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Florian Klemme
Florian Klemme
Siemens EDA
在 siemens.com 的电子邮件经过验证
标题
引用次数
引用次数
年份
Impact of variability on processor performance in negative capacitance finfet technology
H Amrouch, G Pahwa, AD Gaidhane, CK Dabhi, F Klemme, O Prakash, ...
IEEE Transactions on Circuits and Systems I: Regular Papers 67 (9), 3127-3137, 2020
612020
Modeling emerging technologies using machine learning: Challenges and opportunities
F Klemme, J Prinz, VM van Santen, J Henkel, H Amrouch
Proceedings of the 39th International Conference on Computer-Aided Design, 1-9, 2020
282020
Machine learning for on-the-fly reliability-aware cell library characterization
F Klemme, H Amrouch
IEEE Transactions on Circuits and Systems I: Regular Papers 68 (6), 2569-2579, 2021
272021
Scalable machine learning to estimate the impact of aging on circuits under workload dependency
F Klemme, H Amrouch
IEEE Transactions on Circuits and Systems I: Regular Papers 69 (5), 2142-2155, 2022
212022
Cell library characterization using machine learning for design technology co-optimization
F Klemme, Y Chauhan, J Henkel, H Amrouch
Proceedings of the 39th International Conference on Computer-Aided Design, 1-9, 2020
212020
GNN4REL: Graph neural networks for predicting circuit reliability degradation
L Alrahis, J Knechtel, F Klemme, H Amrouch, O Sinanoglu
IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2022
182022
Machine learning for circuit aging estimation under workload dependency
F Klemme, H Amrouch
2021 IEEE International Test Conference (ITC), 37-46, 2021
152021
Impact of ncfet technology on eliminating the cooling cost and boosting the efficiency of google tpu
S Salamin, G Zervakis, F Klemme, H Kattan, Y Chauhan, J Henkel, ...
IEEE Transactions on Computers 71 (4), 906-918, 2021
122021
Efficient learning strategies for machine learning-based characterization of aging-aware cell libraries
F Klemme, H Amrouch
IEEE Transactions on Circuits and Systems I: Regular Papers 69 (12), 5233-5246, 2022
102022
Upheaving self-heating effects from transistor to circuit level using conventional eda tool flows
F Klemme, S Salamin, H Amrouch
2023 Design, Automation & Test in Europe Conference & Exhibition (DATE), 1-6, 2023
82023
On extracting reliability information from speed binning
ZP Najafi-Haghi, F Klemme, H Amrouch, HJ Wunderlich
2022 IEEE European Test Symposium (ETS), 1-4, 2022
62022
Intelligent methods for test and reliability
H Amrouch, J Anders, S Becker, M Betka, G Bleher, P Domanski, ...
2022 Design, Automation & Test in Europe Conference & Exhibition (DATE), 969-974, 2022
62022
Design close to the edge for advanced technology using machine learning and brain-inspired algorithms
H Amrouch, F Klemme, PR Genssler
2022 27th Asia and South Pacific Design Automation Conference (ASP-DAC), 493-499, 2022
62022
Cryogenic Embedded System to Support Quantum Computing: From 5nm FinFET to Full Processor
PR Genssler, F Klemme, SS Parihar, S Brandhofer, G Pahwa, I Polian, ...
IEEE Transactions on Quantum Engineering, 2023
52023
Transistor self-heating-aware synthesis for reliable digital circuit designs
F Klemme, H Amrouch
IEEE Transactions on Circuits and Systems I: Regular Papers, 2023
42023
Robust pattern generation for small delay faults under process variations
H Jafarzadeh, F Klemme, JD Reimer, ZP Najafi-Haghi, H Amrouch, ...
2023 IEEE International Test Conference (ITC), 111-116, 2023
32023
Design automation for cryogenic cmos circuits
VM Van Santen, M Walter, F Klemme, SS Parihar, G Pahwa, YS Chauhan, ...
2023 60th ACM/IEEE Design Automation Conference (DAC), 1-6, 2023
32023
Variability-aware approximate circuit synthesis via genetic optimization
K Balaskas, F Klemme, G Zervakis, K Siozios, H Amrouch, J Henkel
IEEE Transactions on Circuits and Systems I: Regular Papers 69 (10), 4141-4153, 2022
32022
Approximation-and Quantization-Aware Training for Graph Neural Networks
R Novkin, F Klemme, H Amrouch
IEEE Transactions on Computers, 2023
22023
Approximation-aware and quantization-aware training for graph neural networks
R Novkin, H Amrouch, F Klemme
Authorea Preprints, 2023
22023
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