| Field emission induced-damage in the actuation paths of MEMS capacitive structures J Theocharis, M Koutsoureli, S Gardelis, G Konstantinidis, ... Microelectronics Reliability 114, 113760, 2020 | 4 | 2020 |
| Effect of Ambient on the Field Emission Induced-Damage in Dielectric-Less MEMS Capacitive Structures J Theocharis, S Gardelis, G Papaioannou IEEE Transactions on Device and Materials Reliability 22 (2), 205-216, 2022 | 2 | 2022 |
| A study of field emission current in MEMS capacitors with bottom electrode covered by dielectric film J Theocharis, D Birmpiliotis, S Gardelis, G Papaioannou Microelectronics Reliability 150, 115192, 2023 | 1 | 2023 |
| Impact of dielectric film thickness on field emission in MEMS capacitive switches J Theocharis, S Gardelis, G Papaioannou Microelectronics Reliability 138, 114649, 2022 | 1 | 2022 |
| Reliability tests on millimetre wave 100 nm gate length process for safe operating area evaluation methodology C Robin, S Delcourt, J Theocharis, K Neyrolles, D Langrez, J Latti, ... Microelectronics Reliability 150, 115230, 2023 | | 2023 |
