| Novel radiation-hardened-by-design (RHBD) 12T memory cell for aerospace applications in nanoscale CMOS technology J Guo, L Zhu, W Liu, H Huang, S Liu, T Wang, L Xiao, Z Mao IEEE Transactions on Very Large Scale Integration (VLSI) Systems 25 (5 …, 2017 | 81 | 2017 |
| Soft error hardened memory design for nanoscale complementary metal oxide semiconductor technology J Guo, L Xiao, T Wang, S Liu, X Wang, Z Mao IEEE Transactions on Reliability 64 (2), 596-602, 2015 | 46 | 2015 |
| Design and Evaluation of Low-Complexity Radiation Hardened CMOS Latch for Double-Node Upset Tolerance J Guo, S Liu, L Zhu, F Lombardi IEEE Transactions on Circuits and Systems I: Regular Papers, 2020 | 39 | 2020 |
| An efficient single and double-adjacent error correcting parallel decoder for the (24, 12) extended golay code P Reviriego, S Liu, L Xiao, JA Maestro IEEE Transactions on Very Large Scale Integration (VLSI) Systems 24 (4 …, 2015 | 36 | 2015 |
| A layout-based soft error vulnerability estimation approach for combinational circuits considering single event multiple transients (semts) X Cao, L Xiao, J Li, R Zhang, S Liu, J Wang IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2018 | 32 | 2018 |
| Low redundancy matrix-based codes for adjacent error correction with parity sharing S Liu, L Xiao, J Li, Y Zhou, Z Mao 2017 18th International Symposium on Quality Electronic Design (ISQED), 76-80, 2017 | 23 | 2017 |
| Result-Based Re-computation for Error-Tolerant Classification by a Support Vector Machine S Liu, P Reviriego, X Tang, W Tang, F Lombardi IEEE Transactions on Artificial Intelligence, 2020 | 19 | 2020 |
| Extend orthogonal Latin square codes for 32-bit data protection in memory applications S Liu, L Xiao, Z Mao Microelectronics Reliability 63, 278-283, 2016 | 19 | 2016 |
| A Double Error Correction Code for 32-Bit Data Words With Efficent Decoding S Liu, J Li, P Reviriego, M Ottavi, L Xiao IEEE Transactions on Device and Materials Reliability 18 (1), 125-127, 2018 | 17 | 2018 |
| Detection of Limited Magnitude Errors in Emerging Multilevel Cell Memories by One-Bit Parity (OBP) or Two-Bit Parity (TBP) S Liu, P Reviriego, F Lombardi IEEE Transactions on Emerging Topics in Computing, 2019 | 16 | 2019 |
| Single-event upset prediction in SRAMs account for on-transistor sensitive volume W Tianqi, L Xiao, M Huo, B Zhou, Q Chunhua, L Shanshan, C Xuebing, ... IEEE Transactions on Nuclear Science 62 (6), 3207-3215, 2015 | 16 | 2015 |
| Stochastic Dividers for Low Latency Neural Networks S Liu, X Tang, F Niknia, P Reviriego, W Liu, A Louri, F Lombardi IEEE Transactions on Circuits and Systems I: Regular Papers, 2021 | 15 | 2021 |
| Voting Margin: A Scheme for Error-Tolerant k Nearest Neighbors Classifiers for Machine Learning S Liu, P Reviriego, JA Hernández, F Lombardi IEEE Transactions on Emerging Topics in Computing, 2019 | 15 | 2019 |
| High-Performance CMOS Latch Designs for Recovering All Single and Double Node Upsets J Guo, S Liu, X Su, C Qi, F Lombardi IEEE Transactions on Aerospace and Electronic Systems, 2021 | 14 | 2021 |
| A scheme to reduce the number of parity check bits in orthogonal Latin square codes P Reviriego, S Liu, A Sánchez-Macián, L Xiao, JA Maestro IEEE Transactions on Reliability 66 (2), 518-528, 2017 | 14 | 2017 |
| Single event transient tolerant Bloom filter implementations A Sánchez-Macián, P Reviriego, JA Maestro, S Liu IEEE Transactions on Computers 66 (10), 1831-1836, 2017 | 14 | 2017 |
| Reducing the cost of triple adjacent error correction in double error correction orthogonal latin square codes S Liu, P Reviriego, L Xiao, JA Maestro IEEE Transactions on Device and Materials Reliability 16 (2), 269-271, 2016 | 13 | 2016 |
| Reduced Precision Redundancy for Reliable Processing of Data S Liu, K Chen, P Reviriego, W Liu, A Louri, F Lombardi IEEE Transactions on Emerging Topics in Computing, 2019 | 12 | 2019 |
| Error-Tolerant Computation for Voting Classifiers with Multiple Classes S Liu, P Reviriego, P Montuschi, F Lombardi IEEE Transactions on Vehicular Technology, 2020 | 10 | 2020 |
| Evaluating Direct Compare for Double Error-Correction Codes S Liu, P Reviriego, L Xiao IEEE Transactions on Device and Materials Reliability 17 (4), 802-804, 2017 | 9 | 2017 |
