Improved measurement results for the Avogadro constant using a 28Si-enriched crystal Y Azuma, P Barat, G Bartl, H Bettin, M Borys, I Busch, L Cibik, ... Metrologia 52 (2), 360, 2015 | 207 | 2015 |
Comeback of epitaxial graphene for electronics: large-area growth of bilayer-free graphene on SiC M Kruskopf, DM Pakdehi, K Pierz, S Wundrack, R Stosch, T Dziomba, ... 2D Materials 3 (4), 041002, 2016 | 170 | 2016 |
A new 28Si single crystal: counting the atoms for the new kilogram definition G Bartl, P Becker, B Beckhoff, H Bettin, E Beyer, M Borys, I Busch, L Cibik, ... Metrologia 54 (5), 693, 2017 | 122 | 2017 |
Functional Single‐Layer Graphene Sheets from Aromatic Monolayers DG Matei, NE Weber, S Kurasch, S Wundrack, M Woszczyna, M Grothe, ... Advanced Materials 25 (30), 4146-4151, 2013 | 89 | 2013 |
A new generation of 99.999% enriched 28Si single crystals for the determination of Avogadro’s constant NV Abrosimov, DG Aref’Ev, P Becker, H Bettin, AD Bulanov, ... Metrologia 54 (4), 599, 2017 | 77 | 2017 |
All‐Carbon Vertical van der Waals Heterostructures: Non‐destructive Functionalization of Graphene for Electronic Applications M Woszczyna, A Winter, M Grothe, A Willunat, S Wundrack, R Stosch, ... Advanced materials 26 (28), 4831-4837, 2014 | 64 | 2014 |
Epitaxial graphene on SiC: modification of structural and electron transport properties by substrate pretreatment M Kruskopf, K Pierz, S Wundrack, R Stosch, T Dziomba, CC Kalmbach, ... Journal of Physics: Condensed Matter 27 (18), 185303, 2015 | 60 | 2015 |
Infrared spectrometric measurement of impurities in highly enriched ‘Si28’ S Zakel, S Wundrack, H Niemann, O Rienitz, D Schiel Metrologia 48 (2), S14, 2011 | 40 | 2011 |
A morphology study on the epitaxial growth of graphene and its buffer layer M Kruskopf, K Pierz, DM Pakdehi, S Wundrack, R Stosch, A Bakin, ... Thin Solid Films 659, 7-15, 2018 | 31 | 2018 |
Homogeneous Large-area Quasi-freestanding Monolayer and Bilayer Graphene on SiC DM Pakdehi, K Pierz, S Wundrack, J Aprojanz, TTN Nguyen, T Dziomba, ... arXiv preprint arXiv:1811.04998, 2018 | 28 | 2018 |
Silicon Carbide Stacking‐Order‐Induced Doping Variation in Epitaxial Graphene D Momeni Pakdehi, P Schädlich, TTN Nguyen, AA Zakharov, S Wundrack, ... Advanced Functional Materials 30 (45), 2004695, 2020 | 23 | 2020 |
Versatile sputtering technology for Al2O3 gate insulators on graphene M Friedemann, M Woszczyna, A Müller, S Wundrack, T Dziomba, ... Science and technology of advanced materials 13 (2), 025007, 2012 | 23 | 2012 |
Direct growth of patterned graphene NE Weber, S Wundrack, R Stosch, A Turchanin Small 12 (11), 1440-1445, 2016 | 22 | 2016 |
Liquid metal intercalation of epitaxial graphene: Large-area gallenene layer fabrication through gallium self-propagation at ambient conditions S Wundrack, D Momeni, W Dempwolf, N Schmidt, K Pierz, L Michaliszyn, ... Physical Review Materials 5 (2), 024006, 2021 | 20 | 2021 |
Probing the structural transition from buffer layer to quasifreestanding monolayer graphene by Raman spectroscopy S Wundrack, D Momeni Pakdehi, P Schädlich, F Speck, K Pierz, T Seyller, ... Physical Review B 99 (4), 045443, 2019 | 16 | 2019 |
Validation of isotope dilution surface‐enhanced Raman scattering (IDSERS) as a higher order reference method for clinical measurands employing international comparison schemes S Zakel, S Wundrack, G O'Connor, B Güttler, R Stosch Journal of Raman Spectroscopy 44 (9), 1246-1252, 2013 | 16 | 2013 |
Homogeneous large-area quasi-free-standing monolayer and bilayer graphene on SiC D Momeni Pakdehi, K Pierz, S Wundrack, J Aprojanz, TTN Nguyen, ... ACS Applied Nano Materials 2 (2), 844-852, 2019 | 12 | 2019 |
Impact of polymer-assisted epitaxial graphene growth on various types of SiC substrates A Chatterjee, M Kruskopf, S Wundrack, P Hinze, K Pierz, R Stosch, ... ACS Applied Electronic Materials 4 (11), 5317-5325, 2022 | 11 | 2022 |
All-in-one superparamagnetic and SERS-active niosomes for dual-targeted in vitro detection of breast cancer cells V Maurer, A Zarinwall, Z Wang, S Wundrack, N Wundrack, DA Seleci, ... Sensors & Diagnostics 1 (3), 469-484, 2022 | 7 | 2022 |
Traceable Quantitative Raman Microscopy and X-ray Fluorescence Analysis as Nondestructive Methods for the Characterization of Cu(In,Ga)Se2 Absorber Films S Zakel, B Pollakowski, C Streeck, S Wundrack, A Weber, S Brunken, ... Applied Spectroscopy 70 (2), 279-288, 2016 | 4 | 2016 |