| A novel scalable method for machine degradation assessment using deep convolutional neural network P Li, X Jia, J Feng, F Zhu, M Miller, LY Chen, J Lee Measurement 151, 107106, 2020 | 30 | 2020 |
| An online virtual metrology model with sample selection for the tracking of dynamic manufacturing processes with slow drift J Feng, X Jia, F Zhu, J Moyne, J Iskandar, J Lee IEEE transactions on semiconductor manufacturing 32 (4), 574-582, 2019 | 27 | 2019 |
| Methodology for important sensor screening for fault detection and classification in semiconductor manufacturing F Zhu, X Jia, M Miller, X Li, F Li, Y Wang, J Lee IEEE Transactions on Semiconductor Manufacturing 34 (1), 65-73, 2020 | 21 | 2020 |
| Adaptive virtual metrology method based on Just-in-time reference and particle filter for semiconductor manufacturing H Cai, J Feng, F Zhu, Q Yang, X Li, J Lee Measurement 168, 108338, 2021 | 19 | 2021 |
| Cross trajectory gaussian process regression model for battery health prediction J Feng, X Jia, H Cai, F Zhu, X Li, J Lee Journal of modern power systems and clean energy 9 (5), 1217-1226, 2020 | 16 | 2020 |
| An intelligent system for offshore wind farm maintenance scheduling optimization considering turbine production loss J Feng, X Jia, F Zhu, Q Yang, Y Pan, J Lee Journal of Intelligent & Fuzzy Systems 37 (5), 6911-6923, 2019 | 14 | 2019 |
| A reinforced noise resistant correlation method for bearing condition monitoring W Fan, Z Chen, Y Li, F Zhu, M Xie IEEE Transactions on Automation Science and Engineering 20 (2), 995-1006, 2022 | 11 | 2022 |
| Development of An Integrated Framework for Cyber-Physical System (CPS)-Enabled Rehabilitation System J Feng, F Zhu, P Li, H Davari, J Lee International Journal of Prognostics and Health Management 12 (4), 2021 | 6 | 2021 |
| Cross-chamber data transferability evaluation for fault detection and classification in semiconductor manufacturing F Zhu, X Jia, W Li, M Xie, L Li, J Lee IEEE Transactions on Semiconductor Manufacturing 36 (1), 68-77, 2022 | 5 | 2022 |
| Profile Abstract: an optimization-based subset selection and summarization method for profile data mining F Zhu, J Feng, M Xie, L Li, J Lei, J Lee IEEE Transactions on Industrial Informatics 19 (9), 9337-9348, 2022 | 4 | 2022 |
| A deep learning based method for cutting parameter optimization for band saw machine P Li, J Feng, F Zhu, H Davari, LY Chen, J Lee Annual Conference of the PHM Society 11 (1), 2019 | 3 | 2019 |
| A Semi-Supervised Failure Knowledge Graph Construction Method for Decision Support in Operations and Maintenance Y Ding, H Li, F Zhu, Z Wang, W Peng, M Xie IEEE Transactions on Industrial Informatics, 2023 | 1 | 2023 |
| A remaining useful life prediction framework for aero-engine using information entropy-based criterion and PCA-RVM X Li, L Yang, X Liu, F Zhu 2022 13th International Conference on Reliability, Maintainability, and …, 2022 | 1 | 2022 |
| Trace Abstraction: A Novel Method to Enhance Fault Detection in Semiconductor Manufacturing Processes with An Optimization Approach J Feng, F Zhu, Z Liu, J Zhang, L Hua, S Wang, M Xie 2021 Global Reliability and Prognostics and Health Management (PHM-Nanjing), 1-6, 2021 | 1 | 2021 |
| Knowledge-informed wheel wear prediction method for high-speed train using multisource signal data C Chen, F Zhu, Z Xu, Q Xie, SM Lo, KL Tsui, L Li IEEE Transactions on Instrumentation and Measurement 73, 1-12, 2024 | | 2024 |
| An Optimization-Based Sample Selection Method Considering Sample Redundancy and Usefulness F Zhu, J Feng, Z Su, M Xie International conference on the Efficiency and Performance Engineering …, 2023 | | 2023 |
| A Novel Fault Detection and Classification Approach in Semiconductor Manufacturing Using Time Series Alignment Kernel F Zhu University of Cincinnati, 2020 | | 2020 |
Jianshe FengSun Yat-Sen University在 mail.sysu.edu.cn 的电子邮件经过验证
