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Tristan Dubois
Tristan Dubois
University of Bordeaux / IMS Laboratory
在 u-bordeaux.fr 的电子邮件经过验证
标题
引用次数
引用次数
年份
Probe characterization for electromagnetic near-field studies
S Jarrix, T Dubois, R Adam, P Nouvel, B Azais, D Gasquet
IEEE Transactions on Instrumentation and Measurement 59 (2), 292-300, 2009
642009
Near-field electromagnetic characterization and perturbation of logic circuits
T Dubois, S Jarrix, A Penarier, P Nouvel, D Gasquet, L Chusseau, B Azais
IEEE Transactions on Instrumentation and Measurement 57 (11), 2398-2404, 2008
642008
Effect of low and high power continuous wave electromagnetic interference on a microwave oscillator system: From VCO to PLL to QPSK receiver
T Dubois, JJ Laurin, J Raoult, S Jarrix
IEEE Transactions on electromagnetic compatibility 56 (2), 286-293, 2013
282013
Characterization and model of temperature effect on the conducted immunity of Op-Amp
T Dubois, S Hairoud, MHG de Oliveira, H Frémont, G Duchamp
Microelectronics Reliability 55 (9-10), 2055-2060, 2015
152015
Immunity measurement and modeling of an ADC embedded in a microcontroller using RFIP technique
A Ayed, T Dubois, JL Levant, G Duchamp
IEEE Transactions on Electromagnetic Compatibility 57 (5), 955-962, 2015
152015
Comparison of voltages induced in an electronic equipment during far field and near field normative radiated immunity tests
A Durier, SB Dhia, T Dubois
2019 International Symposium on Electromagnetic Compatibility-EMC EUROPE …, 2019
142019
Conducted immunity of three op-amps using the dpi measurement technique and vhdl-ams modeling
S Hairoud, T Dubois, A Tetelin, G Duchamp
2013 9th International Workshop on Electromagnetic Compatibility of …, 2013
122013
Effects of process-voltage-temperature (PVT) variations on low-side MOSFET circuit conducted emission
N Baptistat, K Abouda, G Duchamp, T Dubois
2019 12th International Workshop on the Electromagnetic Compatibility of …, 2019
112019
EMC susceptibility characterization of an operational amplifier-based circuit combining different technique
M Girard, T Dubois, G Duchamp, P Hoffmann
2016 International Symposium on Electromagnetic Compatibility-EMC EUROPE …, 2016
102016
Effects of HPEM stress on GaAs low-noise amplifier from circuit to component scale
M Girard, T Dubois, P Hoffmann, G Duchamp
Microelectronics Reliability 88, 914-919, 2018
92018
Étude de l'effet d'ondes électromagnétiques sur le fonctionnement de circuits électroniques–Mise en place d'une méthode de test des systèmes
T Dubois
Université Montpellier II-Sciences et Techniques du Languedoc, 2009
92009
Modeling of a current injection system for susceptibility study
G Mejecaze, L Curos, T Dubois, JM Vinassa, F Puybaret
IEEE Transactions on Electromagnetic Compatibility 62 (6), 2737-2746, 2020
82020
Multiport ICIM-CI modeling approach applied to a bandgap voltage reference
SH Airieau, T Dubois, G Duchamp, A Durier
2016 International Symposium on Electromagnetic Compatibility-EMC EUROPE …, 2016
82016
Surface equivalent modeling of layered composite material
A Kader, M Klingler, T Dubois, G Duchamp, G Ruffié, F Bonnaudin
2013 International Symposium on Electromagnetic Compatibility, 573-578, 2013
82013
To improve the variability of one complex system with the MKME
M Breant, O Maurice, G Duchamp, T Dubois
International Symposium on Electromagnetic Compatibility-EMC EUROPE, 1-6, 2012
82012
Electromagnetic susceptibility studies of Op. Amps. and a VCO for a PLL application
T Dubois, S Jarrix, J Raoult, A Pénarier, P Nouvel, D Gasquet, B Azais
EMC Compo 2009, xx-xx, 2009
72009
Methodology to test automotive electrical components to wideband pulse interferences
T Picon, T Dubois, M Klingler, G Duchamp
IEEE Transactions on Electromagnetic Compatibility 62 (5), 1651-1660, 2020
62020
Effects of ageing on the conducted immunity of a voltage reference: Experimental study and modelling approach
S Hairoud-Airieau, G Duchamp, T Dubois, JY Delétage, A Durier, ...
Microelectronics Reliability 76, 674-679, 2017
62017
Failure mechanism study and immunity modeling of an embedded analog-to-digital converter based on immunity measurements
A Ayed, T Dubois, JL Levant, G Duchamp
Microelectronics Reliability 55 (9-10), 2067-2071, 2015
62015
A new method for the characterization of electronic components immunity
A Ayed, T Dubois, JL Levant, G Duchamp
IEEE Transactions on Instrumentation and Measurement 64 (9), 2496-2503, 2015
62015
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