| Assessing convolutional neural networks reliability through statistical fault injections A Ruospo, G Gavarini, C De Sio, J Guerrero, L Sterpone, MS Reorda, ... 2023 Design, Automation & Test in Europe Conference & Exhibition (DATE), 1-6, 2023 | 26 | 2023 |
| Selective hardening of critical neurons in deep neural networks A Ruospo, G Gavarini, I Bragaglia, M Traiola, A Bosio, E Sanchez 2022 25th International Symposium on Design and Diagnostics of Electronic …, 2022 | 19 | 2022 |
| Special session: Approximation and fault resiliency of dnn accelerators MH Ahmadilivani, M Barbareschi, S Barone, A Bosio, M Daneshtalab, ... 2023 IEEE 41st VLSI Test Symposium (VTS), 1-10, 2023 | 16 | 2023 |
| Sci-fi: a smart, accurate and unintrusive fault-injector for deep neural networks G Gavarini, A Ruospo, E Sánchez 2023 IEEE European Test Symposium (ETS), 1-6, 2023 | 8 | 2023 |
| Test, reliability and functional safety trends for automotive system-on-chip F Angione, D Appello, J Aribido, J Athavale, N Bellarmino, P Bernardi, ... 2022 IEEE European Test Symposium (ETS), 1-10, 2022 | 8 | 2022 |
| Open-set recognition: an inexpensive strategy to increase dnn reliability G Gavarini, D Stucchi, A Ruospo, G Boracchi, E Sanchez 2022 IEEE 28th International Symposium on On-Line Testing and Robust System …, 2022 | 7 | 2022 |
| Evaluation and mitigation of faults affecting swin transformers G Gavarini, A Ruospo, E Sánchez 2023 IEEE 29th International Symposium on On-Line Testing and Robust System …, 2023 | 3 | 2023 |
| Image test libraries for the on-line self-test of functional units in gpus running cnns A Ruospo, G Gavarini, A Porsia, MS Reorda, E Sanchez, R Mariani, ... 2023 IEEE European Test Symposium (ETS), 1-6, 2023 | 3 | 2023 |
| On the resilience of representative and novel data formats in CNNs G Gavarini, A Ruospo, E Sánchez 2023 IEEE International Symposium on Defect and Fault Tolerance in VLSI and …, 2023 | 2 | 2023 |
| Uncovering hidden vulnerabilities in CNNs through evolutionary-based Image Test Libraries V Turco, A Ruospo, G Gavarini, E Sánchez, MS Reorda 2023 IEEE International Symposium on Defect and Fault Tolerance in VLSI and …, 2023 | 1 | 2023 |
| Special Session: Approximation and Fault Resiliency of DNN Accelerators M Hasan Ahmadilivani, M Barbareschi, S Barone, A Bosio, ... arXiv e-prints, arXiv: 2306.04645, 2023 | | 2023 |
| SP2-Test, Reliability and Functional Safety Trends for Automotive System-on-Chip F Angione, D Appello, J Aribido, J Athavale, N Bellarmino, P Bernardi, ... | | 2022 |
| Effective and inexpensive fault detection in VGG-16 inference G GAVARINI | | 2020 |
