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Qinghao Zhang
Qinghao Zhang
Department of Electrical Engineering, Tsinghua University
在 mails.tsinghua.edu.cn 的电子邮件经过验证
标题
引用次数
引用次数
年份
A fast IGBT junction temperature estimation approach based on ON-state voltage drop
Y Yang, Q Zhang, P Zhang
IEEE Transactions on Industry Applications 57 (1), 685-693, 2020
642020
Space vector modulation method for simultaneous common mode voltage and circulating current reduction in parallel three-level inverters
Q Zhang, X Xing, K Sun
IEEE Transactions on Power Electronics 34 (4), 3053-3066, 2018
502018
A flexible power control for PV-battery hybrid system using cascaded H-bridge converters
Q Zhang, K Sun
IEEE Journal of Emerging and Selected Topics in Power Electronics 7 (4 …, 2018
402018
A novel method for monitoring the junction temperature of SiC MOSFET on-line based on on-state resistance
Q Zhang, Y Yang, P Zhang
2019 22nd International Conference on Electrical Machines and Systems (ICEMS …, 2019
322019
An online junction temperature monitoring method for SiC MOSFETs based on a novel gate conduction model
Q Zhang, P Zhang
IEEE Transactions on Power Electronics 36 (10), 11087-11096, 2021
312021
Control of PV battery hybrid system using Cascaded H Bridge converter
Q Zhang
2017 IEEE 3rd International Future Energy Electronics Conference and ECCE …, 2017
252017
A high-frequency online junction temperature monitoring method for SiC MOSFETs based on on-state resistance with aging compensation
Q Zhang, G Lu, Y Yang, P Zhang
IEEE Transactions on Industrial Electronics 70 (7), 7393-7405, 2022
202022
A novel online chip-related aging monitoring method for IGBTs based on the leakage current
Q Zhang, Y Yang, P Zhang
IEEE Transactions on Industrial Electronics 70 (2), 2003-2014, 2022
152022
A novel on-line IGBT junction temperature measurement method based on on-state voltage drop
Y Yang, Q Zhang, P Zhang
2019 22nd International Conference on Electrical Machines and Systems (ICEMS …, 2019
132019
Effects of converter harmonic voltages on transformer insulation ageing and an online monitoring method for interlayer insulation
G Lu, D Zheng, Q Zhang, P Zhang
IEEE Transactions on Power Electronics 37 (3), 3504-3514, 2021
122021
A junction temperature smoothing control method for SiC MOSFETs based on the gate driving signal delay
Q Zhang, P Zhang
IEEE Transactions on Industrial Electronics 71 (3), 3122-3132, 2023
112023
A novel junction temperature balance control method for typical three-phase converters based on a hybrid modulation strategy
Q Zhang, P Zhang
IEEE Transactions on Power Electronics 38 (3), 3917-3927, 2022
112022
A high-sensitivity online junction temperature monitoring method for SiC mosfets based on the turn-on drain–source current overshoot
Q Zhang, G Lu, P Zhang
IEEE Transactions on Power Electronics 37 (12), 15505-15516, 2022
112022
Online monitoring for underground power cable insulation based on resonance frequency analysis under chirp signal injection
Y Wu, Y Yang, Q Lin, Q Zhang, P Zhang
IEEE Transactions on Industrial Electronics 70 (2), 1961-1972, 2022
102022
A novel online monitoring strategy for the localized grounding insulation defect of converter transformers based on converter switching states control
G Lu, Q Zhang, D Zheng, P Zhang
IEEE Transactions on Power Electronics 37 (9), 11124-11134, 2022
82022
A novel model of the aging effect on the on-state resistance of sic power mosfets for high-accuracy package-related aging evaluation
Q Zhang, P Zhang
IEEE Transactions on Industrial Electronics 70 (9), 9495-9504, 2022
72022
The online stator winding insulation monitoring for PMSG-PWM rectifier system under various working conditions
D Zheng, G Lu, Y Yang, Q Zhang, P Zhang
IECON 2021–47th Annual Conference of the IEEE Industrial Electronics Society …, 2021
62021
Online Detection and Classification of Interturn and Groundwall Insulation Aging Based on Broadband Common-Mode Impedance Spectrum
D Zheng, G Lu, Y Wu, Q Zhang, P Zhang
IEEE Transactions on Industrial Electronics 71 (3), 3142-3153, 2023
52023
一种基于门极电压阈值检测的 SiC MOSFET 结温在线监测方法
张擎昊, 张品佳
中国电机工程学报 40 (18), 5742-5750, 2020
32020
A junction temperature and package aging decoupling evaluating method for SiC MOSFETs based on the turn-on drain-source current overshoot
Q Zhang, P Zhang
IEEE Transactions on Power Electronics, 2023
22023
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