| Degradation of crystalline silicon due to boron–oxygen defects T Niewelt, J Schön, W Warta, SW Glunz, MC Schubert IEEE Journal of Photovoltaics 7 (1), 383-398, 2016 | 177 | 2016 |
| Understanding the light‐induced degradation at elevated temperatures: Similarities between multicrystalline and floatzone p‐type silicon T Niewelt, F Schindler, W Kwapil, R Eberle, J Schön, MC Schubert Progress in Photovoltaics: Research and Applications 26 (8), 533-542, 2018 | 127 | 2018 |
| Light-induced activation and deactivation of bulk defects in boron-doped float-zone silicon T Niewelt, M Selinger, NE Grant, W Kwapil, JD Murphy, MC Schubert Journal of Applied Physics 121 (18), 2017 | 127 | 2017 |
| Reassessment of the intrinsic bulk recombination in crystalline silicon T Niewelt, B Steinhauser, A Richter, B Veith-Wolf, A Fell, B Hammann, ... Solar Energy Materials and Solar Cells 235, 111467, 2022 | 95 | 2022 |
| Kinetics of carrier-induced degradation at elevated temperature in multicrystalline silicon solar cells W Kwapil, T Niewelt, MC Schubert Solar Energy Materials and Solar Cells 173, 80-84, 2017 | 94 | 2017 |
| Taking monocrystalline silicon to the ultimate lifetime limit T Niewelt, A Richter, TC Kho, NE Grant, RS Bonilla, B Steinhauser, ... Solar Energy Materials and Solar Cells 185, 252-259, 2018 | 63 | 2018 |
| Silicon‐based passivating contacts: The TOPCon route SW Glunz, B Steinhauser, JI Polzin, C Luderer, B Grübel, T Niewelt, ... Progress in Photovoltaics: Research and Applications 31 (4), 341-359, 2023 | 54 | 2023 |
| Gallium‐doped silicon for high‐efficiency commercial passivated emitter and rear solar cells NE Grant, PP Altermatt, T Niewelt, R Post, W Kwapil, MC Schubert, ... Solar RRL 5 (4), 2000754, 2021 | 53 | 2021 |
| Superacid-treated silicon surfaces: Extending the limit of carrier lifetime for photovoltaic applications NE Grant, T Niewelt, NR Wilson, EC Wheeler-Jones, J Bullock, M Al-Amin, ... IEEE Journal of Photovoltaics 7 (6), 1574-1583, 2017 | 48 | 2017 |
| Electrical characterization of the slow boron oxygen defect component in Czochralski silicon T Niewelt, J Schön, J Broisch, W Warta, M Schubert physica status solidi (RRL)–Rapid Research Letters 9 (12), 692-696, 2015 | 43 | 2015 |
| Thermal activation of hydrogen for defect passivation in poly-Si based passivating contacts JI Polzin, B Hammann, T Niewelt, W Kwapil, M Hermle, F Feldmann Solar Energy Materials and Solar Cells 230, 111267, 2021 | 38 | 2021 |
| Long-term stability of aluminum oxide based surface passivation schemes under illumination at elevated temperatures T Niewelt, W Kwapil, M Selinger, A Richter, MC Schubert IEEE Journal of Photovoltaics 7 (5), 1197-1202, 2017 | 38 | 2017 |
| Influence of dopant elements on degradation phenomena in B‐and Ga‐doped Czochralski‐grown silicon W Kwapil, J Dalke, R Post, T Niewelt Solar RRL 5 (5), 2100147, 2021 | 36 | 2021 |
| Spatially resolved impurity identification via temperature-and injection-dependent photoluminescence imaging LE Mundt, MC Schubert, J Schön, B Michl, T Niewelt, F Schindler, ... IEEE Journal of Photovoltaics 5 (5), 1503-1509, 2015 | 36 | 2015 |
| Temporary recovery of the defect responsible for light-and elevated temperature-induced degradation: Insights into the physical mechanisms behind LeTID W Kwapil, J Schön, T Niewelt, MC Schubert IEEE Journal of Photovoltaics 10 (6), 1591-1603, 2020 | 34 | 2020 |
| Fast in-situ photoluminescence analysis for a recombination parameterization of the fast BO defect component in silicon T Niewelt, S Mägdefessel, MC Schubert Journal of Applied Physics 120 (8), 2016 | 32 | 2016 |
| Broad range injection-dependent minority carrier lifetime from photoluminescence JA Giesecke, T Niewelt, M Rüdiger, M Rauer, MC Schubert, W Warta Solar energy materials and solar cells 102, 220-224, 2012 | 29 | 2012 |
| Characterization and modelling of the boron-oxygen defect activation in compensated n-type silicon J Schön, T Niewelt, J Broisch, W Warta, MC Schubert Journal of Applied Physics 118 (24), 2015 | 28 | 2015 |
| Radiative recombination in silicon photovoltaics: Modeling the influence of charge carrier densities and photon recycling A Fell, T Niewelt, B Steinhauser, FD Heinz, MC Schubert, SW Glunz Solar Energy Materials and Solar Cells 230, 111198, 2021 | 26 | 2021 |
| Identification of lifetime limiting defects by temperature-and injection-dependent photoluminescence imaging J Schön, A Youssef, S Park, LE Mundt, T Niewelt, S Mack, K Nakajima, ... Journal of Applied Physics 120 (10), 2016 | 23 | 2016 |
Martin C. SchubertHead of Department Quality Assurance, Characterization and Simulation, Fraunhofer ISE在 ise.fraunhofer.de 的电子邮件经过验证
