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Gyeong-Jun Yun
Gyeong-Jun Yun
School of Electrical Engineering, Korea Advanced Institute of Science and Technology (KAIST)
在 nobelab.kaist.ac.kr 的电子邮件经过验证 - 首页
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Mimicry of excitatory and inhibitory artificial neuron with leaky integrate-and-fire function by a single MOSFET
JK Han, M Seo, WK Kim, MS Kim, SY Kim, MS Kim, GJ Yun, GB Lee, ...
IEEE Electron Device Letters 41 (2), 208-211, 2019
852019
Cointegration of single-transistor neurons and synapses by nanoscale CMOS fabrication for highly scalable neuromorphic hardware
JK Han, J Oh, GJ Yun, D Yoo, MS Kim, JM Yu, SY Choi, YK Choi
Science Advances 7 (32), eabg8836, 2021
672021
A temperature sensor with a thermillator
MW Lee, JK Han, GJ Yun, JM Yu, GB Lee, SJ Han, YK Choi
IEEE Electron Device Letters 42 (11), 1654-1657, 2021
142021
A poly‐crystalline silicon nanowire transistor with independently controlled double‐gate for physically unclonable function by multi‐states and self‐destruction
JM Yu, GJ Yun, MS Kim, JK Han, DJ Kim, YK Choi
Advanced Electronic Materials 7 (5), 2000989, 2021
142021
One biristor-two transistor (1B2T) neuron with reduced output voltage and pulsewidth for energy-efficient neuromorphic hardware
JK Han, GJ Yun, SJ Han, JM Yu, YK Choi
IEEE Transactions on Electron Devices 68 (1), 430-433, 2020
72020
Ternary logic decoder using independently controlled double-gate Si-NW MOSFETs
SJ Han, JK Han, MS Kim, GJ Yun, JM Yu, IW Tcho, M Seo, GB Lee, ...
Scientific reports 11 (1), 13018, 2021
52021
A steep-slope phenomenon by gate charge pumping in a MOSFET
MS Kim, GJ Yun, WK Kim, M Seo, DJ Kim, JM Yu, JK Han, J Hur, GB Lee, ...
IEEE Electron Device Letters 43 (4), 521-524, 2022
22022
Ultra-fast data sanitization of SRAM by back-biasing to resist a cold boot attack
SJ Han, JK Han, GJ Yun, MW Lee, JM Yu, YK Choi
Scientific reports 12 (1), 35, 2022
22022
Self-Heating Effects in 3-D Vertical-NAND (V-NAND) Flash Memory
GJ Yun, DH Yun, JY Park, SY Kim, YK Choi
IEEE Transactions on Electron Devices 67 (12), 5505-5510, 2020
2020
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