Impact of variability on processor performance in negative capacitance finfet technology H Amrouch, G Pahwa, AD Gaidhane, CK Dabhi, F Klemme, O Prakash, ... IEEE Transactions on Circuits and Systems I: Regular Papers 67 (9), 3127-3137, 2020 | 61 | 2020 |
Modeling emerging technologies using machine learning: Challenges and opportunities F Klemme, J Prinz, VM van Santen, J Henkel, H Amrouch Proceedings of the 39th International Conference on Computer-Aided Design, 1-9, 2020 | 28 | 2020 |
Machine learning for on-the-fly reliability-aware cell library characterization F Klemme, H Amrouch IEEE Transactions on Circuits and Systems I: Regular Papers 68 (6), 2569-2579, 2021 | 27 | 2021 |
Scalable machine learning to estimate the impact of aging on circuits under workload dependency F Klemme, H Amrouch IEEE Transactions on Circuits and Systems I: Regular Papers 69 (5), 2142-2155, 2022 | 21 | 2022 |
Cell library characterization using machine learning for design technology co-optimization F Klemme, Y Chauhan, J Henkel, H Amrouch Proceedings of the 39th International Conference on Computer-Aided Design, 1-9, 2020 | 21 | 2020 |
GNN4REL: Graph neural networks for predicting circuit reliability degradation L Alrahis, J Knechtel, F Klemme, H Amrouch, O Sinanoglu IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2022 | 18 | 2022 |
Machine learning for circuit aging estimation under workload dependency F Klemme, H Amrouch 2021 IEEE International Test Conference (ITC), 37-46, 2021 | 15 | 2021 |
Impact of ncfet technology on eliminating the cooling cost and boosting the efficiency of google tpu S Salamin, G Zervakis, F Klemme, H Kattan, Y Chauhan, J Henkel, ... IEEE Transactions on Computers 71 (4), 906-918, 2021 | 12 | 2021 |
Efficient learning strategies for machine learning-based characterization of aging-aware cell libraries F Klemme, H Amrouch IEEE Transactions on Circuits and Systems I: Regular Papers 69 (12), 5233-5246, 2022 | 10 | 2022 |
Upheaving self-heating effects from transistor to circuit level using conventional eda tool flows F Klemme, S Salamin, H Amrouch 2023 Design, Automation & Test in Europe Conference & Exhibition (DATE), 1-6, 2023 | 8 | 2023 |
On extracting reliability information from speed binning ZP Najafi-Haghi, F Klemme, H Amrouch, HJ Wunderlich 2022 IEEE European Test Symposium (ETS), 1-4, 2022 | 6 | 2022 |
Intelligent methods for test and reliability H Amrouch, J Anders, S Becker, M Betka, G Bleher, P Domanski, ... 2022 Design, Automation & Test in Europe Conference & Exhibition (DATE), 969-974, 2022 | 6 | 2022 |
Design close to the edge for advanced technology using machine learning and brain-inspired algorithms H Amrouch, F Klemme, PR Genssler 2022 27th Asia and South Pacific Design Automation Conference (ASP-DAC), 493-499, 2022 | 6 | 2022 |
Cryogenic Embedded System to Support Quantum Computing: From 5nm FinFET to Full Processor PR Genssler, F Klemme, SS Parihar, S Brandhofer, G Pahwa, I Polian, ... IEEE Transactions on Quantum Engineering, 2023 | 5 | 2023 |
Transistor self-heating-aware synthesis for reliable digital circuit designs F Klemme, H Amrouch IEEE Transactions on Circuits and Systems I: Regular Papers, 2023 | 4 | 2023 |
Robust pattern generation for small delay faults under process variations H Jafarzadeh, F Klemme, JD Reimer, ZP Najafi-Haghi, H Amrouch, ... 2023 IEEE International Test Conference (ITC), 111-116, 2023 | 3 | 2023 |
Design automation for cryogenic cmos circuits VM Van Santen, M Walter, F Klemme, SS Parihar, G Pahwa, YS Chauhan, ... 2023 60th ACM/IEEE Design Automation Conference (DAC), 1-6, 2023 | 3 | 2023 |
Variability-aware approximate circuit synthesis via genetic optimization K Balaskas, F Klemme, G Zervakis, K Siozios, H Amrouch, J Henkel IEEE Transactions on Circuits and Systems I: Regular Papers 69 (10), 4141-4153, 2022 | 3 | 2022 |
Approximation-and Quantization-Aware Training for Graph Neural Networks R Novkin, F Klemme, H Amrouch IEEE Transactions on Computers, 2023 | 2 | 2023 |
Approximation-aware and quantization-aware training for graph neural networks R Novkin, H Amrouch, F Klemme Authorea Preprints, 2023 | 2 | 2023 |