A 3D kinetic Monte Carlo simulation study of resistive switching processes in Ni/HfO2/Si-n+-based RRAMs S Aldana, P García-Fernández, A Rodríguez-Fernández, R Romero-Zaliz, ... Journal of Physics D: Applied Physics 50 (33), 335103, 2017 | 72 | 2017 |
Resistive Switching with Self-Rectifying Tunability and Influence of the Oxide Layer Thickness in Ni/HfO2/n+-Si RRAM Devices A Rodriguez-Fernandez, S Aldana, F Campabadal, J Sune, E Miranda, ... IEEE Transactions on Electron Devices 64 (8), 3159-3166, 2017 | 35 | 2017 |
Characterization of HfO2-based devices with indication of second order memristor effects A Rodriguez-Fernandez, C Cagli, L Perniola, E Miranda, J Suñé Microelectronic Engineering 195, 101-106, 2018 | 29 | 2018 |
Switching Voltage and Time Statistics of Filamentary Conductive Paths in HfO2-Based ReRAM Devices A Rodriguez-Fernandez, C Cagli, J Suñé, E Miranda IEEE Electron Device Letters 39 (5), 656-659, 2018 | 29 | 2018 |
Effect of the voltage ramp rate on the set and reset voltages of ReRAM devices A Rodriguez-Fernandez, C Cagli, L Perniola, J Suñé, E Miranda Microelectronic Engineering 178, 61-65, 2017 | 22 | 2017 |
Temperature and polarity dependence of the switching behavior of Ni/HfO2-based RRAM devices A Rodriguez, MB Gonzalez, E Miranda, F Campabadal, J Suñe Microelectronic Engineering 147, 75-78, 2015 | 21 | 2015 |
Study on the connection between the set transient in RRAMs and the progressive breakdown of thin oxides FL Aguirre, A Rodriguez-Fernandez, SM Pazos, J Suñé, E Miranda, ... IEEE Transactions on Electron Devices 66 (8), 3349-3355, 2019 | 17 | 2019 |
Identification of the generation/rupture mechanism of filamentary conductive paths in ReRAM devices using oxide failure analysis A Rodriguez-Fernandez, C Cagli, L Perniola, J Suñé, E Miranda Microelectronics Reliability 76, 178-183, 2017 | 12 | 2017 |
Waveform and frequency effects on reset transition in bipolar ReRAM in flux-charge space MM Al Chawa, A Rodriguez-Fernandez, M Bargallo, F Campabadal, ... International Conference on Memristive Materials, Devices & Systems …, 2017 | 12 | 2017 |
Urtigal, the Galician group of interest in urticaria. Efficacy and safety of up-dosing antihistamines in chronic spontaneous urticaria: A systematic review of the literature P Iriarte Sotes, M Armisén, T Usero-Bárcena, A Rodriguez Fernandez, ... J Investig Allergol Clin Immunol 31 (4), 282-291, 2021 | 8 | 2021 |
A new method for estimating the conductive filament temperature in OxRAM devices based on escape rate theory A Rodriguez-Fernandez, J Muñoz-Gorriz, J Suñé, E Miranda Microelectronics reliability 88, 142-146, 2018 | 7 | 2018 |
SPICE model for the ramp rate effect in the reset characteristic of memristive devices A Rodriguez-Fernandez, J Suñé, E Miranda, MB Gonzalez, ... 2017 32nd Conference on Design of Circuits and Integrated Systems (DCIS), 1-4, 2017 | 7 | 2017 |
Effect of prevailing winds and land use on Alternaria airborne spore load A Rodríguez-Fernández, C Blanco-Alegre, AM Vega-Maray, ... Journal of Environmental Management 332, 117414, 2023 | 5 | 2023 |
SPICE simulation of 1T1R structures based on a logistic hysteresis operator GA Patterson, A Rodriguez-Fernandez, J Suñé, E Miranda, C Cagli, ... 2017 Spanish Conference on Electron Devices (CDE), 1-4, 2017 | 5 | 2017 |
Electrical characterization of multiple leakage current paths in HfO2/Al2O3-based nanolaminates A Rodríguez, MB Gonzalez, F Campabadal, J Suñé, E Miranda Microelectronics Reliability 55 (9-10), 1442-1445, 2015 | 5 | 2015 |
How to select the optimal monitoring locations for an aerobiological network: a case of study in central northwest of Spain A Rodríguez-Fernández, J Oteros, AM Vega-Maray, RM Valencia-Barrera, ... Science of The Total Environment 827, 154370, 2022 | 4 | 2022 |
Breakdown time statistics of successive failure events in constant voltage-stressed Al2O3/HfO2 nanolaminates A Rodriguez, MB Gonzalez, F Campabadal, J Suñé, E Miranda Microelectronic Engineering 147, 85-88, 2015 | 4 | 2015 |
On the properties of conducting filament in ReRAM X Lian, M Lanza, A Rodríguez, E Miranda, J Suñé 2014 12th IEEE International Conference on Solid-State and Integrated …, 2014 | 4 | 2014 |
Function-fit model for the rate of conducting filament generation in constant voltage-stressed multilayer oxide stacks A Rodriguez-Fernandez, J Suñé, E Miranda, MB González, ... Journal of Vacuum Science & Technology B 35 (1), 2017 | 3 | 2017 |
Analysis and modeling of filamentary conduction in Hf0₂-based structures A Rodríguez Fernández | 1 | 2018 |