| On the thermal models for resistive random access memory circuit simulation JB Roldán, G González-Cordero, R Picos, E Miranda, F Palumbo, ... Nanomaterials 11 (5), 1261, 2021 | 60 | 2021 |
| Temperature of conductive nanofilaments in hexagonal boron nitride based memristors showing threshold resistive switching M Lanza, F Palumbo, Y Shi, F Aguirre, S Boyeras, B Yuan, E Yalon, ... Advanced Electronic Materials 8 (8), 2100580, 2022 | 25 | 2022 |
| Role of reactive gas on the structure and properties of titanium nitride films grown by plasma enhanced atomic layer deposition I Krylov, X Xu, E Zoubenko, K Weinfeld, S Boyeras, F Palumbo, ... Journal of Vacuum Science & Technology A 36 (6), 2018 | 16 | 2018 |
| Impact of bilayered oxide stacks on the breakdown transients of metal–oxide–semiconductor devices: An experimental study SM Pazos, S Boyeras Baldomá, FL Aguirre, I Krylov, M Eizenberg, ... Journal of Applied Physics 127 (17), 2020 | 12 | 2020 |
| Anomalous out-of-equilibrium dynamics in the spin-ice material Dy2Ti2O7 under moderate magnetic fields PC Guruciaga, L Pili, S Boyeras, D Slobinsky, SA Grigera, RA Borzi Journal of Physics: Condensed Matter 32 (42), 425804, 2020 | 4 | 2020 |
| Analytic circuit model for thermal drying behavior of electronic inks G Maroli, S Boyeras, H Giannetta, S Pazos, J Gak, AR Oliva, MA Volpe, ... Frontiers in Electronics 3, 1060197, 2023 | 3 | 2023 |
| Breakdown transients in high-k multilayered MOS stacks: Role of the oxide–oxide thermal boundary resistance S Boyeras Baldomá, SM Pazos, FL Aguirre, FR Palumbo Journal of Applied Physics 128 (3), 2020 | 3 | 2020 |
| Wear-out and breakdown of Ta2O5/Nb: SrTiO3 stacks SB Baldomá, SM Pazos, FL Aguirre, G Ankonina, L Kornblum, E Yalon, ... Solid-State Electronics 198, 108462, 2022 | 1 | 2022 |
| Progressive Breakdown on Bi-Layered Gate Oxide Stacks S Boyeras, SM Pazos, FL Aguirre, H Giannetta, C Delgado, F Palumbo 2019 34th Symposium on Microelectronics Technology and Devices (SBMicro), 1-4, 2019 | 1 | 2019 |
| Study of the electrical parameters drift due to mechanical stress in coupled conductors path on flexible polymeric substrate HMR Giannetta, G Maroli, S Pazos, S Boyeras, F Aguirre, A Fontana, ... 2022 Argentine Conference on Electronics (CAE), 37-40, 2022 | | 2022 |
Felix PalumboConsejo de Investigaciones Cientificas y Tecnicas - UTN在 conicet.gov.ar 的电子邮件经过验证
