| Design for a compact high-accuracy CMM GN Peggs, AJ Lewis, S Oldfield CIRP Annals-Manufacturing Technology 48 (1), 417-420, 1999 | 201 | 1999 |
| Multi-channel absolute distance measurement system with sub ppm-accuracy and 20 m range using frequency scanning interferometry and gas absorption cells J Dale, B Hughes, AJ Lancaster, AJ Lewis, AJH Reichold, MS Warden Optics Express 22 (20), 24869-24893, 2014 | 130 | 2014 |
| Laser tracker error determination using a network measurement B Hughes, A Forbes, A Lewis, W Sun, D Veal, K Nasr Measurement Science and Technology 22 (4), 045103, 2011 | 107 | 2011 |
| Advances in traceable nanometrology at the National Physical Laboratory R Leach, J Haycocks, K Jackson, A Lewis, S Oldfield, A Yacoot Nanotechnology 12 (1), R1, 2001 | 100 | 2001 |
| Performance evaluation of a cheap, open source, digital environmental monitor based on the Raspberry Pi AJ Lewis, M Campbell, P Stavroulakis Measurement, 2016 | 77 | 2016 |
| Advice from the CCL on the use of unstabilized lasers as standards of wavelength: the helium–neon laser at 633 nm JA Stone, JE Decker, P Gill, P Juncar, A Lewis, GD Rovera, M Viliesid Metrologia 46 (1), 11, 2008 | 77 | 2008 |
| Measurement of length, surface form and thermal expansion coefficient of length bars up to 1.5 m using multiple-wavelength phase-stepping interferometry A Lewis Measurement Science and Technology 5 (6), 694, 1994 | 57 | 1994 |
| Absolute length measurement using multiple-wavelength phase-stepping interferometry AJ Lewis PhD Thesis, 324, 1993 | 49 | 1993 |
| Dual-Sweep Frequency Scanning Interferometry Using Four Wave Mixing JJ Martinez, MA Campbell, MS Warden, EB Hughes, NJ Copner, AJ Lewis IEEE Photonics Technology Letters 27 (7), 733-736, 2015 | 44 | 2015 |
| The new mise en pratique for the metre—a review of approaches for the practical realization of traceable length metrology from 10− 11 m to 1013 m R Schödel, A Yacoot, A Lewis Metrologia 58 (5), 052002, 2021 | 31 | 2021 |
| Fully traceable miniature CMM with submicrometer uncertainty AJ Lewis Proceedings of SPIE 5190, 265-276, 2003 | 26 | 2003 |
| Measuring in three dimensions at the mesoscopic level GN Peggs, A Lewis, RK Leach Proc. ASPE Winter Topical Meeting—Machines and Processes for Micro-scale …, 2003 | 23 | 2003 |
| Long-term study of gauge block interferometer performance and gauge block stability AJ Lewis, B Hughes, PJE Aldred Metrologia 47 (4), 473, 2010 | 20 | 2010 |
| CCL-K2: long gauge block measurement by interferometry A Lewis Metrologia 40 (1A), 04004-04004, 2003 | 20* | 2003 |
| Development of a high-accuracy multi-sensor, multi-target coordinate metrology system using frequency scanning interferometry and multilateration B Hughes, MA Campbell, AJ Lewis, GM Lazzarini, N Kay Videometrics, Range Imaging, and Applications XIV 10332, 1033202, 2017 | 19 | 2017 |
| ASME B89. 4.19 standard for laser tracker verification–experiences and optimisations KM Nasr, AB Forbes, B Hughes, A Lewis International Journal of Metrology and Quality Engineering 3 (2), 89-95, 2012 | 16 | 2012 |
| Arcuate arm profilometry-traceable metrology for large mirrors A Lewis, S Oldfield, M Callender, A Efstathiou, A Gee, C King, D Walker Proceedings of Simposio de Metrologa, 101-105, 2006 | 12 | 2006 |
| Report on the analysis of the MEMSTAND survey on standardisation of microsystems technology L Singleton, R Leach, A Lewis, Z Cui MEMSTAND Project IST-2001-37682, 2002 | 12 | 2002 |
| Swing arm profilometer for large telescope mirror element metrology MJ Callender, A Efstathiou, CW King, DD Walker, AE Gee, AJ Lewis, ... SPIE Astronomical Telescopes + Instrumentation, 62732R-62732R-12, 2006 | 11 | 2006 |
| Determination of misalignment and angular scale errors of a laser tracker using a new geometric model and a multi-target network approach A Lewis, B Hughes, A Forbes, W Sun, D Veal, K Nasr MacroScale, 2011 | 10 | 2011 |
Ben HughesNational Physical Laboratory在 npl.co.uk 的电子邮件经过验证
