situ testing
C Gammer, C Ophus, TC Pekin, J Eckert, AM Minor
Applied Physics Letters 112 (17), 2018
542018
In situ nanobeam electron diffraction strain mapping of planar slip in stainless steel
TC Pekin, C Gammer, J Ciston, C Ophus, AM Minor
Scripta Materialia 146, 87-90, 2018
532018
Evaluation fo Neon Focused Ion Beam Milling for TEM sample Preparation
TC Pekin, FI Allen, AM Minor
Microscopy and Microanalysis 22 (S3), 146-147, 2016
332016
Overcoming information reduced data and experimentally uncertain parameters in ptychography with regularized optimization
M Schloz, TC Pekin, Z Chen, W Van den Broek, DA Muller, CT Koch
Optics Express 28 (19), 28306-28323, 2020
282020
Functional materials under stress: In situ TEM observations of structural evolution
Y Deng, R Zhang, TC Pekin, C Gammer, J Ciston, P Ercius, C Ophus, ...
Advanced Materials 32 (27), 1906105, 2020
202020
Fast grain mapping with sub-nanometer resolution using 4D-STEM with grain classification by principal component analysis and non-negative matrix factorization
FI Allen, TC Pekin, A Persaud, SJ Rozeveld, GF Meyers, J Ciston, ...
Microscopy and microanalysis 27 (4), 794-803, 2021
132021
A three-dimensional reconstruction algorithm for scanning transmission electron microscopy data from a single sample orientation
HG Brown, PM Pelz, SL Hsu, Z Zhang, R Ramesh, K Inzani, E Sheridan, ...
Microscopy and Microanalysis 28 (5), 1632-1640, 2022
92022
Towards ptychography with structured illumination, and a derivative-based reconstruction algorithm
W Van den Broek, M Schloz, TC Pekin, PM Pelz, PH Lu, M Kruth, V Grillo, ...
Microscopy and Microanalysis 25 (S2), 58-59, 2019
82019
py4DSTEM: a software package for multimodal analysis of four-dimensional scanning transmission electron microscopy datasets. arXiv e-prints 2020
BH Savitzky, LA Hughes, SE Zeltmann, HG Brown, S Zhao, PM Pelz, ...
arXiv preprint arXiv:2003.09523, 2003
62003
Deep reinforcement learning for data-driven adaptive scanning in ptychography
M Schloz, J Müller, TC Pekin, W Van den Broek, J Madsen, T Susi, ...
Scientific Reports 13 (1), 8732, 2023
52023
LiberTEM/LiberTEM: 0.13. 1
A Clausen, L Houben, J Müller, A Stewart, R Chandra, ...
Physik Nanoskaliger Systeme, 2023
52023
Evaluating the effects of pillar shape and gallium ion beam damage on the mechanical properties of single crystal aluminum nanopillars
Y Yang, SY Wang, B Xiang, S Yin, TC Pekin, X Li, R Zhang, K Yano, ...
Journal of Materials Research 36, 2515-2528, 2021
52021
Direct Observation of SRO effect of Ti-6Al Alloy Using Energy-filtered TEM and Scanning Nanobeam Electron Diffraction
R Zhang, R Traylor, T Pekin, B Ozdol, C Ophus, AM Minor
Microscopy and Microanalysis 24 (S1), 210-211, 2018
32018
Comparison of Compression Methods for Ptychographic Reconstructions through Decomposition of the Diffraction Patterns in Orthonormal Bases
A Gladyshev, M Schloz, TC Pekin, CT Koch
Microscopy and Microanalysis 28 (S1), 394-397, 2022
22022
Adaptive Scanning in Ptychography through Deep Reinforcement Learning
M Schloz, J Müller, T Pekin, W Van den Broek, C Koch
Microscopy and Microanalysis 27 (S1), 818-821, 2021
22021
Imaging Short-range Order and Extracting 3-D Strain Tensor Using Energy-filtered 4D-STEM Techniques
R Zhang, S Zeltmann, C Ophus, B Savitzky, T Pekin, E Rothchild, ...
Microscopy and Microanalysis 26 (S2), 936-938, 2020
22020
Ab initio electrostatic potentials for 4D-stem ptychographic reconstruction
J Madsen, C Hofer, TC Pekin, M Schloz, TA Bui, C Koch, TJ Pennycook, ...
Microscopy and Microanalysis 28 (S1), 392-393, 2022
12022
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