关注
Santiago Boyeras Baldomá
Santiago Boyeras Baldomá
未知所在单位机构
在 frba.utn.edu.ar 的电子邮件经过验证
标题
引用次数
引用次数
年份
On the thermal models for resistive random access memory circuit simulation
JB Roldán, G González-Cordero, R Picos, E Miranda, F Palumbo, ...
Nanomaterials 11 (5), 1261, 2021
602021
Temperature of conductive nanofilaments in hexagonal boron nitride based memristors showing threshold resistive switching
M Lanza, F Palumbo, Y Shi, F Aguirre, S Boyeras, B Yuan, E Yalon, ...
Advanced Electronic Materials 8 (8), 2100580, 2022
252022
Role of reactive gas on the structure and properties of titanium nitride films grown by plasma enhanced atomic layer deposition
I Krylov, X Xu, E Zoubenko, K Weinfeld, S Boyeras, F Palumbo, ...
Journal of Vacuum Science & Technology A 36 (6), 2018
162018
Impact of bilayered oxide stacks on the breakdown transients of metal–oxide–semiconductor devices: An experimental study
SM Pazos, S Boyeras Baldomá, FL Aguirre, I Krylov, M Eizenberg, ...
Journal of Applied Physics 127 (17), 2020
122020
Anomalous out-of-equilibrium dynamics in the spin-ice material Dy2Ti2O7 under moderate magnetic fields
PC Guruciaga, L Pili, S Boyeras, D Slobinsky, SA Grigera, RA Borzi
Journal of Physics: Condensed Matter 32 (42), 425804, 2020
42020
Analytic circuit model for thermal drying behavior of electronic inks
G Maroli, S Boyeras, H Giannetta, S Pazos, J Gak, AR Oliva, MA Volpe, ...
Frontiers in Electronics 3, 1060197, 2023
32023
Breakdown transients in high-k multilayered MOS stacks: Role of the oxide–oxide thermal boundary resistance
S Boyeras Baldomá, SM Pazos, FL Aguirre, FR Palumbo
Journal of Applied Physics 128 (3), 2020
32020
Wear-out and breakdown of Ta2O5/Nb: SrTiO3 stacks
SB Baldomá, SM Pazos, FL Aguirre, G Ankonina, L Kornblum, E Yalon, ...
Solid-State Electronics 198, 108462, 2022
12022
Progressive Breakdown on Bi-Layered Gate Oxide Stacks
S Boyeras, SM Pazos, FL Aguirre, H Giannetta, C Delgado, F Palumbo
2019 34th Symposium on Microelectronics Technology and Devices (SBMicro), 1-4, 2019
12019
Study of the electrical parameters drift due to mechanical stress in coupled conductors path on flexible polymeric substrate
HMR Giannetta, G Maroli, S Pazos, S Boyeras, F Aguirre, A Fontana, ...
2022 Argentine Conference on Electronics (CAE), 37-40, 2022
2022
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