| Robust compact model of high-voltage MOSFET’s drift region G Pahwa, A Sharma, R Goel, G Gill, H Agarwal, YS Chauhan, C Hu IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2022 | 14 | 2022 |
| Analysis and modeling of current mismatch in negative capacitance field-effect transistor R Goel, A Sharma, YS Chahuan IEEE Transactions on Electron Devices 69 (9), 5337-5344, 2022 | 5 | 2022 |
| Compact Modeling of Impact Ionization and Conductivity Modulation in LDMOS Transistors A Sharma, YH Zarkob, G Pahwa, CK Dabhi, R Goel, H Agarwal, V Kubrak, ... IEEE Transactions on Electron Devices, 2024 | 1 | 2024 |
| Analysis and Modeling of OFF-State Capacitance in LDD MOSFETs A Sharma, R Goel, YS Chauhan 2023 7th IEEE Electron Devices Technology & Manufacturing Conference (EDTM), 1-3, 2023 | 1 | 2023 |
| Recent Enhancements in the Standard BSIM-BULK MOSFET Model A Sharma, YH Zarkob, R Goel, CK Dabhi, G Pahwa, C Hu, YS Chauhan 2022 IEEE International Conference on Emerging Electronics (ICEE), 1-6, 2022 | 1 | 2022 |
| An Improved Overlap Capacitance Model for LDMOS Transistors based on the BSIM-BULK Framework A Sharma, A Pampori, M Tang, R Goel, A Mahmoud, V Kubrak, C Hu, ... 2024 International Conference on Simulation of Semiconductor Processes and …, 2024 | | 2024 |
| Compact Modeling and Experimental Validation of Reverse Mode Impact Ionization in LDMOS Transistors within the BSIM-BULK Framework YH Zarkob, A Sharma, G Pahwa, D Nandi, CK Dabhi, V Kubrak, ... 2024 8th IEEE Electron Devices Technology & Manufacturing Conference (EDTM), 1-3, 2024 | | 2024 |
| Characterization and Experimental Validation of Self Heating in RF LDMOS Transistor using BSIM-BULK Model A Sharma, SS Parihar, YH Zarkob, W Wang, K Imura, P Diwedi, ... 2024 8th IEEE Electron Devices Technology & Manufacturing Conference (EDTM), 1-3, 2024 | | 2024 |
