| Electric field distribution using floating metal guard rings edge-termination for Schottky diodes K Driche, S Rugen, N Kaminski, H Umezawa, H Okumura, E Gheeraert Diamond and Related Materials 82, 160-164, 2018 | 29 | 2018 |
| Gaining Confidence-A Review of Silicon Carbide's Reliability Status N Kaminski, S Rugen, F Hoffmann 2019 IEEE International Reliability Physics Symposium (IRPS), 1-7, 2019 | 22 | 2019 |
| Investigation of the turn-on behaviour of silicon pin-diodes and SiC-Schottky-diodes and its impact on the anti-parallel IGBT S Rugen, C Bödeker, I Kortazar, I Larrazabal, P Friedrichs, N Kaminski 2016 18th European Conference on Power Electronics and Applications (EPE'16 …, 2016 | 8 | 2016 |
| Power Cycling on Lateral GaN and β-Ga2O3 Transistors S Rugen, A Brunko, F Hoffmann, N Kaminski Materials Science Forum 1092, 157-164, 2023 | 5 | 2023 |
| Impact of the sensing current density on PN-junction based temperature estimation methods for Si and SiC power devices F Hoffmann, S Rugen, D Silber, N Kaminski Microelectronics Reliability 114, 113834, 2020 | 4 | 2020 |
| Reliability of GaN power chip embedding in different stack up M Hammerl, M Abouie, S Rugen, A Sami, L Allirand, F Dresel, J Leib CIPS 2024; 13th International Conference on Integrated Power Electronics …, 2024 | 1 | 2024 |
| Dynamic Voltage Rise Control (DVRC) applied to SiC Bipolar Junction Transistors C Bödeker, S Rugen, N Kaminski Materials Science Forum 821, 826-829, 2015 | 1 | 2015 |
| Automotive Application Relevant Failure Mechanisms Under Cyclic Thermo-Mechanical Load M Hammerl, F Forndran, M Leicht, P Mönius, S Rugen, E Teuber 2024 36th International Symposium on Power Semiconductor Devices and ICs …, 2024 | | 2024 |
| Verbundvorhaben: Power2Power-Silizium-Leistungselektronik der nächsten Generation für Mobilität, Industrie und Stromnetze der CO2-freien Ära; Teilvorhaben: Zuverlässigkeit … N Kaminski, M Hanf, JH Peters, S Rugen Universität Bremen, Institut für elektrische Antriebe, Leistungselektronik …, 2023 | | 2023 |
| Investigation of Bipolar Degradation of 1.2 kV BJTs under Different Current and Temperature Conditions S Rugen, SG Sundaresan, R Singh, N Kaminski Materials Science Forum 1004, 464-471, 2020 | | 2020 |
Nando KaminskiFull Professor at University of Bremen在 uni-bremen.de 的电子邮件经过验证
Nando KaminskiFull Professor at University of Bremen在 uni-bremen.de 的电子邮件经过验证
Felix HoffmannSemikron Danfoss在 uni-bremen.de 的电子邮件经过验证