Data-driven fault diagnosis in end-of-line testing of complex products V Hirsch, P Reimann, B Mitschang 2019 IEEE International Conference on Data Science and Advanced Analytics …, 2019 | 34 | 2019 |
Analytical approach to support fault diagnosis and quality control in End-Of-Line testing V Hirsch, P Reimann, O Kirn, B Mitschang Procedia CIRP 72, 1333-1338, 2018 | 25 | 2018 |
Exploiting domain knowledge to address multi-class imbalance and a heterogeneous feature space in classification tasks for manufacturing data V Hirsch, P Reimann, B Mitschang Proceedings of the VLDB Endowment 13 (12), 3258-3271, 2020 | 19 | 2020 |
Incorporating economic aspects into recommendation ranking to reduce failure costs V Hirsch, P Reimann, B Mitschang Procedia CIRP 93, 747-752, 2020 | 7 | 2020 |
Exploiting domain knowledge to address class imbalance and a heterogeneous feature space in multi-class classification V Hirsch, P Reimann, D Treder-Tschechlov, H Schwarz, B Mitschang The VLDB Journal 32 (5), 1037-1064, 2023 | 5 | 2023 |