| Identifying implementation bugs in machine learning based image classifiers using metamorphic testing A Dwarakanath, M Ahuja, S Sikand, RM Rao, RP Bose, N Dubash, ... Proceedings of the 27th ACM SIGSOFT International Symposium on Software …, 2018 | 212 | 2018 |
| Verification by metamorphic testing of applications that utilize artificial intelligence A Dwarakanath, S Podder, N Dubash, KP Durg, M Ahuja, RM Rao, ... US Patent 10,438,118, 2019 | 11 | 2019 |
| Utilizing object oriented programming to validate machine learning classifiers and word embeddings S Podder, N Dubash, N Ramachandra, M Ahuja, S SIKAND US Patent App. 17/108,438, 2021 | 3 | 2021 |
| Adversarial patches including pixel blocks for machine learning M Ahuja, S Sikand, A Dwarakanath, S Podder US Patent 10,997,470, 2021 | 3 | 2021 |
| How much SPACE do metrics have in GenAI assisted software development? S Sikand, KK Phokela, VS Sharma, K Singi, V Kaulgud, T Tung, P Sharma, ... Proceedings of the 17th Innovations in Software Engineering Conference, 1-5, 2024 | 2 | 2024 |
| Smart Prompt Advisor: Multi-Objective Prompt Framework for Consistency and Best Practices KK Phokela, S Sikand, K Singi, K Dey, VS Sharma, V Kaulgud 2023 38th IEEE/ACM International Conference on Automated Software …, 2023 | 1 | 2023 |
| Green AI Quotient: Assessing Greenness of AI-based software and the way forward S Sikand, VS Sharma, V Kaulgud, S Podder 2023 38th IEEE/ACM International Conference on Automated Software …, 2023 | 1 | 2023 |
| ENERGY USAGE DETERMINATION FOR MACHINE LEARNING VS Sharma, VS Kaulgud, J Bera, S Sikand, AP Burden US Patent App. 17/663,750, 2023 | | 2023 |
| Recruitment process graph based unsupervised anomaly detection S Sikand, V Subramanian, N Dubash, S Podder US Patent App. 17/152,524, 2021 | | 2021 |
Manish AhujaR&D Specialist在 accenture.com 的电子邮件经过验证
Manish AhujaR&D Specialist在 accenture.com 的电子邮件经过验证
Anurag DwarakanathMachine Learning Manager, Amazon在 amazon.com 的电子邮件经过验证